公开(公告)号：US09786535B2

公开(公告)日：2017-10-10

申请号：US14556233

申请日：2014-11-30

Applicant: GUDENG PRECISION INDUSTRIAL CO., LTD.

Inventor： Hui-Ming Pao ,  Cheng-Hsin Chen ,  Po-Ting Lee ,  Ming-Chien Chiu ,  Tien-Jui Lin

IPC: B08B3/00 ,  H01L21/677 ,  H01L21/673 ,  H01L21/68 ,  H01L21/687 ,  H01L21/67

CPC classification number: H01L21/67748 ,  H01L21/67259 ,  H01L21/67353 ,  H01L21/67393 ,  H01L21/6773 ,  H01L21/67736 ,  H01L21/67778 ,  H01L21/68 ,  H01L21/687

Abstract: The present invention relates to a wafer transport system and a method of operating the same. The wafer transport system comprises at least one semiconductor apparatus, a track, a transfer device, a positioning device, a carrier and a cleaning device. The wafer transport system transports wafers along the at least one semiconductor apparatus via the carrier riding on the track. The transfer device transfers the wafers from the carrier to the at least one semiconductor apparatus. The positioning device identifies and controls the position of the carrier on the track. The cleaning device maintains the cleanliness of the wafers. The present invention provides advantages for improving the yield rate of a wafer, shortening the fabrication time of a wafer, and offering the flexibility and the extendibility to a wafer transport system.

公开(公告)号：US09817306B2

公开(公告)日：2017-11-14

申请号：US14862334

申请日：2015-09-23

Applicant: GUDENG PRECISION INDUSTRIAL CO., LTD.

Inventor： Wei-Yen Chen ,  Cheng-Ju Lee ,  Long-Ming Lu ,  Cheng-Hsin Chen ,  Tien-Jui Lin

IPC: G03F1/22 ,  G03F1/42 ,  G03F1/66

CPC classification number: G03F1/22 ,  G03F1/42 ,  G03F1/66

Abstract: The present invention relates to an EUV pod having marks, which comprises a mask pod and one or more mark disposed on the mask pod. One or more sensor of a processing machine is used for detecting the one or more mark. By including the one or more mark, the surface roughness of one or more region of the mask pod detectable by the one or more sensor can be altered. The one or more sensor emits light to the mask pod, which reflects the light to the one or more sensor. The one or more sensor receives the reflection light from the mask pod and judges if the voltage generated by the reflection light falls within the reflection ranges of the mark. Thereby, whether the one or more sensor corresponds to the one or more make can be confirmed.

公开(公告)号：US10101047B2

公开(公告)日：2018-10-16

申请号：US13834796

申请日：2013-03-15

Applicant: GUDENG PRECISION INDUSTRIAL CO, LTD.

Inventor： Ming-Mo Lo ,  Cheng-Hsin Chen ,  Tien-Jui Lin

IPC: F24F7/04 ,  H01L21/673

Abstract: A gas purifier to be applied on a wafer substrate accommodating unit with an inlet hole includes an outer tube and an inner tube. The outer tube is disposed on the wafer substrate accommodating unit and has a plurality of first gas filling apertures. One end of the inner tube is a closed end and the other end is an open end. The inner tube has a plurality of second gas filling apertures, and its open end is interconnected with the inlet hole. The inner tube is movably disposed within the outer tube between a first operating position and second operating position. The second gas filling apertures are correspondingly configured to an inner wall of the outer tube when the inner tube is at a first operating position, and interconnected with the first gas filling apertures when the inner tube is at a second operating position.