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    'Method for Calibrating Read Sensors of Electromagnetic Read-Write Heads'
    2.
    发明申请
    'Method for Calibrating Read Sensors of Electromagnetic Read-Write Heads' 有权
    “电磁读写头读取传感器校准方法”

    公开(公告)号：US20120283976A1

    公开(公告)日：2012-11-08

    申请号：US13099360

    申请日：2011-05-03

    申请人： David Berman ,  Dylan Joseph Boday ,  Icko E.T. Iben ,  Wayne Isami Imaino ,  Stephen Leonard Schwartz ,  Anna Wanda Topol ,  Daniel James Winarski

    发明人： David Berman ,  Dylan Joseph Boday ,  Icko E.T. Iben ,  Wayne Isami Imaino ,  Stephen Leonard Schwartz ,  Anna Wanda Topol ,  Daniel James Winarski

    IPC分类号： G06F19/00

    CPC分类号： G01R35/00 ,  G01N27/04 ,  G01N27/72 ,  G01N33/53 ,  G01R33/0035 ,  G01R33/1207

    摘要： Described are embodiments to ensure that the equipment utilized to detect antigens is reliable and accurate. If it is determined that a read sensor is degraded a method of calibrating a read sensor of a read head is described. In one embodiment, a method of calibrating a magnetic read sensor includes measuring a first resistance of the magnetic read sensor upon an application of a forward bias current to the magnetic read sensor and measuring a second resistance of the magnetic read sensor upon an application of a reverse bias current to the magnetic read sensor. A calibration constant is determined based on at least the first measured resistance and the second measured resistance. In one embodiment the method further includes storing the determined calibration constant for the magnetic read sensor in memory. Further, in one embodiment the head module having the magnetic read sensor is swept over at least one nanoparticle to obtain a read response of the magnetic read sensor to the nanoparticle. The read response from the magnetic read sensor of the at least one nanoparticle is adjusted based on the determined calibration constant. Calibration of each individual read sensor allows for uniform read responses from each of the read sensors on a read head, and prevents unreliable an inaccurate detection of analytes due to sensor degradation.

    摘要翻译： 描述了确保用于检测抗原的设备是可靠和准确的实施方案。 如果确定读取传感器劣化，则描述校准读取头的读取传感器的方法。 在一个实施例中，一种校准磁性读取传感器的方法包括：在向磁性读取传感器施加正向偏置电流时测量磁性读取传感器的第一个电阻，并测量磁性读取传感器的应用时的第二个电阻 反向偏置电流到磁性读取传感器。 基于至少第一测量电阻和第二测量电阻来确定校准常数。 在一个实施例中，该方法还包括将所确定的磁读取传感器的校准常数存储在存储器中。 此外，在一个实施例中，具有磁读取传感器的头模块扫过至少一个纳米颗粒，以获得磁读取传感器对纳米颗粒的读取响应。 基于所确定的校准常数来调整来自至少一个纳米颗粒的磁读取传感器的读取响应。 每个单独的读取传感器的校准允许来自读取头上的每个读取传感器的均匀的读取响应，并且防止由于传感器劣化而导致的分析物不可靠的检测不可靠。

    FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS
    3.
    发明申请
    FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS 有权
    从倾斜层快速测量X射线衍射

    公开(公告)号：US20120140889A1

    公开(公告)日：2012-06-07

    申请号：US12958420

    申请日：2010-12-02

    申请人： John Wall ,  David Jacques ,  Boris Yokhin ,  Alexander Krokhmal ,  Paul Ryan ,  Richard Bytheway ,  David Berman ,  Matthew Wormington

    发明人： John Wall ,  David Jacques ,  Boris Yokhin ,  Alexander Krokhmal ,  Paul Ryan ,  Richard Bytheway ,  David Berman ,  Matthew Wormington

    IPC分类号： G01N23/207

    CPC分类号： G01N23/207

    摘要： A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having multiple single-crystal layers, including at least a first layer and a second layer that is formed over and tilted relative to the first layer. The X-rays that are diffracted from each of the first and second layers are sensed simultaneously while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including at least a first diffraction peak due to the first layer and a second diffraction peak due to the second layer. The diffraction spectrum is analyzed so as to identify a characteristic of at least the second layer.

    摘要翻译： 一种用于分析的方法包括将X射线的会聚束指向具有多个单晶层的样品的表面，所述样品具有至少第一层和形成在第一层上并相对于第一层倾斜的第二层。 在将感测到的X射线分解为角度的同时，同时检测从第一和第二层中的每一个衍射的X射线，以便产生至少包括由于第一层的第一衍射峰的衍射光谱，以及 由于第二层造成的第二衍射峰。 分析衍射光谱以识别至少第二层的特征。

    MAGNETIC NANOPARTICLE DETECTION ACROSS A MEMBRANE
    4.
    发明申请
    MAGNETIC NANOPARTICLE DETECTION ACROSS A MEMBRANE 有权
    磁性纳米颗粒检测

    公开(公告)号：US20120094852A1

    公开(公告)日：2012-04-19

    申请号：US12905994

    申请日：2010-10-15

    申请人： David Berman ,  Qiu Dai ,  William M. Dyer ,  Wayne I. Imaino ,  Alshakim Nelson

