Evaluation circuit and evaluation method for the assessment of memory cell states
    2.
    发明申请
    Evaluation circuit and evaluation method for the assessment of memory cell states 失效
    用于评估存储单元状态的评估电路和评估方法

    公开(公告)号:US20070086241A1

    公开(公告)日:2007-04-19

    申请号:US11543306

    申请日:2006-10-04

    IPC分类号: G11C16/04

    摘要: An electronic circuit arrangement includes a storage unit set up for storing at least two analog electrical quantities. A first evaluation circuit is coupled to the storage unit and is set up in such a way that it assesses the at least two analog electrical quantities and provides a first assessment result. A second evaluation circuit is coupled to the storage unit and is set up in such a way that it assesses at least one of the at least two analog electrical quantities with a predetermined threshold value and provides a second assessment result.

    摘要翻译: 电子电路装置包括设置用于存储至少两个模拟电量的存储单元。 第一评估电路耦合到存储单元并且被设置成使得其评估至少两个模拟电量并提供第一评估结果。 第二评估电路耦合到存储单元并且被设置成使得其以预定阈值评估至少两个模拟电量中的至少一个并提供第二评估结果。

    Measuring circuit and reading method for memory cells
    3.
    发明申请
    Measuring circuit and reading method for memory cells 失效
    记忆单元的测量电路和读取方法

    公开(公告)号:US20070086240A1

    公开(公告)日:2007-04-19

    申请号:US11542755

    申请日:2006-10-04

    IPC分类号: G11C16/04

    CPC分类号: G11C16/26 G11C16/0475

    摘要: An electronic circuit arrangement includes at least one memory element in which at least two electrical quantities can be stored. A switching unit is electrically connected to the memory element and has at least one first circuit path and a second circuit path. A storage unit has a first partial storage unit and a second partial storage unit. Each partial storage unit is set up for storing at least one electrical quantity. The switching unit is set up in such a way that it can sequentially pass a first one of the at least two electrical quantities along the first circuit path to the first partial storage unit and a second one of the at least two electrical quantities along the second circuit path to the second partial storage unit.

    摘要翻译: 电子电路装置包括至少一个可存储至少两个电量的存储元件。 开关单元电连接到存储元件并且具有至少一个第一电路路径和第二电路路径。 存储单元具有第一部分存储单元和第二部分存储单元。 每个部分存储单元设置用于存储至少一个电量。 开关单元被设置成使得其可以顺序地将沿着第一电路路径的至少两个电量中的第一个顺序地传递到第一部分存储单元,并且沿着第二电路顺序地通过至少两个电量中的第二个 到第二部分存储单元的电路路径。

    Measuring circuit and reading method for memory cells
    10.
    发明授权
    Measuring circuit and reading method for memory cells 失效
    记忆单元的测量电路和读取方法

    公开(公告)号:US07646647B2

    公开(公告)日:2010-01-12

    申请号:US11542755

    申请日:2006-10-04

    IPC分类号: G11C11/03

    CPC分类号: G11C16/26 G11C16/0475

    摘要: An electronic circuit arrangement includes at least one memory element in which at least two electrical quantities can be stored. A switching unit is electrically connected to the memory element and has at least one first circuit path and a second circuit path. A storage unit has a first partial storage unit and a second partial storage unit. Each partial storage unit is set up for storing at least one electrical quantity. The switching unit is set up in such a way that it can sequentially pass a first one of the at least two electrical quantities along the first circuit path to the first partial storage unit and a second one of the at least two electrical quantities along the second circuit path to the second partial storage unit.

    摘要翻译: 电子电路装置包括至少一个可存储至少两个电量的存储元件。 开关单元电连接到存储元件并且具有至少一个第一电路路径和第二电路路径。 存储单元具有第一部分存储单元和第二部分存储单元。 每个部分存储单元设置用于存储至少一个电量。 开关单元被设置成使得其可以顺序地将沿着第一电路路径的至少两个电量中的第一个顺序地传递到第一部分存储单元,并且沿着第二电路顺序地通过至少两个电量中的第二个 到第二部分存储单元的电路路径。