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    Afterglow detection device and afterglow detection method
    1.
    发明授权
    Afterglow detection device and afterglow detection method 有权

    公开(公告)号：US10775320B2

    公开(公告)日：2020-09-15

    申请号：US16403555

    申请日：2019-05-05

    Applicant: NUCTECH COMPANY LIMITED

    Inventor： Shuwei Li ,  Wenjian Zhang ,  Xiang Zou ,  Bozhen Zhao ,  Qingjun Zhang ,  Huishao He ,  Yongqiang Wang ,  Yanchun Wang

    IPC: A61B6/00 ,  G01N23/04 ,  G01T1/20

    Abstract: The present disclosure discloses an afterglow detection device and an afterglow detection method. The afterglow detection device comprises: an X-ray tube for emitting an X-ray beam; a first reading circuit for receiving a first detected signal from a to-be-detected detector to form and output a first measurement signal according to the first detected signal, the to-be-detected detector being connected to the first reading circuit and disposed on a beam-out side of the X-ray tube to receive radiation of the X-ray beam and outputting the first detected signal to the first reading circuit at the time of detection; a residual ray detector disposed on a beam-out side of the X-ray tube; a second reading circuit connected to the residual ray detector for receiving a second detected signal from the residual ray detector to form and output a second measurement signal according to the second detected signal.

    Methods and apparatuses for measuring effective atomic number of an object
    4.
    发明授权
    Methods and apparatuses for measuring effective atomic number of an object 有权
    用于测量物体的有效原子序数的方法和装置

    公开(公告)号：US09464997B2

    公开(公告)日：2016-10-11

    申请号：US14129669

    申请日：2012-12-28

    Applicant: Nuctech Company Limited ,  Tsinghua University

    Inventor： Shuwei Li ,  Zhiqiang Chen ,  Yuanjing Li ,  Ziran Zhao ,  Yinong Liu ,  Qingjun Zhang ,  Weibin Zhu ,  Yi Wang ,  Shuqing Zhao ,  Wenjian Zhang

    IPC: G01N23/087 ,  G01T1/22

    CPC classification number: G01N23/087 ,  G01N2223/402 ,  G01N2223/507 ,  G01T1/22

    Abstract: Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.

    Abstract translation: 公开了用于测量物体的有效原子序数的方法和装置。 该装置包括：射线源，被配置为产生具有第一能量的第一X射线束和具有第二能量的第二X射线束; 切伦科夫检测器，被配置为接收通过检测对象的第一X射线束和第二X射线束，并产生第一检测值和第二检测值; 以及数据处理装置，被配置为基于所述第一检测值和所述第二检测值来获得所述对象的有效原子序数。 切恩科夫检测器可以消除相对于物体识别的某些能量阈值以下的X射线干扰，从而可以提高对象识别的精度。

    METHODS AND APPARATUSES FOR MEASURING EFFECTIVE ATOMIC NUMBER OF AN OBJECT
    5.
    发明申请
    METHODS AND APPARATUSES FOR MEASURING EFFECTIVE ATOMIC NUMBER OF AN OBJECT 有权
    用于测量物体的有效原子数的方法和装置

    公开(公告)号：US20140314201A1

    公开(公告)日：2014-10-23

    申请号：US14129669

    申请日：2012-12-28

    Applicant: Tsinghua University ,  Nuctech Company Limited

    Inventor： Shuwei LI ,  Zhiqiang Chen ,  Yuanjing Li ,  Ziran Zhao ,  Yinong Liu ,  Qingjun Zhang ,  Weibin Zhu ,  Yi Wang ,  Shuqing Zhao ,  Wenjian Zhang

    IPC: G01N23/087 ,  G01T1/22

    CPC classification number: G01N23/087 ,  G01N2223/402 ,  G01N2223/507 ,  G01T1/22

    Abstract: Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.

