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公开(公告)号：US12000890B2
公开(公告)日：2024-06-04
申请号：US17881811
申请日：2022-08-05
发明人： Wu-Der Yang
IPC分类号： G01R31/26 , G01R31/317 , H03K17/687
CPC分类号： G01R31/31727 , H03K17/6871
摘要： An electronic device including a phase detector is provided. The phase detector includes a first transistor, a second transistor, a third transistor, a fourth transistor, and a first equalizer device. The first transistor has a first input terminal configured to receive a first signal. The second transistor has a second input terminal configured to receive a second signal. The third transistor is electrically connected to the first transistor and has a first output terminal. The fourth transistor is electrically connected to the second transistor and has a second output terminal. The first equalizer device is connected between the first output terminal and the second input terminal.
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公开(公告)号：US11894094B1
公开(公告)日：2024-02-06
申请号：US17966107
申请日：2022-10-14
发明人： Wu-Der Yang
摘要： An electronic device and a method of controlling an electronic device are provided. The electronic device includes a first transistor having a first resistor, second resistor, first transistor, and second transistor. The second resistor is connected to the first resistor. The first transistor is connected to the first resistor in parallel and has a first bulk. The second transistor is connected to the second resistor in parallel and has a second bulk. The first bulk of the first transistor receives a first voltage and the first bulk of the second transistor receives a second voltage. The first voltage and the second voltage are different.
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公开(公告)号：US11250925B1
公开(公告)日：2022-02-15
申请号：US16939047
申请日：2020-07-26
发明人： Wu-Der Yang
摘要： A ground bounce generator includes a resistor and at least one switch coupled in parallel with the resistor. The ground bounce generator is in a device under test circuit including a source, at least one ground bounce generator, at least one device under test, and a ground. The device under test is coupled in series between the source and the ground bounce generator. The device under test and the ground bounce generator are coupled in series between the source and the ground.
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公开(公告)号：US11222839B1
公开(公告)日：2022-01-11
申请号：US17037590
申请日：2020-09-29
发明人： Wu-Der Yang
IPC分类号： H01L23/31 , H01L23/498 , H01L23/00
摘要： A semiconductor structure includes a substrate, a chip, a first edge pad, a first central pad, a second edge pad, and a second central pad. The substrate has a first surface and a conductive trace extending above the substrate. The chip is above the first surface of the substrate, and has a sidewall, a central area, and an edge area. The first edge pad is on the edge area. The first central pad is on the central area and electrically connected to the first edge pad. The second edge pad is on the edge area of the chip. A distance between the first edge pad and the sidewall of the chip is substantially smaller than a distance between the second edge pad and the sidewall of the chip. The second central pad is on the central area of the chip and electrically connected to the second edge pad.
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公开(公告)号：US12099089B2
公开(公告)日：2024-09-24
申请号：US18208480
申请日：2023-06-12
发明人： Wu-Der Yang
IPC分类号： G01R31/26 , G01R31/317 , H03K17/687
CPC分类号： G01R31/31727 , H03K17/6871
摘要： An electronic device including a phase detector is provided. The phase detector includes a first transistor, a second transistor, a third transistor, a fourth transistor, and a first equalizer device. The first transistor has a first input terminal configured to receive a first signal. The second transistor has a second input terminal configured to receive a second signal. The third transistor is electrically connected to the first transistor and has a first output terminal. The fourth transistor is electrically connected to the second transistor and has a second output terminal. The first equalizer device is connected between the first output terminal and the second input terminal.
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公开(公告)号：US12094557B2
公开(公告)日：2024-09-17
申请号：US18222601
申请日：2023-07-17
发明人： Wu-Der Yang
摘要： An electronic device and a method of controlling an electronic device are provided. The electronic device includes a first transistor having a first resistor, second resistor, first transistor, and second transistor. The second resistor is connected to the first resistor. The first transistor is connected to the first resistor in parallel and has a first bulk. The second transistor is connected to the second resistor in parallel and has a second bulk. The first bulk of the first transistor receives a first voltage and the first bulk of the second transistor receives a second voltage. The first voltage and the second voltage are different.
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公开(公告)号：US11935605B2
公开(公告)日：2024-03-19
申请号：US17517525
申请日：2021-11-02
发明人： Wu-Der Yang
IPC分类号： H01L21/66 , G11C17/16 , G11C17/18 , G11C29/00 , H01L23/525
CPC分类号： G11C17/18 , G11C17/16 , G11C29/006 , G11C29/789 , H01L23/5252 , H01L22/14 , H01L23/5256
摘要： The present application discloses a method for preparing a semiconductor device including an electronic fuse control circuit. The method includes providing a chip including an electronic fuse control circuit, wherein the electronic fuse control circuit includes a program voltage pad, a fuse element, a latch, a plurality of resistor selection pads, and a plurality of bonding option units. The method further includes providing a substrate including a first voltage bonding pad and a plurality of second voltage bonding pads, disposing the chip on the substrate, bonding the first voltage bonding pad to the program voltage pad, and bonding at least one of the plurality of second voltage bonding pads to at least one of the plurality of resistor selection pads.
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公开(公告)号：US11828797B1
公开(公告)日：2023-11-28
申请号：US17738155
申请日：2022-05-06
发明人： Wu-Der Yang
CPC分类号： G01R31/2887 , G01R1/0433
摘要： A probing device includes a probe station. The probe station has a platform having an opening and a plurality of column members supporting the platform. Each of the plurality of column members has one end connected with the platform and an opposite end connected with a moving part. The probing device also includes a manipulator on the platform and a socket configured to support a DUT. The manipulator has a probe. The moving part is configured to allow the probe station to be moved with respect to the DUT.
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公开(公告)号：US11802910B1
公开(公告)日：2023-10-31
申请号：US17742629
申请日：2022-05-12
发明人： Wu-Der Yang
CPC分类号： G01R31/2889 , G01R1/0458 , G01R31/2887
摘要： A probe apparatus for testing a semiconductor device is provided. The testing device includes a socket having a cavity for accommodating a device under test (DUT), and a cover disposed on the socket. The socket includes a thermal conductive material. The cover includes a plate, a circuit board attached to the plate, and an opening penetrating the plate and the circuit board, exposing the cavity of the socket.
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公开(公告)号：US11798602B1
公开(公告)日：2023-10-24
申请号：US17741884
申请日：2022-05-11
发明人： Wu-Der Yang
IPC分类号： G11C7/10
CPC分类号： G11C7/1087 , G11C7/109 , G11C2207/12
摘要： A data receiving circuit is provided. The data receiving circuit includes a data input circuit, a latch circuit, and an equalizer. The data input circuit is configured to receive an input signal, and the latch circuit is connected to the data input circuit and configured to output an output signal in response to the input signal. The equalizer includes a first transistor having a source connected to latch circuit; and
a second transistor having a source connected to the latch circuit and a gate connected to a gate of the first transistor.
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