公开(公告)号：US20230412926A1

公开(公告)日：2023-12-21

申请号：US18083540

申请日：2022-12-18

Applicant: PAMTEK Co., Ltd.

Inventor： Jae Woong KIM ,  Jung In PARK ,  Hyun Wook SHIN ,  Kyung Sub OH

IPC: H04N23/695 ,  H04N23/57 ,  G06V10/24 ,  G06V10/74 ,  H04N17/00

CPC classification number: H04N23/695 ,  H04N23/57 ,  G06V10/242 ,  G06V10/761 ,  H04N17/002 ,  G06V2201/07

Abstract: A camera module inspection system and a method for operating the inspection system. More specifically, the inspection system can quickly check and correct the alignment of the camera module.

公开(公告)号：US20240264223A1

公开(公告)日：2024-08-08

申请号：US18112703

申请日：2023-02-22

Applicant: PAMTEK Co., Ltd.

Inventor： Jae Woong KIM ,  Jung In PARK ,  Hyun Wook SHIN ,  Hee Tae KIM

IPC: G01R31/28

CPC classification number: G01R31/2863 ,  G01R31/2867

Abstract: An integrated actuator test system for performing the first test and the second test and a method for operating the system. The test system includes a control unit controlling an operation of the test system; a support socket supporting the actuator; an alignment stage supporting the support socket and determining a direction of the support socket; and a transporting unit transporting the alignment stage to perform the second test after performing the first test.