MULTI-DIMENSIONAL SPATIAL POSITIONING SYSTEM AND METHOD FOR DISTURBANCE SOURCE

    公开(公告)号:US20220107209A1

    公开(公告)日:2022-04-07

    申请号:US17420578

    申请日:2019-12-30

    IPC分类号: G01D5/353

    摘要: A multi-dimensional spatial positioning system and method for disturbance source. The system includes a distributed-optical fiber sensor, a sensing optical fiber, a coordinate system, a disturbance source to be monitored, a first signal group, and a second signal group. The disturbance source is positioned by combining an array signal processing method with the distributed optical fiber sensor, using different laying manners for the sensing optical fiber and a certain number of flexibly selected sensing units distributed a certain distance from each other along a line, and combining with a special signal processing method, thereby realizing a function of being capable of monitoring multi-dimensional spatial position information of the disturbance source in real time in both short and long distances.

    Method for detecting wavefront aberration for optical imaging system based on grating shearing interferometer

    公开(公告)号:US10969274B2

    公开(公告)日:2021-04-06

    申请号:US16685159

    申请日:2019-11-15

    摘要: Method for detecting wavefront aberration for optical imaging system based on grating shearing interferometer, the grating shearing interferometer system comprising a light source and illumination system, an optical imaging system to be tested, a one-dimensional diffraction grating plate, a two-dimensional diffraction grating plate, a two-dimensional photoelectric sensor, and a computing unit. The one-dimensional and two-dimensional diffraction grating plates are respectively placed on the object plane and the image plane of the optical imaging system to be tested. By collecting interferograms with phase-shifting amounts of 0, π/2, π, 3π/2 and N sets of α, π-α, 2π-α (where, N = 2 ⁢ ( fix ⁡ ( ceil ⁡ ( 1 ⁢ / ⁢ s ) 2 ) + 1 ) , s is the shear ratio of the grating shearing interferometer system), combined with a certain phase retrieval algorithm, the influence of all high-order diffraction beams on the phase retrieval accuracy is eliminated, and finally the detection accuracy of wavefront aberration for the imaging system to be tested is improved.