公开(公告)号：US20240264223A1

公开(公告)日：2024-08-08

申请号：US18112703

申请日：2023-02-22

Applicant: PAMTEK Co., Ltd.

Inventor： Jae Woong KIM ,  Jung In PARK ,  Hyun Wook SHIN ,  Hee Tae KIM

IPC: G01R31/28

CPC classification number: G01R31/2863 ,  G01R31/2867

Abstract: An integrated actuator test system for performing the first test and the second test and a method for operating the system. The test system includes a control unit controlling an operation of the test system; a support socket supporting the actuator; an alignment stage supporting the support socket and determining a direction of the support socket; and a transporting unit transporting the alignment stage to perform the second test after performing the first test.

公开(公告)号：US20240347385A1

公开(公告)日：2024-10-17

申请号：US18138616

申请日：2023-04-24

Applicant: PAMTEK Co., Ltd.

Inventor： Jae Woong KIM ,  Jung In PARK ,  Jun Young YEOM ,  Jeong HEO ,  Je Hee RYU

IPC: H01L21/82 ,  H01L21/304 ,  H01L21/68 ,  H01L21/683

CPC classification number: H01L21/82 ,  H01L21/3043 ,  H01L21/68 ,  H01L21/6836 ,  H01L21/6838

Abstract: A semiconductor wafer sample pre-processing system improves productivity and process reliability by automating all process from cutting a into a plurality of wafer samples through polishing of the wafer samples.

公开(公告)号：US20230412926A1

公开(公告)日：2023-12-21

申请号：US18083540

申请日：2022-12-18

Applicant: PAMTEK Co., Ltd.

Inventor： Jae Woong KIM ,  Jung In PARK ,  Hyun Wook SHIN ,  Kyung Sub OH

IPC: H04N23/695 ,  H04N23/57 ,  G06V10/24 ,  G06V10/74 ,  H04N17/00

CPC classification number: H04N23/695 ,  H04N23/57 ,  G06V10/242 ,  G06V10/761 ,  H04N17/002 ,  G06V2201/07

Abstract: A camera module inspection system and a method for operating the inspection system. More specifically, the inspection system can quickly check and correct the alignment of the camera module.

公开(公告)号：US20230366911A1

公开(公告)日：2023-11-16

申请号：US18083539

申请日：2022-12-18

Applicant: PAMTEK Co., Ltd.

Inventor： Jae Woong KIM ,  Jung In PARK ,  Sung Gu KIM ,  Hee Tae KIM

IPC: G01R1/067 ,  F16M11/24 ,  F16M11/20

CPC classification number: G01R1/06705 ,  F16M11/24 ,  F16M11/2014 ,  F16M11/2092 ,  F16M11/2021 ,  F16M11/2085 ,  F16M2200/027

Abstract: An adjustment control device for precise measurement that controls an inspection equipment for inspecting an inspected object to perform precise measurement includes a lowering control unit that lowers the inspection equipment with respect to the inspected object, a rotation control unit that is coupled to the lowering control unit and that controls the lowering control unit to rotate the inspection equipment at a predetermined angle in left and right directions when viewed from a frontal point of view, and a forward and backward control unit that is disposed above the rotation control unit and that transmit a moving force to the rotation control unit to move the inspection equipment forward or forward on the inspected object.