Single Beam Backscatter X-Ray System
    1.
    发明申请
    Single Beam Backscatter X-Ray System 有权
    单光束反向散射X射线系统

    公开(公告)号:US20130287169A1

    公开(公告)日:2013-10-31

    申请号:US13460041

    申请日:2012-04-30

    IPC分类号: G01N23/04 G21K1/02

    摘要: A method and apparatus for inspecting an object is present. Radiation is emitted from a radiation source. A beam is formed from a portion of the radiation emitted by the radiation source using a collimator. The collimator is connected to the radiation source by a bearing system comprising a first structure associated with the radiation source and a second structure connected to the first structure. The second structure is configured to hold the collimator. The second structure of the bearing system is moved using a movement system such that the second structure rotates in one of a plurality of directions substantially about a center point in the radiation source while the radiation source remains stationary relative to the second structure. Rotation of the second structure substantially about the center point in the radiation source changes a direction in which the beam is directed.

    摘要翻译: 存在用于检查物体的方法和装置。 辐射从辐射源发射。 由使用准直器的由辐射源发射的辐射的一部分形成光束。 准直器通过包括与辐射源相关联的第一结构和连接到第一结构的第二结构的轴承系统连接到辐射源。 第二结构被配置为保持准直器。 使用运动系统移动轴承系统的第二结构,使得第二结构在基本上围绕辐射源的中心点的多个方向中的一个方向上旋转,同时辐射源相对于第二结构保持静止。 基本上围绕辐射源中心点的第二结构的旋转改变了光束被引导的方向。

    Methods and systems for enhancing backscatter X-ray foreign object debris detection
    2.
    发明授权
    Methods and systems for enhancing backscatter X-ray foreign object debris detection 有权
    用于增强反向散射X射线异物碎片检测的方法和系统

    公开(公告)号:US08542876B1

    公开(公告)日:2013-09-24

    申请号:US13073084

    申请日:2011-03-28

    IPC分类号: G06K9/00

    CPC分类号: G01N23/203

    摘要: A method for detecting an anomaly associated with a structure is described. The method includes obtaining a baseline scan of the structure, changing at least one condition associated with the structure which is intended to impart a movement of the structure or a movement of objects within the structure, obtaining a secondary scan of the structure, the secondary scan obtained from a same position, with respect to the structure, as the baseline scan, determining any differences between the baseline scan and the secondary scan, and identifying at least one of a foreign object proximate the structure and a structural anomaly associated with the structure based on any differences between the baseline scan and the secondary scan.

    摘要翻译: 描述了用于检测与结构相关联的异常的方法。 所述方法包括获得所述结构的基线扫描,改变与所述结构相关联的至少一个条件,所述条件旨在赋予所述结构的移动或所述结构内的对象的移动,获得所述结构的次扫描,所述次扫描 从相同的位置获得相对于结构的基线扫描,确定基线扫描和次扫描之间的任何差异,并且识别接近结构的异物和与基于结构相关联的结构异常中的至少一个 在基线扫描和辅助扫描之间的任何差异。

    Populating fleet maintenance data using 2D feature recognition
    3.
    发明授权
    Populating fleet maintenance data using 2D feature recognition 有权
    使用2D特征识别来填充车队维护数据

    公开(公告)号:US08116529B2

    公开(公告)日:2012-02-14

    申请号:US12396386

    申请日:2009-03-02

    IPC分类号: G06K9/00

    摘要: Methods and systems for populating fleet maintenance data using 2D feature recognition are disclosed. In one embodiment, a method of determining a configuration of a vehicle includes surveying the vehicle using an imaging device to generate 2D imagery of a configuration of the vehicle. The generated 2D imagery of the configuration may be compared to a survey library of 2D images to identify a part in the configuration. Existing data from legacy systems may be extracted for the part. The part may be added to a bill of materials and used to create a 3D model of the vehicle.

    摘要翻译: 公开了使用2D特征识别来填充车队维护数据的方法和系统。 在一个实施例中,确定车辆的配置的方法包括使用成像装置测量车辆以产生车辆的配置的2D图像。 可以将生成的2D图像与2D图像的调查库进行比较,以识别配置中的一部分。 可以为该部分提取来自遗留系统的现有数据。 该部件可以添加到材料清单中,并用于创建车辆的3D模型。

    RAPID ASSEMBLY AND OPERATION OF AN X-RAY IMAGING SYSTEM
    5.
    发明申请
    RAPID ASSEMBLY AND OPERATION OF AN X-RAY IMAGING SYSTEM 有权
    X射线成像系统的快速组装和操作

    公开(公告)号:US20100327174A1

    公开(公告)日:2010-12-30

    申请号:US12495224

    申请日:2009-06-30

    IPC分类号: G01T1/24

    CPC分类号: G01N23/203

    摘要: Methods and systems for X-ray imaging are disclosed. An X-ray imaging system includes an X-ray tube to generate X-rays and a detector array to capture scattered X-rays. A rotational collimator directs the X-rays at an object under inspection. Rotational mechanisms rotate the X-ray tube and the detector array about a roll axis and a yaw axis to inspect various portions of the object. A track unit mechanism moves the X-ray imaging system linearly along a track unit to further inspect portions of the object.

    摘要翻译: 公开了用于X射线成像的方法和系统。 X射线成像系统包括产生X射线的X射线管和用于捕获散射的X射线的检测器阵列。 旋转准直仪将X射线引导到检查对象。 旋转机构围绕卷轴和偏转轴旋转X射线管和检测器阵列,以检查物体的各个部分。 轨道单元机构沿着轨道单元线性移动X射线成像系统,以进一步检查对象的部分。

    Sealant Analysis System
    8.
    发明申请
    Sealant Analysis System 有权
    密封分析系统

    公开(公告)号:US20130260016A1

    公开(公告)日:2013-10-03

    申请号:US13437355

    申请日:2012-04-02

    CPC分类号: G01B21/08 G01B11/0616

    摘要: A method and apparatus for inspecting sealant on an object. First data is generated for a first geometry of a first surface of the object prior to sealing the object. Second data is generated for a second geometry of a second surface of the object after the sealant has been applied to the object. A difference is identified between the first data and the second data. The difference indicates a thickness of the sealant on the object.

    摘要翻译: 一种用于检查物体上的密封剂的方法和装置。 在密封物体之前,为对象的第一表面的第一几何生成第一数据。 在将密封剂施加到物体之后,对物体的第二表面的第二几何形状生成第二数据。 在第一数据和第二数据之间识别出差异。 差异表示物体上的密封剂的厚度。