    发明人： David Berman ,  Qiu Dai ,  William M. Dyer ,  Wayne I. Imaino ,  Alshakim Nelson

    IPC分类号： C40B30/04 ,  G01R33/02

    CPC分类号： G01N33/54326

    摘要： Magnetic nanoparticles are detected across a thin membrane that separates the nanoparticles from a magnetic sensor. The technique can be used in a medical context, in which an analyte of interest (present in a test fluid, such as blood) is attached to the membrane. Other compounds are in turn bound to the analyte, with one of these compounds including a magnetic nanoparticle that is then detected by the sensor. In this way, the analyte is detected by detecting the magnetic nanoparticle. By counting the number of magnetic nanoparticles, the concentration of the analyte in the test fluid can be determined.

    摘要翻译： 通过将纳米颗粒与磁性传感器分离的薄膜检测磁性纳米颗粒。 该技术可以在医学背景下使用，其中感兴趣的分析物（存在于测试流体中，例如血液）附着到膜上。 其他化合物又与分析物结合，其中一种化合物包括磁性纳米颗粒，然后由传感器检测。 以这种方式，通过检测磁性纳米颗粒来检测分析物。 通过计数磁性纳米颗粒的数量，可以确定测试流体中分析物的浓度。

    Control of X-ray beam spot size
    8.
    发明授权
    Control of X-ray beam spot size 有权
    控制X射线束斑大小

    公开(公告)号：US07453985B2

    公开(公告)日：2008-11-18

    申请号：US11822231

    申请日：2007-07-03

    申请人： Isaac Mazor ,  David Berman

    发明人： Isaac Mazor ,  David Berman

    IPC分类号： G01N23/201

    CPC分类号： G01N23/20

    摘要： A method for analysis of a sample includes directing a beam of radiation to impinge on a target area on a surface of the sample along a beam axis at a plurality of different elevation angles. For each of the different angles, a respective offset of the beam in a direction transverse to the beam axis is determined. While sensing the radiation scattered from the sample at each of the different elevation angles in succession, a transverse correction is applied to at least one of the beam and the sample in order to compensate for the respective offset at each of the different elevation angles.

    摘要翻译： 用于分析样品的方法包括以多个不同的仰角沿着光束轴引导辐射束照射在样品的表面上的目标区域上。 对于每个不同的角度，确定在横向于光束轴线的方向上的光束的相应偏移。 在连续地感测在每个不同仰角处从样品散射的辐射的同时，对波束和样本中的至少一个施加横向校正，以补偿每个不同仰角处的相应偏移。

    System and method for deconvolution of multiple data tracks
    9.
    发明授权
    System and method for deconvolution of multiple data tracks 失效
    多个数据轨迹的去卷积系统和方法

    公开(公告)号：US07428120B2

    公开(公告)日：2008-09-23

    申请号：US11694091

    申请日：2007-03-30

    申请人： David Berman ,  W. Stanley Czarnecki ,  Icko E. T. Iben ,  Wayne Isami Imaino

    发明人： David Berman ,  W. Stanley Czarnecki ,  Icko E. T. Iben ,  Wayne Isami Imaino

    IPC分类号： G11B5/58

    CPC分类号： G11B5/00826 ,  G11B5/584

    摘要： A system and method for reading a magnetic medium having a data band thereon, the data band comprising a plurality of written data tracks and in some embodiments at least one alignment band. The system in one embodiment includes a plurality of adjacent readers for simultaneously reading the data tracks, at least some of the readers overlapping multiple data tracks. At least one reader is also present for reading the at least one alignment band. A mechanism determines a fractional overlap of each reader on the data tracks based on readback of the alignment band. A mechanism extracts data from readback of the data tracks based at least in part on the fractional overlap.

    摘要翻译： 一种用于读取其上具有数据带的磁介质的系统和方法，所述数据带包括多个写入的数据轨道，并且在一些实施例中为至少一个对准带。 在一个实施例中的系统包括用于同时读取数据轨道的多个相邻读取器，至少一些读取器重叠多个数据轨道。 还存在至少一个读取器用于读取至少一个对准带。 一种机制基于对准带的回读来确定每个读取器在数据轨道上的分数重叠。 一种机制至少部分地基于分数重叠从数据轨道的回读中提取数据。

    Control of X-ray beam spot size
    10.
    发明授权
    Control of X-ray beam spot size 有权

    公开(公告)号：US07406153B2

    公开(公告)日：2008-07-29

    申请号：US11503979

    申请日：2006-08-15

    申请人： David Berman

    发明人： David Berman

    IPC分类号： G01N23/201

    CPC分类号： G01N23/20

    摘要： Apparatus for analysis of a sample includes a radiation source, which is configured to direct a beam of radiation along a beam axis to impinge on a target area on a surface of the sample. A detector assembly is configured to sense the radiation scattered from the sample. A beam control assembly includes a beam blocker, which has a lower side adjoining the surface of the sample, and which contains front and rear slits perpendicular to the lower side that together define a beam plane that contains the beam axis and passes through the target area. The front slit is located between the radiation source and the target area, and the rear slit is located between the target area and the detector assembly.