Abstract:
A pattern inspection apparatus includes a light source, a detector, and an inspection unit. The light source is configured to emit light toward an inspection target including stacked silicon substrates. The light has a wavelength band that is greater than or equal to 1.2 micrometers and less than or equal to 5.0 micrometers. The detector is configured to detect transmitted light of the inspection target or reflected light of the inspection target out of the light emitted from the light source. The transmitted light is light transmitted through the inspection target. The reflected light is light reflected by the inspection target. The inspection unit is configured to perform pattern inspection on the basis of a detection result obtained by the detector.
Abstract:
A ferroelectric material in which the refractive index change can be induced by irradiation with light at two different wavelengths without performing a reduction treatment or doping impurities. The ferroelectric material of the invention in which the refractive index change is induced by irradiation with light at two different wavelengths is a lithium tantalate single crystal with the composition of Li2O/(Li2OnullTa2O5)null0.4966 to 0.4995. Preferably, the ferroelectric material is a lithium tantalate single crystal with the composition of Li2O/(Li2OnullTa2O5)null0.4974 to 0.4989. Preferably, the infrared absorption coefficient in the nullOHnull stretching mode falls within a range of 0 cmnull1 to 0.15 cmnull1 (0 cmnull1 and 0.15 cmnull1 are included in the range).
Abstract translation:可以通过在两个不同波长的光照射而不进行还原处理或掺杂杂质来诱导折射率变化的铁电材料。 其中通过以两种不同波长的光照射而引起的折射率变化的本发明的铁电体材料是具有Li 2 O /(Li 2 O + Ta 2 O 5)= 0.4966至0.4995的组成的钽酸锂单晶。 铁电体材料优选为Li 2 O /(Li 2 O + Ta 2 O 5)= 0.4974〜0.4989的组成的钽酸锂单晶。 优选地,[OH]拉伸模式中的红外吸收系数落在0cm -1至0.15cm -1(0cm -1和0.15cm -1)的范围内 )。
Abstract:
In one embodiment, the present disclosure provides a deep ultraviolet laser generation device 1000 having a first laser source 100 at a first wavelength between 1.87 μm and 2.1 μm, a second laser source 200 at a second wavelength between 1.53 μm and 1.57 μm, a nonlinear wavelength conversion element 3 for generating near-infrared light 31 at a wavelength between 841 nm and 899 nm through a sum-frequency mixing (SFM) process, a nonlinear wavelength conversion element 4 for generating blue light 41 at a wavelength between 420 nm and 450 nm from the near-infrared light through a second harmonic generation (SHG) process, and a third nonlinear wavelength conversion element 5 for generating deep ultraviolet light 51 at a wavelength between 210 nm and 225 nm from the blue light, through another SHG process. The first laser source may be a thulium-doped laser source or a thulium-doped fiber source, and the second laser source may be a semiconductor laser source, an erbium-doped fiber source, or an erbium/ytterbium-doped fiber source.
Abstract:
Provided is an external resonance-type laser device with high wavelength conversion efficiency in which a nonlinear optical crystal is disposed outside of a resonator. The laser device includes a laser generation device configured to generate high-intensity laser light, a nonlinear optical crystal on which the high-intensity laser light generated by the laser generation device is incident and which is configured to generate a second harmonic wave light, and a different-element-fluxless-grown nonlinear optical crystal on which the second harmonic wave light generated by the nonlinear optical crystal is incident and which is configured to generate a fourth harmonic wave light. In the laser device, the different-element-fluxless-grown nonlinear optical crystal is not damaged even when high-intensity laser light of 100 MW/cm2 or more is incident.
Abstract translation:提供一种非线性光学晶体设置在谐振器外部的具有高波长转换效率的外部谐振型激光器件。 激光装置包括:激光产生装置,其被配置为产生高强度激光;非线性光学晶体,其上由激光产生装置产生的高强度激光入射并且被配置为产生二次谐波光;以及 由非线性光学晶体产生的二次谐波入射并被配置为产生四次谐波光的不同元件无通量生长的非线性光学晶体。 在激光装置中,即使入射了100MW / cm 2以上的高强度激光,也不会损坏不同元件无助熔生长的非线性光学晶体。
Abstract:
Provided are a high-energy and high-powered laser light source and a photoemission electron microscope using the laser light source. The laser light source 2 is intended for use in the photoemission electron microscope for emitting a quasi-continuous wave laser 7 and includes: a first laser light source 100 configured to emit a continuous wave coherent light 100a, an optical resonator 110 including an optical path in which the continuous wave coherent light 100a circulates and including a non-linear optical element 114 disposed on the optical path, and a quasi-continuous wave light source 120 configured to emit a quasi-continuous wave coherent light 120a having a wavelength shorter than that of the continuous wave coherent light 100a and having a near rectangular output waveform. When the quasi-continuous wave coherent light 120a is incident on the non-linear optical element 114 from outside the optical resonator 110 while the continuous wave coherent light 100a is entering the optical resonator 110 to circulate in the optical path, the quasi-continuous wave laser 7 having a wavelength shorter than that of the quasi-continuous wave coherent light 120a is emitted from the non-linear optical element 114.
Abstract:
In one embodiment, the present disclosure provides a deep ultraviolet laser generation device 1000 having a first laser source 100 at a first wavelength between 1.87 μm and 2.1 μm, a second laser source 200 at a second wavelength between 1.53 μm and 1.57 μm, a nonlinear wavelength conversion element 3 for generating near-infrared light 31 at a wavelength between 841 nm and 899 nm through a sum-frequency mixing (SFM) process, a nonlinear wavelength conversion element 4 for generating blue light 41 at a wavelength between 420 nm and 450 nm from the near-infrared light through a second harmonic generation (SHG) process, and a third nonlinear wavelength conversion element 5 for generating deep ultraviolet light 51 at a wavelength between 210 nm and 225 nm from the blue light, through another SHG process. The first laser source may be a thulium-doped laser source or a thulium-doped fiber source, and the second laser source may be a semiconductor laser source, an erbium-doped fiber source, or an erbium/ytterbium-doped fiber source.