3D-stacked backside illuminated image sensor and method of making the same
    1.
    发明授权
    3D-stacked backside illuminated image sensor and method of making the same 有权
    3D叠层背面照明图像传感器及其制作方法

    公开(公告)号:US09165968B2

    公开(公告)日:2015-10-20

    申请号:US13616850

    申请日:2012-09-14

    Abstract: A stacked image sensor and method for making the same are provided. The stacked image sensor includes an upper chip with a pixel array thereon. The second chip includes a plurality of column circuits and row circuits associated with the columns and rows of the pixel array and disposed in respective column circuit and row circuit regions that are arranged in multiple groups. Inter-chip bonding pads are formed on each of the chips. The inter-chip bonding pads on the second chip are arranged linearly and are contained within the column circuit regions and row circuit regions in one embodiment. In other embodiments, the inter-chip bonding pads are staggered with respect to each other. In some embodiments, the rows and columns of the pixel array include multiple signal lines and the corresponding column circuit regions and row circuit regions also include multiple inter-chip bonding pads.

    Abstract translation: 提供一种堆叠式图像传感器及其制造方法。 堆叠图像传感器包括其上具有像素阵列的上部芯片。 第二芯片包括与像素阵列的列和行相关联的多个列电路和行电路,并且被布置在多个组中的各个列电路和行电路区域中。 在每个芯片上形成芯片间接合焊盘。 在一个实施例中,第二芯片上的芯片间接合焊盘被线性布置并且被包含在列电路区域和行电路区域内。 在其他实施例中,芯片间接合焊盘相对于彼此交错。 在一些实施例中,像素阵列的行和列包括多个信号线,并且相应的列电路区域和行电路区域还包括多个芯片间接合焊盘。

    Color image sensor array with color crosstalk test patterns
    2.
    发明授权
    Color image sensor array with color crosstalk test patterns 有权
    具有彩色串扰测试图案的彩色图像传感器阵列

    公开(公告)号:US08350934B2

    公开(公告)日:2013-01-08

    申请号:US12909154

    申请日:2010-10-21

    CPC classification number: H04N9/646 H04N5/3572 H04N9/735 H04N17/002

    Abstract: An integrated circuit comprises a semiconductor substrate and a color image sensor array on the substrate. The color image sensor array has a first configuration of color pixels for collecting color image data, and at least one crosstalk test pattern on the substrate proximate the color image sensor array. The crosstalk test pattern includes a plurality of color sensing pixels arranged for making color crosstalk measurements. The test pattern configuration is different from the first configuration.

    Abstract translation: 集成电路包括在衬底上的半导体衬底和彩色图像传感器阵列。 彩色图像传感器阵列具有用于收集彩色图像数据的彩色像素的第一配置以及靠近彩色图像传感器阵列的基板上的至少一个串扰测试图案。 串扰测试图案包括布置成进行颜色串扰测量的多个颜色感测像素。 测试模式配置与第一种配置不同。

    Method of reducing column fixed pattern noise
    3.
    发明授权
    Method of reducing column fixed pattern noise 有权
    减少列固定图案噪声的方法

    公开(公告)号:US08830361B2

    公开(公告)日:2014-09-09

    申请号:US13445350

    申请日:2012-04-12

    CPC classification number: H04N5/378 G01J1/46 H04N5/3658 H04N5/37457 H04N17/002

    Abstract: A method of reducing column fixed pattern noise including calibrating a readout circuit, wherein the readout circuit is electrically connected to at least one programmable gain amplifier and an analog-to-digital converter. Calibrating the readout circuit includes electrically disconnecting the readout circuit from a pixel output and electrically connecting a pixel reset input of the readout circuit to a pixel output signal input of the readout circuit. Calibrating the readout circuit further includes comparing a measured output of the readout circuit to a predetermined value and storing the comparison result in a non-transitory computer readable medium. The method further includes operating the readout circuit, the operating the readout circuit includes receiving a pixel sample signal and outputting a calibrated output based on an operating output and the stored comparison result.

    Abstract translation: 一种降低列固定模式噪声的方法,包括校准读出电路,其中读出电路电连接至至少一个可编程增益放大器和模 - 数转换器。 校准读出电路包括将读出电路与像素输出电断开并将读出电路的像素复位输入电连接到读出电路的像素输出信号输入端。 校准读出电路还包括将读出电路的测量输出与预定值进行比较,并将比较结果存储在非暂时的计算机可读介质中。 所述方法还包括操作所述读出电路,所述读出电路的操作包括接收像素采样信号并基于操作输出和所存储的比较结果输出校准输出。

    CMOS sensor with low partition noise and low disturbance between adjacent row control signals in a pixel array

    公开(公告)号:US08599292B2

    公开(公告)日:2013-12-03

    申请号:US12858514

    申请日:2010-08-18

    CPC classification number: H01L27/14643 H04N5/3577 H04N5/374 H04N5/376

    Abstract: A CMOS image sensor includes a pixel array including a plurality of unit pixels with individual rows of unit pixels being coupled to respective row control signal lines, and a buffer including plural row control signal drivers. Each driver is coupled to a respective one of the row control signal lines and is configured to provide a row control signal pulse to a respective row control signal line in response to an input pulse when the row control signal line is in an active state and to bias the row control signal line at a ground voltage when the respective row control signal line is in an inactive state. Each driver has a first drive capability when the row control signal line is in the active state and a second drive capability greater than the first drive capability when the row control signal line is in an inactive state.

