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1.发明授权公开(公告)号：US09464997B2
公开(公告)日：2016-10-11
申请号：US14129669
申请日：2012-12-28
Applicant: Nuctech Company Limited , Tsinghua University
Inventor： Shuwei Li , Zhiqiang Chen , Yuanjing Li , Ziran Zhao , Yinong Liu , Qingjun Zhang , Weibin Zhu , Yi Wang , Shuqing Zhao , Wenjian Zhang
IPC: G01N23/087 , G01T1/22
CPC classification number: G01N23/087 , G01N2223/402 , G01N2223/507 , G01T1/22
Abstract: Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.
Abstract translation: 公开了用于测量物体的有效原子序数的方法和装置。 该装置包括：射线源，被配置为产生具有第一能量的第一X射线束和具有第二能量的第二X射线束; 切伦科夫检测器，被配置为接收通过检测对象的第一X射线束和第二X射线束，并产生第一检测值和第二检测值; 以及数据处理装置，被配置为基于所述第一检测值和所述第二检测值来获得所述对象的有效原子序数。 切恩科夫检测器可以消除相对于物体识别的某些能量阈值以下的X射线干扰，从而可以提高对象识别的精度。
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2.发明申请公开(公告)号：US20140314201A1
公开(公告)日：2014-10-23
申请号：US14129669
申请日：2012-12-28
Applicant: Tsinghua University , Nuctech Company Limited
Inventor： Shuwei LI , Zhiqiang Chen , Yuanjing Li , Ziran Zhao , Yinong Liu , Qingjun Zhang , Weibin Zhu , Yi Wang , Shuqing Zhao , Wenjian Zhang
IPC: G01N23/087 , G01T1/22
CPC classification number: G01N23/087 , G01N2223/402 , G01N2223/507 , G01T1/22
Abstract: Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.
Abstract translation: 公开了用于测量物体的有效原子序数的方法和装置。 该装置包括：射线源，被配置为产生具有第一能量的第一X射线束和具有第二能量的第二X射线束; 切伦科夫检测器，被配置为接收通过检测对象的第一X射线束和第二X射线束，并产生第一检测值和第二检测值; 以及数据处理装置，被配置为基于所述第一检测值和所述第二检测值来获得所述对象的有效原子序数。 切恩科夫检测器可以消除相对于物体识别的某些能量阈值以下的X射线干扰，从而可以提高对象识别的精度。
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公开(公告)号：US10466372B2
公开(公告)日：2019-11-05
申请号：US14981953
申请日：2015-12-29
Applicant: TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
Inventor： Kejun Kang , Shuwei Li , Qingjun Zhang , Yuanjing Li , Yulan Li , Ziran Zhao , Yinong Liu , Yaohong Liu , Weibin Zhu , Xiaolin Zhao , Huishao He
IPC: G01T7/00 , G01T1/20 , H04N5/57 , G01T1/16 , H01L27/30 , H05G1/36 , G21K1/02 , G01T1/17 , G01V5/00 , H04N5/369 , G06T1/00
Abstract: The present invention discloses an X-ray beam intensity monitoring device and an X-ray inspection system. The X-ray beam intensity monitoring device comprises an intensity detecting module and a data processing module, wherein the intensity detecting module is adopted to be irradiated by the X-ray beam and send a detecting signal, the data processing module is coupled with the intensity detecting module to receive the detecting signal and output an X-ray beam intensity monitoring signal, wherein the X-ray beam intensity monitoring signal includes a dose monitoring signal for the X-ray beam and a brightness correction signal for correcting signal values of the X-ray beam. The X-ray beam intensity monitoring device can simultaneously perform dose monitoring and brightness monitoring, thereby improving the service efficiency of the X-ray beam intensity monitoring device. Moreover, the monitoring result of the X-ray beam intensity can be more accurate and reliable.
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Patent Agency Ranking
公开(公告)号：US20180164449A1
公开(公告)日：2018-06-14
申请号：US15719571
申请日：2017-09-29
Applicant: Nuctech Company Limited , Tsinghua University
Inventor： Yuanjing Li , Ziran Zhao , Jianmin Li , Yulan Li , Weibin Zhu , Xiang Zou , Qingjun Zhang , Chunguang Zong , Xiaolin Zhao , Shuwei Li , Junxiao Wang
IPC: G01T1/24
Abstract: This disclosure provides a radiation detection apparatus and a method, a data processing method and a processor, which relates to the field of radiation detection technology. Wherein, the radiation detection apparatus of this disclosure comprises: a radiation detector which generates an electrical signal by interacting with X-rays; an Analog-to-Digital Converter (ADC) which is coupled to the radiation detector and transmits the electrical signal to a waveform data; and a data processor which receives the waveform data from the ADC, determines the number of single photon signals according to the waveform data, and determines whether an integral signal and/or a count signal of the waveform data will be used for imaging according to the number of the single photon signals.