    Abstract translation: 公开了用于测量物体的有效原子序数的方法和装置。 该装置包括：射线源，被配置为产生具有第一能量的第一X射线束和具有第二能量的第二X射线束; 切伦科夫检测器，被配置为接收通过检测对象的第一X射线束和第二X射线束，并产生第一检测值和第二检测值; 以及数据处理装置，被配置为基于所述第一检测值和所述第二检测值来获得所述对象的有效原子序数。 切恩科夫检测器可以消除相对于物体识别的某些能量阈值以下的X射线干扰，从而可以提高对象识别的精度。

    BACKSIDE PROCESSING METHOD FOR BACK-ILLUMINATED PHOTOELECTRIC DEVICE
    6.
    发明申请
    BACKSIDE PROCESSING METHOD FOR BACK-ILLUMINATED PHOTOELECTRIC DEVICE 审中-公开

    公开(公告)号：US20200212251A1

    公开(公告)日：2020-07-02

    申请号：US16727573

    申请日：2019-12-26

    Applicant: Tsinghua University ,  NUCTECH COMPANY LIMITED

    Inventor： Wenjian Zhang ,  Qingjun Zhang ,  Xiang Zou ,  Yiyan Gong

    IPC: H01L31/18 ,  H01L27/146 ,  H01L31/0236

    Abstract: Embodiments of the present disclosure disclose a backside processing method for a back-illuminated photoelectric device. The backside processing method includes: mechanically thinning the back-illuminated photoelectric device such that a thickness of the back-illuminated photoelectric device reaches a first desired thickness; and chemically thinning and chemically polishing the back side of the mechanically thinned back-illuminated photoelectric device by using a nitric acid solution and a hydrofluoric acid solution such that the thickness of the mechanically thinned back-illuminated photoelectric device reaches a second desired thickness and a surface roughness of the back side of the back-illuminated photoelectric device reaches a desired surface roughness.

    Radiation detector assembly and method of making the same
    7.
    发明授权
    Radiation detector assembly and method of making the same 有权

    公开(公告)号：US10422889B2

    公开(公告)日：2019-09-24

    申请号：US15856303

    申请日：2017-12-28

    Applicant: Nuctech Company Limited

    Inventor： Bozhen Zhao ,  Qingjun Zhang ,  Ziran Zhao ,  Shuwei Li ,  Lifeng Sun ,  Wenjian Zhang

    IPC: G01T1/20

    Abstract: A radiation detector assembly and a method of manufacturing the same are provided. The radiation detector assembly includes a base and an outer encapsulation layer. The base includes a scintillator having a light-entering surface and a light-exiting surface on both ends thereof, respectively; a reflection layer provided on the light-entering surface and an outer peripheral surface of the scintillator; a photosensor comprising a photosensitive surface and an encapsulation housing, the photosensitive surface is coupled to the light-exiting surface via an optical adhesive; and an inner encapsulation layer adhered to an outer surface of the reflection layer and hermetically encapsulates a coupling portion where the scintillator and the photosensor connected with each other. The outer encapsulation layer is provided on the outer surface of the base.

    Dual-energy detection apparatus and method thereof
    10.
    发明授权
    Dual-energy detection apparatus and method thereof 有权

    公开(公告)号：US10809394B2

    公开(公告)日：2020-10-20

    申请号：US16365910

    申请日：2019-03-27

    Applicant: Nuctech Company Limited

    Inventor： Shuwei Li ,  Qingjun Zhang ,  Xiang Zou ,  Bozhen Zhao ,  Junxiao Wang ,  Weibin Zhu ,  Yongqiang Wang ,  Wenjian Zhang

    IPC: G01T1/20 ,  G01B15/02 ,  G01N23/04 ,  G01T1/22 ,  G01T1/24 ,  G01V5/00

    Abstract: The present disclosure provides a dual-energy detection apparatus and method. The dual-energy detection apparatus includes an X-ray source configured to send a first X-ray beam to an object to be measured; a scintillation detector configured to work in an integration mode, and receive a second X-ray beam penetrating through the object to be measured to generate a first electrical signal; a Cherenkov detector configured to be located behind the scintillation detector, work in a counting mode, and receive a third X-ray beam penetrating through the scintillation detector to generate a second electrical signal; and a processor configured to output image, thickness and material information of the object to be measured according to the first electrical signal and the second electrical signal. The dual-energy detection method provided by the present disclosure may acquire an image of the object to be measured that is clearer and contains more information.

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