    COLOR IMAGE SENSOR ARRAY WITH COLOR CROSSTALK TEST PATTERNS
    5.
    发明申请
    COLOR IMAGE SENSOR ARRAY WITH COLOR CROSSTALK TEST PATTERNS 有权
    彩色图像传感器阵列与颜色CROSSTALK测试图案

    公开(公告)号:US20120098975A1

    公开(公告)日:2012-04-26

    申请号:US12909154

    申请日:2010-10-21

    CPC classification number: H04N9/646 H04N5/3572 H04N9/735 H04N17/002

    Abstract: An integrated circuit comprises a semiconductor substrate and a color image sensor array on the substrate. The color image sensor array has a first configuration of color pixels for collecting color image data, and at least one crosstalk test pattern on the substrate proximate the color image sensor array. The crosstalk test pattern includes a plurality of color sensing pixels arranged for making color crosstalk measurements. The test pattern configuration is different from the first configuration.

    Abstract translation: 集成电路包括在衬底上的半导体衬底和彩色图像传感器阵列。 彩色图像传感器阵列具有用于收集彩色图像数据的彩色像素的第一配置以及靠近彩色图像传感器阵列的基板上的至少一个串扰测试图案。 串扰测试图案包括布置成进行颜色串扰测量的多个颜色感测像素。 测试模式配置与第一种配置不同。

    Correlated double sampling circuit
    6.
    发明授权
    Correlated double sampling circuit 失效
    相关双采样电路

    公开(公告)号:US08138804B2

    公开(公告)日:2012-03-20

    申请号:US12534840

    申请日:2009-08-03

    Applicant: Kuo-Yu Chou

    Inventor: Kuo-Yu Chou

    CPC classification number: H04N5/378 H04N5/3575

    Abstract: A correlated double sampling (CDS) circuit for sampling first and second pixel signals, which are respectively transmitted via first and second data lines, in a pixel array. The CDS circuit includes first and second sampling circuits, an amplifier circuit and a control circuit. The control circuit controls the first sampling circuit to sample a reset level and a data level of the first pixel signal in a first sampling period, and controls the second sampling circuit to sample a reset level and a data level of the second pixel signal in a second sampling period. The control circuit controls the amplifier circuit to output the reset level and the data level of the first pixel signal in a first output period, and output the reset level and the data level of the second pixel signal in a second output period.

    Abstract translation: 用于对通过第一和第二数据线分别在像素阵列中发送的第一和第二像素信号进行采样的相关双采样(CDS)电路。 CDS电路包括第一和第二采样电路,放大器电路和控制电路。 所述控制电路控制所述第一采样电路在第一采样周期中对所述第一像素信号的复位电平和数据电平进行采样,并且控制所述第二采样电路对所述第二像素信号的复位电平和数据电平进行采样 第二抽样期。 控制电路控制放大器电路在第一输出周期中输出复位电平和第一像素信号的数据电平,并在第二输出周期中输出第二像素信号的复位电平和数据电平。

    Reference Voltage Generator for Analog-To-Digital Converter Circuit
    7.
    发明申请
    Reference Voltage Generator for Analog-To-Digital Converter Circuit 有权
    用于模数转换器电路的参考电压发生器

    公开(公告)号:US20080252364A1

    公开(公告)日:2008-10-16

    申请号:US11855142

    申请日:2007-09-13

    Applicant: Kuo-Yu Chou

    Inventor: Kuo-Yu Chou

    CPC classification number: G05F3/24

    Abstract: To mitigate kickback noise effect, the present invention provides a reference voltage generator for an analog-to-digital converter circuit. The reference voltage generator includes a bias generator, a bias converter and an output unit. The bias generator is used for generating a first bias voltage in accordance with a reference voltage. The bias converter is coupled to the bias generator and is used for converting the first bias voltage to a second bias voltage. The output unit is coupled to the bias converter and used for generating a first voltage to a load circuit in accordance with the second bias voltage.

