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1.
公开(公告)号:US20240337926A1
公开(公告)日:2024-10-10
申请号:US18745066
申请日:2024-06-17
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Michael K. Kocsis , Alan J. Telecky , Brian J. Cardineau
CPC classification number: G03F7/0042 , G03F7/0043 , G03F7/2004 , G03F7/32 , G03F7/322 , G03F7/325
Abstract: Organometallic radiation resist compositions are described based on tin ions with alkyl ligands. Some of the compositions have branched alkyl ligands to provide for improved patterning contrast while maintaining a high degree of solution stability. Blends of compounds with distinct alkyl ligands can provide further improvement in the patterning. High resolution patterning with a half-pitch of no more than 25 nm can be achieved with a line width roughness of no more than about 4.5 nm. Synthesis techniques have been developed that allow for the formation of alkyl tin oxide hydroxide compositions with very low metal contamination.
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公开(公告)号:US10975109B2
公开(公告)日:2021-04-13
申请号:US16936861
申请日:2020-07-23
Applicant: Inpria Corporation
Inventor: Joseph B. Edson , Thomas J. Lamkin , William Earley , Truman Wambach , Jeremy T. Anderson
IPC: C07F7/22
Abstract: A pure composition comprises a monoalkyltin trialkoxide compound represented by the chemical formula RSn(OR′)3 or a monoalkyl tin triamide compound represented by the chemical formula RSn(NR′2)3 and no more than 4 mole % dialkyltin compounds relative to the total tin amount, where R is a hydrocarbyl group with 1-31 carbon atoms, and wherein R′ is a hydrocarbyl group with 1-10 carbon atoms. Methods are described for the formation of the pure compositions. A solid composition comprises a monoalkyl triamido tin compound represented by the chemical formula RSn—(NR′COR″)3, where R is a hydrocarbyl group with 1-31 carbon atoms, and where R′ and R″ are independently a hydrocarbyl group with 1-10 carbon atoms. The compositions are suitable for the formation of resist compositions suitable for EUV patterning in which the compositions have a high EUV absorption.
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3.
公开(公告)号:US20200369691A1
公开(公告)日:2020-11-26
申请号:US16936861
申请日:2020-07-23
Applicant: Inpria Corporation
Inventor: Joseph B. Edson , Thomas J. Lamkin , William Earley , Truman Wambach , Jeremy T. Anderson
IPC: C07F7/22
Abstract: A pure composition comprises a monoalkyltin trialkoxide compound represented by the chemical formula RSn(OR′)3 or a monoalkyl tin triamide compound represented by the chemical formula RSn(NR′2)3 and no more than 4 mole % dialkyltin compounds relative to the total tin amount, where R is a hydrocarbyl group with 1-31 carbon atoms, and wherein R′ is a hydrocarbyl group with 1-10 carbon atoms. Methods are described for the formation of the pure compositions. A solid composition comprises a monoalkyl triamido tin compound represented by the chemical formula RSn—(NR′COR″)3, where R is a hydrocarbyl group with 1-31 carbon atoms, and where R′ and R″ are independently a hydrocarbyl group with 1-10 carbon atoms. The compositions are suitable for the formation of resist compositions suitable for EUV patterning in which the compositions have a high EUV absorption.
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公开(公告)号:US10732505B1
公开(公告)日:2020-08-04
申请号:US16861333
申请日:2020-04-29
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Brian J. Cardineau , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Alan J. Telecky
Abstract: Organometallic precursors are described for the formation of high resolution lithography patterning coatings based on metal oxide hydroxide chemistry. The precursor compositions generally comprise ligands readily hydrolysable by water vapor or other OH source composition under modest conditions. The organometallic precursors generally comprise a radiation sensitive organo ligand to tin that can result in a coating that can be effective for high resolution patterning at relatively low radiation doses and is particularly useful for EUV patterning. The precursors compositions are readily processable under commercially suitable conditions. Solution phase processing with in situ hydrolysis or vapor based deposition can be used to form the coatings.
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5.
公开(公告)号:US20190315781A1
公开(公告)日:2019-10-17
申请号:US15950286
申请日:2018-04-11
Applicant: Inpria Corporation
Inventor: Joseph B. Edson , Thomas J. Lamkin , William Earley , Truman Wambach
IPC: C07F7/22
Abstract: A pure composition comprises a monoalkyltin trialkoxide compound represented by the chemical formula RSn(OR′)3 or a monoalkyl tin triamide compound represented by the chemical formula RSn(NR′2)3 and no more than 4 mole % dialkyltin compounds relative to the total tin amount, where R is a hydrocarbyl group with 1-31 carbon atoms, and wherein R′ is a hydrocarbyl group with 1-10 carbon atoms. Methods are described for the formation of the pure compositions. A solid composition comprises a monoalkyl triamido tin compound represented by the chemical formula RSn—(NR′COR″)3, where R is a hydrocarbyl group with 1-31 carbon atoms, and where R′ and R″ are independently a hydrocarbyl group with 1-10 carbon atoms. The compositions are suitable for the formation of resist compositions suitable for EUV patterning in which the compositions have a high EUV absorption.
