Fluorine-Containing Sulfonic Acid Salts, Photo-Acid Generator And Resist Composition And Pattern Formation Method Utilizing Same
    4.
    发明申请
    Fluorine-Containing Sulfonic Acid Salts, Photo-Acid Generator And Resist Composition And Pattern Formation Method Utilizing Same 有权
    含氟磺酸盐,光酸发生剂和抗蚀剂组合物和图案形成方法

    公开(公告)号:US20130209938A1

    公开(公告)日:2013-08-15

    申请号:US13879989

    申请日:2011-10-14

    Abstract: A resist composition according to the present invention includes at least a base resin, a photoacid generator and a solvent, wherein the photoacid generator comprises a fluorine-containing sulfonic acid salt of the following general formula (4). In the formula, X independently represents a hydrogen atom or a fluorine atom; n represents an integer of 1 to 6; R1 represents a hydrogen atom, or an alkyl, alkenyl, oxoalkyl, aryl or aralkyl group; any of hydrogen atoms on carbons in R1 may be substituted with a substituent; R2 represents RAO or RBRCN; and A represents a divalent group. This fluorine-containing sulfonic acid salt can serve as a photoacid generator having high solubility in a resist solvent and thus can suitably be used for a resist composition such that the resist composition shows high resolution, wide DOF, small LER and high sensitivity to form a good pattern shape in lithographic processes.

    Abstract translation: 根据本发明的抗蚀剂组合物至少包括基础树脂,光致酸产生剂和溶剂,其中光酸产生剂包含以下通式(4)的含氟磺酸盐。 在该式中,X独立地表示氢原子或氟原子; n表示1〜6的整数, R1表示氢原子,或烷基,烯基,氧代烷基,芳基或芳烷基; R1中碳上的任何氢原子可以被取代基取代; R2代表RAO或RBRCN; A表示二价基团。 该含氟磺酸盐可以用作在抗蚀剂溶剂中具有高溶解度的光致酸产生剂,因此可以适当地用于抗蚀剂组合物,使得抗蚀剂组合物显示出高分辨率,宽DOF,小LER和高灵敏度以形成 光刻工艺中的良好图案形状。

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