Process variation tolerant memory design
    1.
    发明授权
    Process variation tolerant memory design 有权
    过程变异容忍存储器设计

    公开(公告)号:US07979832B2

    公开(公告)日:2011-07-12

    申请号:US11873638

    申请日:2007-10-17

    IPC分类号: G06F17/50 G06F9/455

    摘要: Methods and systems for designing process variation tolerant memory are disclosed. A memory circuit is divided into functional blocks. A statistical distribution is calculated for each of the functional blocks. Then, the distributions of each block are combined to verify a credibility of the circuit. The credibility is verified if the circuit meets a predetermined yield.

    摘要翻译: 公开了用于设计过程变化容限存储器的方法和系统。 存储电路分为功能块。 计算每个功能块的统计分布。 然后,组合每个块的分布,以验证电路的可信度。 如果电路满足预定的收益率,则验证可信度。

    Nonlinear pulse-width-modulated clock generation

    公开(公告)号:US10319278B1

    公开(公告)日:2019-06-11

    申请号:US15251920

    申请日:2016-08-30

    IPC分类号: G09G3/20

    摘要: Systems and methods are provided for generating a nonlinear clock signal. Such a signal may be used to drive sub-pixels of an electronic display. The electronic display may include a microdriver that drives at least one sub-pixel based at least in part on an image data signal and an emission clock signal. The image data signal specifies a gray level for driving the sub-pixel and the emission clock signal includes a series of pulses of monotonically increasing pulse widths to enable the microdriver to drive the sub-pixel to emit light for a particular amount of time associated with the gray level. An emission timing controller may generate the emission clock signal.

    Process Variation Tolerant Memory Design
    5.
    发明申请
    Process Variation Tolerant Memory Design 有权
    过程变异容错设计

    公开(公告)号:US20080141190A1

    公开(公告)日:2008-06-12

    申请号:US11873638

    申请日:2007-10-17

    IPC分类号: G06F17/50

    摘要: Methods and systems for designing process variation tolerant memory are disclosed. A memory circuit is divided into functional blocks. A statistical distribution is calculated for each of the functional blocks. Then, the distributions of each block are combined to verify a credibility of the circuit. The credibility is verified if the circuit meets a predetermined yield.

    摘要翻译: 公开了用于设计过程变化容限存储器的方法和系统。 存储电路分为功能块。 计算每个功能块的统计分布。 然后,组合每个块的分布,以验证电路的可信度。 如果电路满足预定的收益率,则验证可信度。