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公开(公告)号：US5969361A
公开(公告)日：1999-10-19
申请号：US983436
申请日：1998-02-11
CPC分类号： H01J43/045
摘要： This detector comprises electron multiplication means (14) producing a cluster of electrons under the impact of each particle (2), a layer (6) that this cluster passes through, and which emits a light pulse by interaction with the layer, and transparent electron detection means (8) capable of determining the moment of impact of the particle and supplying information about the impact positions for each moment thus determined, so that these positions can be determined and correlated with the moments determined by the detection means.
摘要翻译： PCT No.PCT / FR96 / 01100 Sec。 371日期1998年2月11日 102（e）1998年2月11日PCT PCT 1996年7月16日PCT公布。 出版物WO97 / 04335 日期1997年2月6日该检测器包括在每个粒子（2）的冲击下产生电子簇的电子倍增装置（14），该簇通过的层（6），并且通过与 层和透明电子检测装置（8），其能够确定颗粒的冲击力矩并且提供关于如此确定的每个时刻的冲击位置的信息，使得可以确定这些位置并与由检测装置确定的力矩相关联 。
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公开(公告)号：US20100223698A1
公开(公告)日：2010-09-02
申请号：US12682700
申请日：2008-10-08
IPC分类号： G01Q60/24
CPC分类号： H01J49/40 , H01J49/0004
摘要： The present invention concerns the enhancing of the mass resolution of wide angle tomographic atom probes. The invention consists of an atom probe also comprising a sample-holding device and a detector which are separated from one another by a distance L and enclosed in a chamber, an “Einzel” type electrostatic lens consisting of three electrodes arranged inside the chamber between the sample and the detector, to which electrical potentials are applied so as to form an electrical field that strongly focuses the beam of ions emitted by the sample under test when the probe is operating. According to the invention, the geometry of the electrodes is defined precisely so as to greatly limit the effects of the spherical aberration that affects the “Einzel” lens on the beam of ions, said spherical aberration being clearly sensitive when the lens is greatly polarized. The invention applies more particularly to the atom probes known as 3D atom probes.
摘要翻译： 本发明涉及广角断层成像原子探针的质量分辨率的提高。 本发明还包括原子探针，其还包括彼此分离距离L并封闭在腔室中的样品保持装置和检测器，“三角形”型静电透镜，由三个电极组成，该三个电极布置在室内 样品和检测器，施加电位以形成电场，当探头工作时，电场强烈地聚焦待测样品发射的离子束。 根据本发明，电极的几何形状被精确限定，以便极大地限制影响“Einzel”透镜对离子束的球面像差的影响，当透镜极大地偏振时，所述球面像差是明显敏感的。 本发明更具体地应用于称为3D原子探针的原子探针。
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公开(公告)号：US08074292B2
公开(公告)日：2011-12-06
申请号：US12682700
申请日：2008-10-08
IPC分类号： G01Q60/00
CPC分类号： H01J49/40 , H01J49/0004
摘要： The present invention concerns the enhancing of the mass resolution of wide angle tomographic atom probes. The invention consists of an atom probe also comprising a sample-holding device and a detector which are separated from one another by a distance L and enclosed in a chamber, an “Einzel” type electrostatic lens consisting of three electrodes arranged inside the chamber between the sample and the detector, to which electrical potentials are applied so as to form an electrical field that strongly focuses the beam of ions emitted by the sample under test when the probe is operating. According to the invention, the geometry of the electrodes is defined precisely so as to greatly limit the effects of the spherical aberration that affects the “Einzel” lens on the beam of ions, said spherical aberration being clearly sensitive when the lens is greatly polarized. The invention applies more particularly to the atom probes known as 3D atom probes.
摘要翻译： 本发明涉及广角断层成像原子探针的质量分辨率的提高。 本发明还包括原子探针，其还包括彼此分离距离L并封闭在腔室中的样品保持装置和检测器，“三角形”型静电透镜，由三个电极组成，该三个电极布置在室内 样品和检测器，施加电位以形成电场，当探头工作时，电场强烈地聚焦待测样品发射的离子束。 根据本发明，精确地限定电极的几何形状，以便极大地限制影响“Einzel”透镜的离子束的球面像差的影响，当透镜极大地偏振时，所述球面像差明显敏感。 本发明更具体地应用于称为3D原子探针的原子探针。
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4.发明申请Device for Generating Wide Spectral Band Laser Pulses, Particularly for a Tomographic Atom Probe 有权用于产生宽谱带激光脉冲的装置，特别是用于层析原子探针的装置公开(公告)号：US20110210245A1
公开(公告)日：2011-09-01
申请号：US12997458
申请日：2009-06-09
IPC分类号： H01J49/00
CPC分类号： G02F1/353 , G02F2001/3528 , G02F2202/32
摘要： A wide spectral band laser pulse generating device capable of covering a spectrum formed of given wavelengths is provided, including: a monochromatic laser light source whose intensity is adjustable; non-linear optical means, a photonic crystal or a microstructured optical fiber for example, for carrying out spectral widening of the wave emitted by the light source; the light source and the non-linear optical means are configured and arranged so as to create a white supercontinuum whose continuous spectrum contains the wavelengths considered. The invention relates to the general field of the analysis of the composition of material specimens, and in particular to laser tomographic atom probes.
摘要翻译： 提供能够覆盖由给定波长形成的光谱的宽谱带激光脉冲产生装置，包括：强度可调的单色激光光源; 非线性光学装置，例如光子晶体或微结构光纤，用于执行由光源发射的波的光谱加宽; 光源和非线性光学装置被配置和布置成产生其连续光谱包含考虑的波长的白色超连续谱。 本发明涉及材料样品组成的分析的一般领域，特别涉及激光断层成像原子探针。
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5.发明授权Device for generating wide spectral band laser pulses, particularly for a tomographic atom probe 有权用于产生宽谱带激光脉冲的装置，特别是用于断层原子探针的装置公开(公告)号：US08247766B2
公开(公告)日：2012-08-21
申请号：US12997458
申请日：2009-06-09
IPC分类号： H01J49/00
CPC分类号： G02F1/353 , G02F2001/3528 , G02F2202/32
摘要： A wide spectral band laser pulse generating device capable of covering a spectrum formed of given wavelengths is provided, including: a monochromatic laser light source whose intensity is adjustable; non-linear optical means, a photonic crystal or a microstructured optical fiber for example, for carrying out spectral widening of the wave emitted by the light source; the light source and the non-linear optical means are configured and arranged so as to create a white supercontinuum whose continuous spectrum contains the wavelengths considered. The invention relates to the general field of the analysis of the composition of material specimens, and in particular to laser tomographic atom probes.
摘要翻译： 提供能够覆盖由给定波长形成的光谱的宽谱带激光脉冲产生装置，包括：强度可调的单色激光光源; 非线性光学装置，例如光子晶体或微结构光纤，用于执行由光源发射的波的光谱加宽; 光源和非线性光学装置被配置和布置成产生其连续光谱包含考虑的波长的白色超连续谱。 本发明涉及材料样品组成的分析的一般领域，特别涉及激光断层成像原子探针。
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