公开(公告)号：US20230366911A1

公开(公告)日：2023-11-16

申请号：US18083539

申请日：2022-12-18

Applicant: PAMTEK Co., Ltd.

Inventor： Jae Woong KIM ,  Jung In PARK ,  Sung Gu KIM ,  Hee Tae KIM

IPC: G01R1/067 ,  F16M11/24 ,  F16M11/20

CPC classification number: G01R1/06705 ,  F16M11/24 ,  F16M11/2014 ,  F16M11/2092 ,  F16M11/2021 ,  F16M11/2085 ,  F16M2200/027

Abstract: An adjustment control device for precise measurement that controls an inspection equipment for inspecting an inspected object to perform precise measurement includes a lowering control unit that lowers the inspection equipment with respect to the inspected object, a rotation control unit that is coupled to the lowering control unit and that controls the lowering control unit to rotate the inspection equipment at a predetermined angle in left and right directions when viewed from a frontal point of view, and a forward and backward control unit that is disposed above the rotation control unit and that transmit a moving force to the rotation control unit to move the inspection equipment forward or forward on the inspected object.