Abstract:
A stacked image sensor and method for making the same are provided. The stacked image sensor includes an upper chip with a pixel array thereon. The second chip includes a plurality of column circuits and row circuits associated with the columns and rows of the pixel array and disposed in respective column circuit and row circuit regions that are arranged in multiple groups. Inter-chip bonding pads are formed on each of the chips. The inter-chip bonding pads on the second chip are arranged linearly and are contained within the column circuit regions and row circuit regions in one embodiment. In other embodiments, the inter-chip bonding pads are staggered with respect to each other. In some embodiments, the rows and columns of the pixel array include multiple signal lines and the corresponding column circuit regions and row circuit regions also include multiple inter-chip bonding pads.
Abstract:
An integrated circuit comprises a semiconductor substrate and a color image sensor array on the substrate. The color image sensor array has a first configuration of color pixels for collecting color image data, and at least one crosstalk test pattern on the substrate proximate the color image sensor array. The crosstalk test pattern includes a plurality of color sensing pixels arranged for making color crosstalk measurements. The test pattern configuration is different from the first configuration.
Abstract:
A method of reducing column fixed pattern noise including calibrating a readout circuit, wherein the readout circuit is electrically connected to at least one programmable gain amplifier and an analog-to-digital converter. Calibrating the readout circuit includes electrically disconnecting the readout circuit from a pixel output and electrically connecting a pixel reset input of the readout circuit to a pixel output signal input of the readout circuit. Calibrating the readout circuit further includes comparing a measured output of the readout circuit to a predetermined value and storing the comparison result in a non-transitory computer readable medium. The method further includes operating the readout circuit, the operating the readout circuit includes receiving a pixel sample signal and outputting a calibrated output based on an operating output and the stored comparison result.
Abstract:
A CMOS image sensor includes a pixel array including a plurality of unit pixels with individual rows of unit pixels being coupled to respective row control signal lines, and a buffer including plural row control signal drivers. Each driver is coupled to a respective one of the row control signal lines and is configured to provide a row control signal pulse to a respective row control signal line in response to an input pulse when the row control signal line is in an active state and to bias the row control signal line at a ground voltage when the respective row control signal line is in an inactive state. Each driver has a first drive capability when the row control signal line is in the active state and a second drive capability greater than the first drive capability when the row control signal line is in an inactive state.
Abstract:
An integrated circuit comprises a semiconductor substrate and a color image sensor array on the substrate. The color image sensor array has a first configuration of color pixels for collecting color image data, and at least one crosstalk test pattern on the substrate proximate the color image sensor array. The crosstalk test pattern includes a plurality of color sensing pixels arranged for making color crosstalk measurements. The test pattern configuration is different from the first configuration.
Abstract:
A correlated double sampling (CDS) circuit for sampling first and second pixel signals, which are respectively transmitted via first and second data lines, in a pixel array. The CDS circuit includes first and second sampling circuits, an amplifier circuit and a control circuit. The control circuit controls the first sampling circuit to sample a reset level and a data level of the first pixel signal in a first sampling period, and controls the second sampling circuit to sample a reset level and a data level of the second pixel signal in a second sampling period. The control circuit controls the amplifier circuit to output the reset level and the data level of the first pixel signal in a first output period, and output the reset level and the data level of the second pixel signal in a second output period.
Abstract:
To mitigate kickback noise effect, the present invention provides a reference voltage generator for an analog-to-digital converter circuit. The reference voltage generator includes a bias generator, a bias converter and an output unit. The bias generator is used for generating a first bias voltage in accordance with a reference voltage. The bias converter is coupled to the bias generator and is used for converting the first bias voltage to a second bias voltage. The output unit is coupled to the bias converter and used for generating a first voltage to a load circuit in accordance with the second bias voltage.
Abstract:
A current steering digital-to-analog converter (DAC) is provided. At least two lower-resolution DACs are used for converting a high-resolution digital signal. One of the two lower-resolution DACs is used for converting the most significant bits (MSB) of the high-resolution digital signal. The other of the two lower-resolution DACs is used for converting the least significant bits (LSB) of the high-resolution digital signal. By such arrangement, a device mismatch problem is avoided and the chance of variation occurrence during manufacturing process is reduced. The arrangement also simplifies the layout in the significantly scaled-down chip area.
Abstract:
The invention provides a transient voltage detecting circuit for detecting a transient voltage occurring at a power supply or a ground of an electronic system. The circuit according to the invention includes a plurality of detecting units of which the outputs are initially latched by at least one voltage source. The circuit also includes a detecting device outputting a first logic according to the initial outputs of all of the detecting units. When the transient voltage occurs, it is ensured that the logic of the output of one of the detecting units is changed by the transient voltage or the decayed transient voltage, such that the decision device renewably outputs a second logic to trigger a resetting device of the electronic system in accordance with the outputs of all of the detecting units.
Abstract:
A current steering digital-to-analog converter (DAC) is provided. At least two lower-resolution DACs are used for converting a high-resolution digital signal. One of the two lower-resolution DACs is used for converting the most significant bits (MSB) of the high-resolution digital signal. The other of the two lower-resolution DACs is used for converting the least significant bits (LSB) of the high-resolution digital signal. By such arrangement, a device mismatch problem is avoided and the chance of variation occurrence during manufacturing process is reduced. The arrangement also simplifies the layout in the significantly scaled-down chip area.