SAFETY INSPECTION DETECTOR AND GOODS SAFETY INSPECTION SYSTEM
    1.
    发明申请
    SAFETY INSPECTION DETECTOR AND GOODS SAFETY INSPECTION SYSTEM 有权
    安全检查检测器和商品安全检查系统

    公开(公告)号:US20170068003A1

    公开(公告)日:2017-03-09

    申请号:US15258209

    申请日:2016-09-07

    CPC classification number: G01T7/00 G01J1/0271 G01J2001/0276

    Abstract: The invention discloses a safety inspection detector and a goods safety inspection system. The safety inspection detector at least comprises a circuit board, a first housing, a second housing, a detection module and a connecting interface. The detection module and the connecting interface are mounted on the circuit board. The first housing is pressed and connected to a first surface of the circuit board, and the second housing is pressed and connected to a second surface of the circuit board. The first housing and the second housing can hermetically wrap the detection module and electronic devices on the circuit board, but bypass the connecting interface to realize leading-out and connection with related interconnected cables by utilizing the connecting interface. The housings can be used for sealing and protecting sensitive electronic devices in the detector, thus being moisture proof and preventing interference.

    Abstract translation: 本发明公开了一种安全检查检测器和货物安全检查系统。 安全检查检测器至少包括电路板,第一壳体,第二壳体,检测模块和连接接口。 检测模块和连接接口安装在电路板上。 第一壳体被按压并连接到电路板的第一表面,并且第二壳体被按压并连接到电路板的第二表面。 第一壳体和第二壳体可以将检测模块和电子设备封装在电路板上,但绕过连接接口,通过利用连接接口实现与相关互连电缆的导出和连接。 这些外壳可用于密封和保护检测器中敏感的电子设备,从而防潮并防止干扰。

    X-RAY BEAM INTENSITY MONITORING DEVICE AND X-RAY INSPECTION SYSTEM
    2.
    发明申请
    X-RAY BEAM INTENSITY MONITORING DEVICE AND X-RAY INSPECTION SYSTEM 审中-公开
    X射线光束强度监测装置和X射线检测系统

    公开(公告)号:US20160187502A1

    公开(公告)日:2016-06-30

    申请号:US14981953

    申请日:2015-12-29

    Abstract: The present invention discloses an X-ray beam intensity monitoring device and an X-ray inspection system. The X-ray beam intensity monitoring device comprises an intensity detecting module and a data processing module, wherein the intensity detecting module is adopted to be irradiated by the X-ray beam and send a detecting signal, the data processing module is coupled with the intensity detecting module to receive the detecting signal and output an X-ray beam intensity monitoring signal, wherein the X-ray beam intensity monitoring signal includes a dose monitoring signal of the X-ray beam and a brightness correction signal of the X-ray beam. The X-ray beam intensity monitoring device can simultaneously perform dose monitoring and brightness monitoring, thereby improving the service efficiency of the X-ray beam intensity monitoring device. Moreover, the monitoring result of the X-ray beam intensity can be more accurate and reliable.

    Abstract translation: 本发明公开了一种X射线束强度监测装置和X射线检查系统。 X射线束强度监测装置包括强度检测模块和数据处理模块,其中强度检测模块被X射线束照射并发送检测信号,数据处理模块与强度 检测模块,用于接收检测信号并输出​​X射线束强度监测信号,其中X射线束强度监测信号包括X射线束的剂量监测信号和X射线束的亮度校正信号。 X射线束强度监测装置可以同时进行剂量监测和亮度监测,从而提高X射线束强度监测装置的使用效率。 此外,X射线束强度的监测结果可以更准确可靠。

    METHODS AND APPARATUSES FOR MEASURING EFFECTIVE ATOMIC NUMBER OF AN OBJECT
    3.
    发明申请
    METHODS AND APPARATUSES FOR MEASURING EFFECTIVE ATOMIC NUMBER OF AN OBJECT 有权
    用于测量物体的有效原子数的方法和装置

    公开(公告)号:US20140314201A1

    公开(公告)日:2014-10-23

    申请号:US14129669

    申请日:2012-12-28

    CPC classification number: G01N23/087 G01N2223/402 G01N2223/507 G01T1/22

    Abstract: Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.

    Abstract translation: 公开了用于测量物体的有效原子序数的方法和装置。 该装置包括:射线源,被配置为产生具有第一能量的第一X射线束和具有第二能量的第二X射线束; 切伦科夫检测器,被配置为接收通过检测对象的第一X射线束和第二X射线束,并产生第一检测值和第二检测值; 以及数据处理装置,被配置为基于所述第一检测值和所述第二检测值来获得所述对象的有效原子序数。 切恩科夫检测器可以消除相对于物体识别的某些能量阈值以下的X射线干扰,从而可以提高对象识别的精度。

    RADIATION DETECTOR ASSEMBLY AND METHOD OF MAKING THE SAME

    公开(公告)号:US20180188388A1

    公开(公告)日:2018-07-05

    申请号:US15856303

    申请日:2017-12-28

    Abstract: A radiation detector assembly and a method of manufacturing the same are provided. The radiation detector assembly includes a base and an outer encapsulation layer. The base includes a scintillator having a light-entering surface and a light-exiting surface on both ends thereof, respectively; a reflection layer provided on the light-entering surface and an outer peripheral surface of the scintillator; a photosensor comprising a photosensitive surface and an encapsulation housing, the photosensitive surface is coupled to the light-exiting surface via an optical adhesive; and an inner encapsulation layer adhered to an outer surface of the reflection layer and hermetically encapsulates a coupling portion where the scintillator and the photosensor connected with each other. the outer encapsulation layer is provided on the outer surface of the base.

    DUAL-ENERGY DETECTION APPARATUS AND METHOD THEREOF

    公开(公告)号:US20190302281A1

    公开(公告)日:2019-10-03

    申请号:US16365910

    申请日:2019-03-27

    Abstract: The present disclosure provides a dual-energy detection apparatus and method. The dual-energy detection apparatus includes an X-ray source configured to send a first X-ray beam to an object to be measured; a scintillation detector configured to work in an integration mode, and receive a second X-ray beam penetrating through the object to be measured to generate a first electrical signal; a Cherenkov detector configured to be located behind the scintillation detector, work in a counting mode, and receive a third X-ray beam penetrating through the scintillation detector to generate a second electrical signal; and a processor configured to output image, thickness and material information of the object to be measured according to the first electrical signal and the second electrical signal. The dual-energy detection method provided by the present disclosure may acquire an image of the object to be measured that is clearer and contains more information.

    DUAL-ENERGY DETECTION APPARATUS, SYSTEM AND METHOD

    公开(公告)号:US20170184515A1

    公开(公告)日:2017-06-29

    申请号:US15278470

    申请日:2016-09-28

    Abstract: The present application relates to a dual-energy detection method, system and apparatus. The apparatus includes: a first pixel detector array proximal to a ray source, configured to detect ray source photons having relatively low energy; and a second pixel detector array distal from the ray source, configured to detect ray source photons having relatively high energy; wherein the first pixel detector array includes a plurality of rows of first pixel detectors, the first pixel detector including a first sensitive medium, a first photosensitive device, a first incidence plane, and a first window; the second pixel detector array includes a single row of second pixel detectors, the second pixel detector including a second sensitive medium, a second photosensitive device, a second incidence plane, and a second window; and each of the second pixel detectors has the same pixel area as corresponding plurality of first pixel detectors thereof.

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