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    MANUFACTURING OF OPTICAL STRUCTURES BY ELECTROTHERMAL FOCUSSING
    5.
    发明申请
    MANUFACTURING OF OPTICAL STRUCTURES BY ELECTROTHERMAL FOCUSSING 审中-公开
    通过电热聚焦制造光学结构

    公开(公告)号：US20100314723A1

    公开(公告)日：2010-12-16

    申请号：US12747660

    申请日：2008-12-12

    申请人： Christian Schmidt ,  Leander Dittmann

    发明人： Christian Schmidt ,  Leander Dittmann

    IPC分类号： H01L29/02 ,  H01L21/326

    CPC分类号： B26F1/28

    摘要： This invention relates to methods and devices for the production of optical microstructures or domains in dielectric substrates based on electrothermal focussing. More specifically, the invention relates to a method of introducing a change of dielectric and/or optical properties in a region of an electrically insulating or electrically semiconducting substrate, and to substrates produced by such method.

    摘要翻译： 本发明涉及用于在基于电热聚焦的电介质基底中制造光学微结构或结构域的方法和装置。 更具体地，本发明涉及一种在电绝缘或电半导体衬底的区域中引入电介质和/或光学特性的变化的方法以及通过这种方法产生的衬底。

    METHOD OF PRODUCING AN ELECTRICALLY CONDUCTING VIA IN A SUBSTRATE
    6.
    发明申请
    METHOD OF PRODUCING AN ELECTRICALLY CONDUCTING VIA IN A SUBSTRATE 审中-公开
    通过基板生产电导体的方法

    公开(公告)号：US20120138339A1

    公开(公告)日：2012-06-07

    申请号：US13390158

    申请日：2010-08-04

    申请人： Leander Dittmann

    发明人： Leander Dittmann

    IPC分类号： H05K1/00 ,  H01K3/10

    CPC分类号： B26F1/28 ,  H05K3/0017 ,  H05K3/0032 ,  H05K3/0035 ,  H05K3/105 ,  H05K3/4038 ,  H05K2201/0323 ,  H05K2203/105 ,  H05K2203/1115 ,  H05K2203/1136 ,  Y10T29/49165

    摘要： The present invention relates to a method of producing an electrically-conducting via in a substrate and to a substrate produced thereby. The method comprises the steps: a) providing a substrate made of at least one electrically insulating material (1), b) placing said substrate between two electrodes (3, 3′), said two electrodes being connected to a user-controlled voltage source (4), c) appling a voltage to said substrate, d) causing a dielectric breakdown and energy dissipation between said two electrodes through said substrate by locally or globally increasing the electrical conductivity of said substrate, wherein, in step d), a modification of said at least one electrically insulating material into an electrically conducting material occurs, thereby generating an electrically conducting via (6). In particular, in one embodiment, the present invention relates to a substrate, such as a printed circuit board having one or several metal-free electrically conducting vias.

    摘要翻译： 本发明涉及一种在衬底中制造导电通孔的方法及其制造的衬底。 该方法包括以下步骤：a）提供由至少一个电绝缘材料（1）制成的衬底，b）将所述衬底放置在两个电极（3,3'）之间，所述两个电极连接到用户控制的电压源 （4），c）向所述衬底施加电压，d）通过局部地或全面地增加所述衬底的导电性，在所述两个电极之间通过所述衬底造成电介质击穿和能量耗散，其中在步骤d）中， 所述至少一个电绝缘材料变成导电材料，从而产生导电通孔（6）。 特别地，在一个实施例中，本发明涉及一种基板，例如具有一个或多个无金属导电通孔的印刷电路板。

    Sample handling device for and methods of handling a sample
    7.
    发明授权
    Sample handling device for and methods of handling a sample 有权
    样品处理装置和处理样品的方法

    公开(公告)号：US08323588B2

    公开(公告)日：2012-12-04

    申请号：US12598760

    申请日：2008-05-05

    申请人： Olaf Hoyer ,  Leander Dittmann ,  Giso Gessner ,  Andreas Vester

    发明人： Olaf Hoyer ,  Leander Dittmann ,  Giso Gessner ,  Andreas Vester

    IPC分类号： B01L9/00

    CPC分类号： B06B1/16 ,  B01F11/0014

    摘要： A sample handling device (100) for handling a sample, the sample handling device (100) comprising a drive shaft (101) being drivable by a drive unit (102), a base plate (103) mounted to follow a motion of the drive shaft (101) when being driven by the drive unit (102), wherein the base plate (103) is configured to receive a sample carrier block (104) mountable to follow a motion of the base plate (103), and a compensation weight (105, 106) mounted asymmetrically on the drive shaft (101) in a manner to at least partially compensate an unbalanced mass of the sample handling device (100) during the motion.

    摘要翻译： 一种用于处理样品的样品处理装置（100），所述样品处理装置（100）包括可由驱动单元（102）驱动的驱动轴（101），安装成跟随驱动器的运动的基板（103） 轴（101）由驱动单元（102）驱动时，其中基板（103）构造成接收可安装成跟随基板（103）的运动的样品载体块（104），以及补偿重量 （105,106），其以在运动期间至少部分地补偿样品处理装置（100）的不平衡质量的方式不对称地安装在驱动轴（101）上。

    SAMPLE HANDLING DEVICE FOR AND METHODS OF HANDLING A SAMPLE
    8.
    发明申请
    SAMPLE HANDLING DEVICE FOR AND METHODS OF HANDLING A SAMPLE 有权
    样品处理装置和处理样品的方法

    公开(公告)号：US20100218620A1

    公开(公告)日：2010-09-02

    申请号：US12598760

    申请日：2008-05-05

    申请人： Olaf Hoyer ,  Leander Dittmann ,  Giso Gessner ,  Andreas Vester

    发明人： Olaf Hoyer ,  Leander Dittmann ,  Giso Gessner ,  Andreas Vester

    IPC分类号： G01N1/00

    CPC分类号： B06B1/16 ,  B01F11/0014

    摘要： A sample handling device (100) for handling a sample, the sample handling device (100) comprising a drive shaft (101) being drivable by a drive unit (102), a base plate (103) mounted to follow a motion of the drive shaft (101) when being driven by the drive unit (102), wherein the base plate (103) is configured to receive a sample carrier block (104) mountable to follow a motion of the base plate (103), and a compensation weight (105, 106) mounted asymmetrically on the drive shaft (101) in a manner to at least partially compensate an unbalanced mass of the sample handling device (100) during the motion.

    摘要翻译： 一种用于处理样品的样品处理装置（100），所述样品处理装置（100）包括可由驱动单元（102）驱动的驱动轴（101），安装成跟随驱动器的运动的基板（103） 轴（101）由驱动单元（102）驱动时，其中基板（103）构造成接收可安装成跟随基板（103）的运动的样品载体块（104），以及补偿重量 （105,106），其以在运动期间至少部分地补偿样品处理装置（100）的不平衡质量的方式不对称地安装在驱动轴（101）上。