-
公开(公告)号：US20210191816A1
公开(公告)日：2021-06-24
申请号：US17249399
申请日：2021-03-01
Applicant: Micron Technology, Inc.
Inventor： Vamsi Rayaprolu , Sivagnanam Parthasarathy , Sampath K. Ratnam , Peter Feeley , Kishore Kumar Muchherla
Abstract: A request to retrieve user data stored at a memory device is received and a first error control operation associated with the user data is performed. An indication of a failure of the first error control operation is received, and in response, a subset of system data stored at the memory device is identified. A second error control operation is performed on the subset of the system data to retrieve the subset of the system data stored at the memory device, and the user data is read by using the subset of the system data retrieved based on the performing of the second error control operation.
-
公开(公告)号：US20190227870A1
公开(公告)日：2019-07-25
申请号：US16029331
申请日：2018-07-06
Applicant: Micron Technology, Inc.
Inventor： Vamsi Rayaprolu , Sivagnanam Parthasarathy , Sampath K. Ratnam , Peter Feeley , Kishore Kumar Muchherla
Abstract: User data that is to be stored at a memory system can be received. System data associated with the memory system can be identified and the user data and the system data can be stored at the memory system based on an error control operation. A subset of the system data can be identified and the subset of the system data can be stored at the memory system based on another error control operation.
-
公开(公告)号：US20230268018A1
公开(公告)日：2023-08-24
申请号：US17675477
申请日：2022-02-18
Applicant: Micron Technology, Inc.
Inventor： Vamsi Rayaprolu , Ashutosh Malshe , Gary Besinga , Roy Leonard
CPC classification number: G11C16/3495 , G11C16/102 , G11C16/16 , G11C16/26 , G11C16/32
Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a source set of memory cells of the memory device; determining whether the data validity metric value satisfies a first threshold criterion; responsive to determining that the data validity metric value satisfies the first threshold criterion, performing a data integrity check on the source set of memory cells to obtain a data integrity metric value; determining whether the data integrity metric value satisfies a second threshold criterion; and responsive to determining that the data integrity metric value fails to satisfy the second threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device.
-
4.发明授权公开(公告)号：US11024394B2
公开(公告)日：2021-06-01
申请号：US16844269
申请日：2020-04-09
Applicant: Micron Technology, Inc.
Inventor： Harish Singidi , Kishore Muchherla , Ashutosh Malshe , Vamsi Rayaprolu , Sampath Ratnam , Renato Padilla, Jr. , Michael Miller
Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
-
5.发明申请公开(公告)号：US20200234775A1
公开(公告)日：2020-07-23
申请号：US16844269
申请日：2020-04-09
Applicant: Micron Technology, Inc.
Inventor： Harish Singidi , Kishore Muchherla , Ashutosh Malshe , Vamsi Rayaprolu , Sampath Ratnam , Renato Padilla, JR. , Michael Miller
Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
-
Patent Agency Ranking
公开(公告)号：US20240127900A1
公开(公告)日：2024-04-18
申请号：US18394660
申请日：2023-12-22
Applicant: Micron Technology, Inc.
Inventor： Vamsi Rayaprolu , Ashutosh Malshe , Gary Besinga , Roy Leonard
CPC classification number: G11C16/3495 , G11C16/102 , G11C16/16 , G11C16/26 , G11C16/32
Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a set of memory cells of the memory device; responsive to determining that the data validity metric value satisfies a first threshold criterion, performing a data integrity check on the set of memory cells to obtain a data integrity metric value; and responsive to determining that the data integrity metric value satisfies a second threshold criterion, performing an error handling operation on the data stored on the set of memory cells to generate corrected data.
-
公开(公告)号：US11887681B2
公开(公告)日：2024-01-30
申请号：US17675477
申请日：2022-02-18
Applicant: Micron Technology, Inc.
Inventor： Vamsi Rayaprolu , Ashutosh Malshe , Gary Besinga , Roy Leonard
CPC classification number: G11C16/3495 , G11C16/102 , G11C16/16 , G11C16/26 , G11C16/32
Abstract: Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a source set of memory cells of the memory device; determining whether the data validity metric value satisfies a first threshold criterion; responsive to determining that the data validity metric value satisfies the first threshold criterion, performing a data integrity check on the source set of memory cells to obtain a data integrity metric value; determining whether the data integrity metric value satisfies a second threshold criterion; and responsive to determining that the data integrity metric value fails to satisfy the second threshold criterion, causing the memory device to copy data from the source set of memory cells to a destination set of memory cells of the memory device.
-
公开(公告)号：US11726874B2
公开(公告)日：2023-08-15
申请号：US17249399
申请日：2021-03-01
Applicant: Micron Technology, Inc.
Inventor： Vamsi Rayaprolu , Sivagnanam Parthasarathy , Sampath K. Ratnam , Peter Feeley , Kishore Kumar Muchherla
CPC classification number: G06F11/1076 , G06F3/064 , G06F3/0619 , G06F3/0673 , G06F11/1004 , G06F11/1012
Abstract: A request to retrieve user data stored at a memory device is received and a first error control operation associated with the user data is performed. An indication of a failure of the first error control operation is received, and in response, a subset of system data stored at the memory device is identified. A second error control operation is performed on the subset of the system data to retrieve the subset of the system data stored at the memory device, and the user data is read by using the subset of the system data retrieved based on the performing of the second error control operation.
-
公开(公告)号：US10963340B2
公开(公告)日：2021-03-30
申请号：US16029331
申请日：2018-07-06
Applicant: Micron Technology, Inc.
Inventor： Vamsi Rayaprolu , Sivagnanam Parthasarathy , Sampath K. Ratnam , Peter Feeley , Kishore Kumar Muchherla
Abstract: User data that is to be stored at a memory system can be received. System data associated with the memory system can be identified and the user data and the system data can be stored at the memory system based on an error control operation. A subset of the system data can be identified and the subset of the system data can be stored at the memory system based on another error control operation.
-
10.发明授权公开(公告)号：US10658047B1
公开(公告)日：2020-05-19
申请号：US16177193
申请日：2018-10-31
Applicant: Micron Technology, Inc.
Inventor： Harish Singidi , Kishore Muchherla , Ashutosh Malshe , Vamsi Rayaprolu , Sampath Ratnam , Renato Padilla, Jr. , Michael Miller
Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
-
-
-
-
-
-
-
-
-
Search Results
10
records
(took 0.017 seconds)