    Abstract translation: 为了减轻反冲噪声效应,本发明提供了一种用于模数转换器电路的参考电压发生器。 参考电压发生器包括偏置发生器,偏置转换器和输出单元。 偏置发生器用于根据参考电压产生第一偏置电压。 偏置转换器耦合到偏置发生器,并用于将第一偏置电压转换为第二偏置电压。 输出单元耦合到偏置转换器,用于根据第二偏置电压向负载电路产生第一电压。

    Current steering digital-to-analog converter
    8.
    发明授权
    Current steering digital-to-analog converter 有权
    电流转向数模转换器

    公开(公告)号:US07312740B2

    公开(公告)日:2007-12-25

    申请号:US11306256

    申请日:2005-12-21

    Applicant: Kuo-Yu Chou

    Inventor: Kuo-Yu Chou

    CPC classification number: H03M1/68 H03M1/742

    Abstract: A current steering digital-to-analog converter (DAC) is provided. At least two lower-resolution DACs are used for converting a high-resolution digital signal. One of the two lower-resolution DACs is used for converting the most significant bits (MSB) of the high-resolution digital signal. The other of the two lower-resolution DACs is used for converting the least significant bits (LSB) of the high-resolution digital signal. By such arrangement, a device mismatch problem is avoided and the chance of variation occurrence during manufacturing process is reduced. The arrangement also simplifies the layout in the significantly scaled-down chip area.

    Abstract translation: 提供了一种电流转向数模转换器(DAC)。 至少两个较低分辨率的DAC用于转换高分辨率数字信号。 两个较低分辨率DAC中的一个用于转换高分辨率数字信号的最高有效位(MSB)。 两个较低分辨率DAC中的另一个用于转换高分辨率数字信号的最低有效位(LSB)。 通过这样的布置,避免了器件失配问题,减少了制造过程中发生变化的可能性。 该布置还简化了显着缩小芯片面积的布局。

    Transient voltage detecting circuit
    9.
    发明授权
    Transient voltage detecting circuit 失效
    瞬态电压检测电路

    公开(公告)号:US07280336B2

    公开(公告)日:2007-10-09

    申请号:US10920309

    申请日:2004-08-18

    Applicant: Kuo-Yu Chou

    Inventor: Kuo-Yu Chou

    CPC classification number: H02H9/04

    Abstract: The invention provides a transient voltage detecting circuit for detecting a transient voltage occurring at a power supply or a ground of an electronic system. The circuit according to the invention includes a plurality of detecting units of which the outputs are initially latched by at least one voltage source. The circuit also includes a detecting device outputting a first logic according to the initial outputs of all of the detecting units. When the transient voltage occurs, it is ensured that the logic of the output of one of the detecting units is changed by the transient voltage or the decayed transient voltage, such that the decision device renewably outputs a second logic to trigger a resetting device of the electronic system in accordance with the outputs of all of the detecting units.

    Abstract translation: 本发明提供了一种瞬态电压检测电路,用于检测在电子系统的电源或接地处产生的瞬态电压。 根据本发明的电路包括多个检测单元,其中输出端最初由至少一个电压源锁存。 电路还包括根据所有检测单元的初始输出输出第一逻辑的检测装置。 当发生瞬态电压时,确保其中一个检测单元的输出的逻辑由瞬态电压或衰减的瞬态电压改变,使得判定装置可再生地输出第二逻辑以触发复位装置 电子系统根据所有检测单元的输出。

    CURRENT STEERING DIGITAL-TO-ANALOG CONVERTER
    10.
    发明申请
    CURRENT STEERING DIGITAL-TO-ANALOG CONVERTER 有权
    电流转向数字到模拟转换器

    公开(公告)号:US20070090981A1

    公开(公告)日:2007-04-26

    申请号:US11306256

    申请日:2005-12-21

    Applicant: Kuo-Yu Chou

    Inventor: Kuo-Yu Chou

    CPC classification number: H03M1/68 H03M1/742

    Abstract: A current steering digital-to-analog converter (DAC) is provided. At least two lower-resolution DACs are used for converting a high-resolution digital signal. One of the two lower-resolution DACs is used for converting the most significant bits (MSB) of the high-resolution digital signal. The other of the two lower-resolution DACs is used for converting the least significant bits (LSB) of the high-resolution digital signal. By such arrangement, a device mismatch problem is avoided and the chance of variation occurrence during manufacturing process is reduced. The arrangement also simplifies the layout in the significantly scaled-down chip area.

    Abstract translation: 提供了一种电流转向数模转换器(DAC)。 至少两个较低分辨率的DAC用于转换高分辨率数字信号。 两个较低分辨率DAC中的一个用于转换高分辨率数字信号的最高有效位(MSB)。 两个较低分辨率DAC中的另一个用于转换高分辨率数字信号的最低有效位(LSB)。 通过这样的布置,避免了器件失配问题,减少了制造过程中发生变化的可能性。 该布置还简化了显着缩小芯片面积的布局。

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