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公开(公告)号:US20190293684A1
公开(公告)日:2019-09-26
申请号:US16305408
申请日:2017-04-26
Applicant: NIDEC READ CORPORATION
Inventor: Kiyoshi NUMATA
Abstract: An inspection jig may include: a support plate including a plate-shaped member and having a plurality of through holes extending along a thickness of the support plate; a plurality of probes each having a tubular shape and conductivity, the probes being respectively inserted into the through holes; and an elastomer elastically holding the probes in the through holes. Each of the probes may include a first spring part wound helically in a first direction and configured to expand and contract along an axis of the probe.
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公开(公告)号:US20200041543A1
公开(公告)日:2020-02-06
申请号:US16495842
申请日:2018-03-14
Applicant: Nidec-Read Corporation
Inventor: Michihisa MAEDA , Kiyoshi NUMATA , Hidekazu YAMAZAKI , Makoto FUJINO
IPC: G01R1/067 , B82Y40/00 , C01B32/166 , C01B32/162
Abstract: A probe structure is provided with: a holding plate which has a first surface and a second surface in which at least the first surface is insulated; a plurality of electrodes which are formed on the first surface of the holding plate in such a state that the plurality of electrodes is separated from each other; and carbon nanotube structures which are erected on the electrodes 3. The holding plate is provided with through holes which correspond to the electrodes, respectively.
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公开(公告)号:US20200300930A1
公开(公告)日:2020-09-24
申请号:US16770631
申请日:2018-11-26
Applicant: NIDEC READ CORPORATION
Inventor: Masami YAMAMOTO , Kazuhiko KITANO , Norihiro OTA , Shigeki SAKAI , Kiyoshi NUMATA
Abstract: A method for producing an MI element includes: an insulation step of forming an insulator layer on an outer periphery of an amorphous wire; an electroless plating step of forming an electroless plating layer on an outer peripheral surface of the insulator layer; an electrolytic plating step of forming an electrolytic plating layer on an outer peripheral surface of the electroless plating layer; a resist step of forming a resist layer on an outer peripheral surface of the electrolytic plating layer; an exposure step of exposing the resist layer with a laser to form a spiral groove strip on an outer peripheral surface of the resist layer; an etching step of performing etching using the resist layer as a masking material and removing the electroless plating layer and the electrolytic plating layer in the groove strip to form a coil with the remaining electroless plating layer and electrolytic plating layer.
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公开(公告)号:US20140028343A1
公开(公告)日:2014-01-30
申请号:US13944911
申请日:2013-07-18
Applicant: Nidec-Read Corporation
Inventor: Kiyoshi NUMATA , Masami YAMAMOTO , Sukkwi KIM
IPC: G01R31/28
CPC classification number: G01R31/2801 , G01R1/06722 , G01R1/06761
Abstract: A contact that can maintain the function of a spring portion even under relatively high current conditions, and an inspection jig equipped with the contact are provided. A contact of an inspection jig includes a columnar portion and a cylindrical portion disposed around the columnar portion. The columnar portion includes a front end portion protruding from the cylindrical portion, and a rear end portion. The cylindrical portion has a spring portion, and the spring portion is configured to expand and compress to change a dimension between the front end portion of the columnar portion and the rear end portion of the cylindrical portion. The cylindrical portion is formed of an alloy of nickel and phosphorus.
Abstract translation: 提供即使在相当高的电流条件下也可以保持弹簧部分的功能的触点,以及配备有触点的检查夹具。 检查夹具的接触件包括柱状部分和围绕柱状部分设置的圆柱形部分。 柱状部分包括从圆柱形部分突出的前端部分和后端部分。 圆筒部具有弹簧部,弹簧部构造为膨胀压缩,以使柱部的前端部与圆筒部的后端部之间的尺寸变化。 圆柱形部分由镍和磷的合金形成。
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