LIQUID METAL ION SOURCE DEVICE FOR USING BISMUTH AND ALLOY OF BISMUTH

    公开(公告)号:US20240331967A1

    公开(公告)日:2024-10-03

    申请号:US18407388

    申请日:2024-01-08

    CPC classification number: H01J37/08 H01J2237/032 H01J2237/0805 H01J2237/208

    Abstract: A liquid metal ion source device for using bismuth and an alloy of the bismuth is provided. The liquid metal ion source device includes a base formed of an electrically insulating material, two electrodes connected to the base and configured to supply current, a needle mounted on the base and configured to pass through the base, a filament including a pair of connection rods connected to the two electrodes, respectively, a pair of support rods formed to be extended from the pair of connection rods, respectively, and provided in a direction away from the base and towards the needle, and a filament head connecting the pair of support rods to one another and having a shape curved toward the base, and a reservoir configured to accommodate at least a portion of the filament head inside the reservoir and store a liquid metal.

    Device and method for generating organic molecular cluster ion beam

    公开(公告)号:US10699868B2

    公开(公告)日:2020-06-30

    申请号:US16185527

    申请日:2018-11-09

    Abstract: Disclosed is a device for generating an organic molecular cluster ion beam, the device including a receiver configured to accommodate an organic material, a cluster generator configured to generate a cluster by supersonic expanding the organic material accommodated in the receiver at a high speed, a photo-ionizer configured to temporarily accommodate the cluster that is generated through the cluster generator, an ultraviolet (UV) light source configured to irradiate an UV pulse to the photo-ionizer to ionize the cluster, and entrance electrodes disposed at both sides of the photo-ionizer and configured to provide a potential difference to the photo-ionizer to generate a cluster ion beam.

    MASS SPECTROMETRY SYSTEM AND METHOD

    公开(公告)号:US20210090873A1

    公开(公告)日:2021-03-25

    申请号:US16937862

    申请日:2020-07-24

    Abstract: A mass spectrometry system includes a sample holder provided in a vacuum changer and on which a sample is disposed, an irradiator configured to perform sputtering or ionization on the sample, an analyzer configured to analyze an ionized sample generated from the sample by the irradiator, and a controller configured to control the irradiator or the analyzer and perform a first process and a second process. The first process is to determine position information of materials in the sample by irradiating a laser or ion beam to a portion of the sample, and the second process is to irradiate a laser or ion beam of a first output value to another portion of the sample in a section in which the materials in the sample change and irradiate a laser or ion beam of a second output value in other sections.

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