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公开(公告)号：US10338236B2
公开(公告)日：2019-07-02
申请号：US15719571
申请日：2017-09-29
Applicant: NUCTECH COMPANY LIMITED , TSINGHUA UNIVERSITY
Inventor： Yuanjing Li , Ziran Zhao , Jianmin Li , Yulan Li , Weibin Zhu , Xiang Zou , Qingjun Zhang , Chunguang Zong , Xiaolin Zhao , Shuwei Li , Junxiao Wang
Abstract: This disclosure provides a radiation detection apparatus and a method, a data processing method and a processor, which relates to the field of radiation detection technology. Wherein, the radiation detection apparatus of this disclosure comprises: a radiation detector which generates an electrical signal by interacting with X-rays; an Analog-to-Digital Converter (ADC) which is coupled to the radiation detector and transmits the electrical signal to a waveform data; and a data processor which receives the waveform data from the ADC, determines the number of single photon signals according to the waveform data, and determines whether an integral signal and/or a count signal of the waveform data will be used for imaging according to the number of the single photon signals.
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6.发明公开公开(公告)号：US20230168397A1
公开(公告)日：2023-06-01
申请号：US17994364
申请日：2022-11-27
Applicant: NUCTECH COMPANY LIMITED
Inventor： Linxia TAN , Hao Yu , Xiang Zou , Weibin Zhu , Junxiao Wang
CPC classification number: G01T1/2985 , G01T1/2018 , G01V5/005
Abstract: This disclosure provides an area array detector, a detection method, and a corresponding container/vehicle inspection system, and relates to the field of ray scanning. The area array detector for the container/vehicle inspection system includes sparsely arranged detector assemblies, and a first detector assembly is different from other second detector assemblies; and a backplane for carrying and mounting detector assemblies, and the area array detector supporting scanning modes is enabled.
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公开(公告)号：US10809394B2
公开(公告)日：2020-10-20
申请号：US16365910
申请日：2019-03-27
Applicant: Nuctech Company Limited
Inventor： Shuwei Li , Qingjun Zhang , Xiang Zou , Bozhen Zhao , Junxiao Wang , Weibin Zhu , Yongqiang Wang , Wenjian Zhang
Abstract: The present disclosure provides a dual-energy detection apparatus and method. The dual-energy detection apparatus includes an X-ray source configured to send a first X-ray beam to an object to be measured; a scintillation detector configured to work in an integration mode, and receive a second X-ray beam penetrating through the object to be measured to generate a first electrical signal; a Cherenkov detector configured to be located behind the scintillation detector, work in a counting mode, and receive a third X-ray beam penetrating through the scintillation detector to generate a second electrical signal; and a processor configured to output image, thickness and material information of the object to be measured according to the first electrical signal and the second electrical signal. The dual-energy detection method provided by the present disclosure may acquire an image of the object to be measured that is clearer and contains more information.
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公开(公告)号：US10401308B2
公开(公告)日：2019-09-03
申请号：US15278470
申请日：2016-09-28
Applicant: Nuctech Company Limited
Inventor： Qingjun Zhang , Yuanjing Li , Shuwei Li , Ziran Zhao , Weibin Zhu , Junxiao Wang , Jianhua Li
IPC: G01T1/20 , G01N23/087
Abstract: The present application relates to a dual-energy detection method, system and apparatus. The apparatus includes: a first pixel detector array proximal to a ray source, configured to detect ray source photons having relatively low energy; and a second pixel detector array distal from the ray source, configured to detect ray source photons having relatively high energy; wherein the first pixel detector array includes a plurality of rows of first pixel detectors, the first pixel detector including a first sensitive medium, a first photosensitive device, a first incidence plane, and a first window; the second pixel detector array includes a single row of second pixel detectors, the second pixel detector including a second sensitive medium, a second photosensitive device, a second incidence plane, and a second window; and each of the second pixel detectors has the same pixel area as corresponding plurality of first pixel detectors thereof.
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