Apparatus for measuring scattered light
    3.
    发明授权
    Apparatus for measuring scattered light 失效
    用于测量散射光的装置

    公开(公告)号:US3640627A

    公开(公告)日:1972-02-08

    申请号:US3640627D

    申请日:1965-03-01

    CPC classification number: G01N21/51

    Abstract: A light-scattering accessory for double-beam spectrophotometers and an improved double-beam, ratio-recording light-scattering spectrophotometer are disclosed. The attachment may be utilized to convert a standard double-beam spectrophotometer into a scattered light-measuring device and consists of an attachment having housed therein a means for directing the sample beam to a sample cell and a detector located on a goniometer rotatable about the cell. The reference beam is passed through an optical attenuator to the detector of the spectrophotometer. Electrical attenuation devices are provided and may comprise either a single attenuating potentiometer connected to each of the detectors or separate attenuators connected to the separate detectors. The attenuators allow measurement of signals over a wide dynamic range by attenuating either the reference or the sample signal and when utilized in combination with the optical attenuator located in the reference beam provide an extremely wide dynamic range for the instrument. Also disclosed is a novel sample cell and beam trap, the beam trap consisting of a piece of black glass having at least one optically flat surface and a black glass rod attached thereto to suspend the glass plate in the beam. The sample cell may be provided with a single optically transmitting window and the beam trap located within the cell for improved results.

    Abstract translation: 公开了一种用于双光束分光光度计的光散射附件和改进的双光束比记录光散射分光光度计。 该附件可以用于将标准双光束分光光度计转换成散射光测量装置,并且由附接装置组成,其中容纳有用于将样品光束引导到样品池的装置和位于可围绕电池旋转的测角器上的检测器 。 参考光束通过光衰减器到达分光光度计的检测器。 提供电衰减装置,并且可以包括连接到每个检测器的单个衰减电位器或连接到单独的检测器的单独的衰减器。 衰减器允许通过衰减参考或采样信号在宽动态范围内测量信号,并且当与位于参考光束中的光衰减器组合使用时,为仪器提供极宽的动态范围。 还公开了一种新颖的样品池和束阱,束阱由具有至少一个光学平面的黑色玻璃片和附着于其上的黑色玻璃棒组成,以将玻璃板悬挂在梁中。 样品池可以设置有单个光学透射窗口,并且位于单元内的光束捕获器用于改善结果。

Patent Agency Ranking