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公开(公告)号:US11966158B2
公开(公告)日:2024-04-23
申请号:US16262233
申请日:2019-01-30
Applicant: Inpria Corporation
Inventor: Benjamin L. Clark , Dominick Smiddy , Thomas J. Lamkin , Mark Geniza , Joseph B. Edson , Craig M. Gates
CPC classification number: G03F7/0042 , G03F7/2004
Abstract: The purification of monoalkyl tin trialkoxides and monoalkyl tin triamides are described using fractional distillation and/or ultrafiltration. The purified compositions are useful as radiation sensitive patterning compositions or precursors thereof. The fractional distillation process has been found to be effective for the removal of metal impurities down to very low levels. The ultrafiltration processes have been found to be effective at removal of fine particulates. Commercially practical processing techniques are described.
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公开(公告)号:US11809081B2
公开(公告)日:2023-11-07
申请号:US17832920
申请日:2022-06-06
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Brian J. Cardineau , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Alan J. Telecky
IPC: G03F7/16 , G03F7/004 , G03F7/38 , C23C16/40 , C23C14/08 , C23C16/455 , G03F7/30 , G03F7/20 , G03F7/32 , G03F7/40
CPC classification number: G03F7/168 , C23C14/086 , C23C16/407 , C23C16/45523 , C23C16/45561 , G03F7/0042 , G03F7/0043 , G03F7/162 , G03F7/167 , G03F7/2004 , G03F7/30 , G03F7/325 , G03F7/38 , G03F7/40
Abstract: Organometallic precursors are described for the formation of high resolution lithography patterning coatings based on metal oxide hydroxide chemistry. The precursor compositions generally comprise ligands readily hydrolysable by water vapor or other OH source composition under modest conditions. The organometallic precursors generally comprise a radiation sensitive organo ligand to tin that can result in a coating that can be effective for high resolution patterning at relatively low radiation doses and is particularly useful for EUV patterning. The precursors compositions are readily processable under commercially suitable conditions. Solution phase processing with in situ hydrolysis or vapor based deposition can be used to form the coatings.
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公开(公告)号:US20230004090A1
公开(公告)日:2023-01-05
申请号:US17939328
申请日:2022-09-07
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Brian J. Cardineau , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Alan J. Telecky
IPC: G03F7/16 , G03F7/38 , C23C16/40 , C23C14/08 , G03F7/004 , C23C16/455 , G03F7/20 , G03F7/32 , G03F7/40
Abstract: Organometallic precursors are described for the formation of high resolution lithography patterning coatings based on metal oxide hydroxide chemistry. The precursor compositions generally comprise ligands readily hydrolysable by water vapor or other OH source composition under modest conditions. The organometallic precursors generally comprise a radiation sensitive organo ligand to tin that can result in a coating that can be effective for high resolution patterning at relatively low radiation doses and is particularly useful for EUV patterning. The precursors compositions are readily processable under commercially suitable conditions. Solution phase processing with in situ hydrolysis or vapor based deposition can be used to form the coatings.
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公开(公告)号:US11537048B2
公开(公告)日:2022-12-27
申请号:US16987120
申请日:2020-08-06
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Brian J. Cardineau , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Alan J. Telecky
IPC: G03F7/16 , C23C14/08 , G03F7/38 , C23C16/40 , G03F7/004 , C23C16/455 , G03F7/20 , G03F7/32 , G03F7/40
Abstract: Organometallic precursors are described for the formation of high resolution lithography patterning coatings based on metal oxide hydroxide chemistry. The precursor compositions generally comprise ligands readily hydrolysable by water vapor or other OH source composition under modest conditions. The organometallic precursors generally comprise a radiation sensitive organo ligand to tin that can result in a coating that can be effective for high resolution patterning at relatively low radiation doses and is particularly useful for EUV patterning. The precursors compositions are readily processable under commercially suitable conditions. Solution phase processing with in situ hydrolysis or vapor based deposition can be used to form the coatings.
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公开(公告)号:US20220064192A1
公开(公告)日:2022-03-03
申请号:US17410316
申请日:2021-08-24
Applicant: Inpria Corporation
Inventor: Joseph B. Edson , Brian J. Cardineau , William Earley , Kierra Huihui-Gist , Thomas J. Lamkin , Robert E. Jilek
IPC: C07F7/22
Abstract: Synthesis reactions are described to efficiently and specifically form compounds of the structure RSnL3, where R is an organic ligand to the tin, and L is hydrolysable ligand or a hydrolysis product thereof. The synthesis is effective for a broad range of R ligands. The synthesis is based on the use of alkali metal ions and optionally alkaline earth (pseudo-alkaline earth) metal ions. Compounds are formed of the structures represented by the formulas RSn(C≡CSiR′3)3, R′R″ACSnL3, where A is a halogen atom (F, Cl, Br or I) or an aromatic ring with at least one halogen substituent, R′R″(R′″O)CSnL3 or R′R″(N≡C)CSnZ3.
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