公开(公告)号：US12046876B2

公开(公告)日：2024-07-23

申请号：US17453060

申请日：2021-11-01

Applicant: Lumentum Operations LLC

Inventor： Benjamin Kesler ,  Guowei Zhao

IPC: H01S5/42 ,  H01S5/042 ,  H01S5/183 ,  H01S5/34

CPC classification number: H01S5/426 ,  H01S5/0421 ,  H01S5/18305 ,  H01S5/18397 ,  H01S5/3416

Abstract: A vertical cavity surface emitting laser (VCSEL) device may include a substrate layer and a first set of epitaxial layers, for a first VCSEL, disposed on the substrate layer. The first set of epitaxial layers may include a first set of mirrors and at least one first active layer. The VCSEL device may include a second set of epitaxial layers, for a second VCSEL, disposed on the first set of epitaxial layers for the first VCSEL. The second set of epitaxial layers may include a second set of mirrors and at least one second active layer. The first VCSEL and the second VCSEL may be configured to emit light in a light emission direction. The at least one first active layer of the first VCSEL may be offset in the light emission direction from the at least one second active layer of the second VCSEL.

公开(公告)号：US11239638B2

公开(公告)日：2022-02-01

申请号：US16244842

申请日：2019-01-10

Applicant: Lumentum Operations LLC

Inventor： Benjamin Kesler ,  Ajit Vijay Barve ,  Guowei Zhao

IPC: H01S5/00 ,  H01S5/42 ,  H01L21/02

Abstract: A wafer may comprise a substrate layer and a plurality of vertical cavity surface emitting lasers (VCSELs) formed on or within the substrate layer. A respective trench-to-trench distance associated with the plurality of VCSELs may vary across the wafer based on a predicted variation of an oxidation rate of an oxidation layer across the wafer.

公开(公告)号：US20200076166A1

公开(公告)日：2020-03-05

申请号：US16244842

申请日：2019-01-10

Applicant: Lumentum Operations LLC

Inventor： Benjamin Kesler ,  Ajit Vijay Barve ,  Guowei Zhao

IPC: H01S5/42

Abstract: A wafer may comprise a substrate layer and a plurality of vertical cavity surface emitting lasers (VCSELs) formed on or within the substrate layer. A respective trench-to-trench distance associated with the plurality of VCSELs may vary across the wafer based on a predicted variation of an oxidation rate of an oxidation layer across the wafer.

公开(公告)号：US11855413B2

公开(公告)日：2023-12-26

申请号：US17135511

申请日：2020-12-28

Applicant: Lumentum Operations LLC

Inventor： Guowei Zhao ,  Matthew Glenn Peters ,  Jun Yang ,  Eric R. Hegblom

IPC: H01S5/183 ,  H01S5/42 ,  H01S5/042 ,  H01S5/34

CPC classification number: H01S5/18361 ,  H01S5/04256 ,  H01S5/18311 ,  H01S5/3416 ,  H01S5/423

Abstract: A vertical-cavity surface-emitting laser (VCSEL) array may include an n-type substrate layer and an n-type metal on a bottom surface of the n-type substrate layer. The n-type metal may form a common anode for a group of VCSEL. The VCSEL array may include a bottom mirror structure on a top surface of the n-type substrate layer. The bottom mirror structure may include one or more bottom mirror sections and a tunnel junction to reverse a carrier type within the bottom mirror structure. The VCSEL array may include an active region on the bottom mirror structure and an oxidation layer to provide optical and electrical confinement. The VCSEL array may include an n-type top mirror on the active region, a top contact layer over the n-type top mirror, and a top metal on the top contact layer. The top metal may form an isolated cathode for the VCSEL array.

公开(公告)号：US11616343B2

公开(公告)日：2023-03-28

申请号：US16948763

申请日：2020-09-30

Applicant: Lumentum Operations LLC

Inventor： Jun Yang ,  Guowei Zhao ,  Matthew Glenn Peters ,  Eric R. Hegblom ,  Ajit Vijay Barve ,  Benjamin Kesler

IPC: H01S5/00 ,  H01S5/30 ,  H01S5/183 ,  H01S5/34 ,  H01S5/042

Abstract: A VCSEL may include an n-type substrate layer and an n-type bottom mirror on a surface of the n-type substrate layer. The VCSEL may include an active region on the n-type bottom mirror and a p-type layer on the active region. The VCSEL may include an oxidation layer over the active region to provide optical and electrical confinement of the VCSEL. The VCSEL may include a tunnel junction over the p-type layer to reverse a carrier type of an n-type top mirror. Either the oxidation layer is on or in the p-type layer and the tunnel junction is on the oxidation layer, or the tunnel junction is on the p-type layer and the oxidation layer is on the tunnel junction. The VCSEL may include the n-type top mirror over the tunnel junction, a top contact layer over the n-type top mirror, and a top metal on the top contact layer.

公开(公告)号：US11088508B2

公开(公告)日：2021-08-10

申请号：US15688218

申请日：2017-08-28

Applicant: Lumentum Operations LLC

Inventor： Albert Yuen ,  Ajit Vijay Barve ,  Guowei Zhao ,  Eric R. Hegblom

IPC: H01S5/183 ,  H01S5/062 ,  G02B6/42 ,  H01L33/10 ,  H01S5/42 ,  G02B30/36 ,  H01S5/028

Abstract: In some implementations, a vertical cavity surface emitting laser (VCSEL) includes a substrate layer and epitaxial layers on the substrate layer. The epitaxial layers may include an active layer, a first mirror, a second mirror, and one or more oxidation layers. The active layer may be between the first mirror and the second mirror, and the one or more oxidation layers may be proximate to the active layer. The one or more oxidation layers may be configured to control beam divergence of a laser beam emitted by the VCSEL based on at least one of: a quantity of the one or more oxidation layers, a shape of the one or more oxidation layers, a thickness of the one or more oxidation layers, or a proximity of the one or more oxidation layers to the active layer.