METHOD AND APPARATUS FOR DEFECT MANAGEMENT IN A NON-VOLATILE MEMORY DEVICE
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    发明申请
    METHOD AND APPARATUS FOR DEFECT MANAGEMENT IN A NON-VOLATILE MEMORY DEVICE 有权
    非易失性存储器件缺陷管理的方法与装置

    公开(公告)号:US20170046073A1

    公开(公告)日:2017-02-16

    申请号:US14822793

    申请日:2015-08-10

    申请人: INTEL CORPORATION

    IPC分类号: G06F3/06 G11C5/02 G06F12/10

    摘要: Provided are a method and apparatus for remapping logical to physical addresses for a non-volatile memory having dies. Bands extend through the dies and planes in the dies extending through the bands define addressable blocks. A first remapping of a logical-to-physical mapping is performed by remapping logical addresses of blocks in a first end of the bands that map to defective physical blocks to map to good physical blocks at a second end of the bands. After performing the first remapping, a second remapping of the logical-to-physical mapping is performed by remapping logical addresses in the second end of bands that map to defective blocks to map to good physical blocks in the first end of bands.

    摘要翻译: 提供了一种用于对具有管芯的非易失性存储器重新映射逻辑到物理地址的方法和装置。 带延伸穿过模具,延伸穿过带的模具中的平面定义可寻址块。 通过重新映射映射到不良物理块的频带的第一端中的块的逻辑地址,以在频带的第二端映射到良好的物理块来执行逻辑到物理映射的第一重映射。 在执行第一重映射之后,通过重新映射映射到缺陷块的频带的第二端中的逻辑地址来进行逻辑到物理映射的第二重映射,以映射到频带的第一端中的良好的物理块。