Abstract:
A method for manufacturing a probe structure of a probe card is disclosed. In accordance with the present invention, a portion of a substrate exposed through a crossing region of one more probe beam regions defined by a first mask layer pattern and a windows defined by a second mask layer pattern are etched to form one or more self-aligning probe tip regions, thereby preventing a misalignment of the one or more probe tip regions.
Abstract:
Electrostatic chucks and methods of manufacturing the same are provided herein. In some embodiments, an electrostatic chuck comprises an electrically conductive body having one or more channels formed in an upper surface thereof; a plate positioned within the one or more channels to define one or more plenums between the body and the plate, wherein the surfaces of the plenum are anodized; one or more fluid passages disposed in the plate and fluidly coupling the one or more plenums to the upper surface of the body, wherein the surfaces of the fluid passages are electrically insulated; and a dielectric layer disposed over the upper surface of the body and the plate, wherein the dielectric layer forms a support surface for a substrate to be disposed thereon.
Abstract:
Electrostatic chucks and methods of manufacturing the same are provided herein. In some embodiments, an electrostatic chuck comprises an electrically conductive body having one or more channels formed in an upper surface thereof; a plate positioned within the one or more channels to define one or more plenums between the body and the plate, wherein the surfaces of the plenum are anodized; one or more fluid passages disposed in the plate and fluidly coupling the one or more plenums to the upper surface of the body, wherein the surfaces of the fluid passages are electrically insulated; and a dielectric layer disposed over the upper surface of the body and the plate, wherein the dielectric layer forms a support surface for a substrate to be disposed thereon.
Abstract:
A method for manufacturing a probe structure is disclosed. In accordance with the method, two semiconductor substrates having different crystal directions are bonded and selectively etched utilizing an etch selectivity due to the different crystal directions to form a probe tip region and a probe beam region. A cantilever structure for a probe card is formed by filling the probe tip region and the probe beam region with a conductive material.
Abstract:
A method for manufacturing a probe structure of a probe card is disclosed. In accordance with the present invention, a portion of a substrate exposed through a crossing region of one more probe beam regions defined by a first mask layer pattern and a windows defined by a second mask layer pattern are etched to form one or more self-aligning probe tip regions, thereby preventing a misalignment of the one or more probe tip regions.
Abstract:
An information-displaying system is provided for use with a vehicle head-up display including a liquid crystal panel for displaying drive information image, a backlight unit for irradiating light toward the liquid crystal panel, an optical system for enlarging or reducing the drive information image displayed on the liquid crystal panel, and a reflection mirror for reflecting the drive information image projected by the optical system toward a windshield of a motor vehicle. The information-displaying system includes a navigation information providing unit for providing navigation information on a current vehicle position, a road map and an optimum route to destination, a traffic information providing unit for providing traffic information on a real time basis, and a control unit for controlling the liquid crystal panel to display the navigation information and the traffic information provided by the navigation information providing unit and the traffic information providing unit.
Abstract:
An optical system is provided for use in a vehicle head-up display including a display panel for displaying drive information image, a backlight unit for irradiating light toward the display panel and an optical system for adjusting the size and focal distance of the drive information image projected from the display panel toward a windshield of a motor vehicle. The optical system includes a pre-lens reflection mirror array for reflecting the drive information image projected from the display panel to travel along a first roundabout path, a lens array for adjusting the size and focal distance of the drive information image reflected by the pre-lens reflection mirror array, and a post-lens reflection mirror array for reflecting the drive information image coming from the display panel toward the windshield to travel along a second roundabout path.
Abstract:
An optical system is provided for use in a vehicle head-up display including a display panel for displaying drive information image, a backlight unit for irradiating light toward the display panel and an optical system for adjusting the size and focal distance of the drive information image projected from the display panel toward a windshield of a motor vehicle. The optical system includes a pre-lens reflection mirror array for reflecting the drive information image projected from the display panel to travel along a first roundabout path, a lens array for adjusting the size and focal distance of the drive information image reflected by the pre-lens reflection mirror array, and a post-lens reflection mirror array for reflecting the drive information image coming from the display panel toward the windshield to travel along a second roundabout path.
Abstract:
A method for manufacturing a probe structure is wherein a disclosed. In accordance with method, two semiconductor substrates having different crystal directions are bonded and selectively etched utilizing an etch selectivity due to the different crystal directions to form a probe tip region and a probe beam region. A cantilever structure for a probe card is formed by filling the probe tip region and the probe beam region with a conductive material.