公开(公告)号：US07592565B2

公开(公告)日：2009-09-22

申请号：US10549418

申请日：2004-03-16

申请人： Oug-Ki Lee ,  Jung-Hoon Lee

发明人： Oug-Ki Lee ,  Jung-Hoon Lee

IPC分类号： B23K26/00

CPC分类号： G01R3/00 ,  B23K26/0861 ,  G01R1/06711 ,  G01R1/07342 ,  G01R31/2887

摘要： Disclosed herein are a probe positioning and bonding device and a probe bonding method, and more particularly a probe positioning and bonding device used to fix probes to prescribed positions on a substrate so that a probe card used for semiconductor integrated circuit testing equipment is manufactured, and a probe bonding method using the same. The probe positioning and bonding device comprises a stage unit disposed on a working table, a microscope disposed above the stage unit while being supported by means of a first supporting member disposed on the working table, a probe fixing unit disposed above the stage unit and below the microscope while being supported by means of a second supporting member disposed on the working table, and a light source unit supported by means of a third supporting member disposed on the working table. The light source unit is disposed toward the upper part of the stage unit.

摘要翻译： 这里公开了探针定位和接合装置和探针接合方法，更具体地，涉及用于将探针固定到基板上的规定位置的探针定位和接合装置，从而制造用于半导体集成电路检测设备的探针卡，以及 使用其的探针接合方法。 探针定位和接合装置包括设置在工作台上的台单元，设置在平台单元上方的显微镜，同时由设置在工作台上的第一支撑构件支撑;探针固定单元，设置在平台单元上方和下方 显微镜同时由设置在工作台上的第二支撑构件支撑，以及由设置在工作台上的第三支撑构件支撑的光源单元。 光源单元朝向台单元的上部设置。

公开(公告)号：US07579855B2

公开(公告)日：2009-08-25

申请号：US11352658

申请日：2006-02-13

申请人： Oug-Ki Lee ,  Jung Hoon Lee ,  Seong Hoon Jeong

发明人： Oug-Ki Lee ,  Jung Hoon Lee ,  Seong Hoon Jeong

IPC分类号： G01R31/02

CPC分类号： G01R3/00 ,  G01R1/06727 ,  G01R1/06733 ,  G01R1/07342 ,  H05K3/4092

摘要： Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In representative embodiments, a part of the beam portion is bent, e.g., such that the beam portion is zigzagged one or more times. A projection may be formed around a proximal end of the tip portion.

摘要翻译： 公开了用于测试电子设备的电接触元件。 电接触元件具有梁部分和附接到梁部分的端部的尖端部分。 在代表性的实施例中，梁部分的一部分被弯曲，例如使得梁部分曲折地一次或多次。 突起可以围绕尖端部分的近端形成。

公开(公告)号：US20060171425A1

公开(公告)日：2006-08-03

申请号：US10549335

申请日：2004-03-16

申请人： Oug-Ki Lee ,  Jung-Hoon Lee

发明人： Oug-Ki Lee ,  Jung-Hoon Lee

IPC分类号： H01S3/00

CPC分类号： G01R1/06744 ,  G01R1/06711 ,  G01R1/07307 ,  G01R1/07342 ,  G01R3/00

摘要： Disclosed herein are a probe and a method of making the same, and more particularly to a probe having a minute pitch, with which a probe card corresponding to arrangement of pads formed with a massed shape or other various shapes on a wafer is made, and a method of making the same. The probe having a prescribed thickness and formed in the shape of a flat plate. The probe comprises a body part bent at the middle thereof so that the body part is elastically tensioned or compressed when a tension force or a compression force is applied to the body part at the upper and lower ends thereof, a connection part integrally formed with the lower end of the body part, the connection part being fixed to a substrate, and a tip part integrally formed with the upper end of the body part, the tip part contacting a pad of an element.

摘要翻译： 本文公开了一种探针及其制造方法，更具体地说，涉及一种具有微小间距的探针，其中形成了与晶片上形成有组合形状或其它各种形状的焊盘布置对应的探针卡，以及 制作相同的方法。 探针具有规定的厚度并形成为平板状。 探头包括在其中间弯曲的主体部分，使得当在其上端和下端处对主体部分施加张力或压缩力时，主体部分被弹性张紧或压缩;与主体部分的上端和下端一体形成的连接部， 主体部分的下端，连接部分固定到基底，以及与主体部分的上端一体形成的尖端部分，尖端部分接触元件的垫。

公开(公告)号：US07975380B2

公开(公告)日：2011-07-12

申请号：US12091742

申请日：2006-10-19

申请人： Oug-Ki Lee ,  Kyu-Hyun Shin ,  Seong-Hoon Jeong

发明人： Oug-Ki Lee ,  Kyu-Hyun Shin ,  Seong-Hoon Jeong

IPC分类号： H01R9/00 ,  H05K3/00

CPC分类号： H05K3/3473 ,  G01R1/07342 ,  G01R3/00 ,  H05K3/243 ,  H05K3/341 ,  H05K2201/09745 ,  H05K2203/167 ,  Y02P70/613 ,  Y10T29/49147 ,  Y10T29/49149 ,  Y10T29/49156 ,  Y10T29/49162

摘要： Provided is a probe card and method of fabricating the same. This method comprises forming soldering bumpers electrically connected to conductive patterns on a substrate, forming probes connected to the conductive patterns and supported by the soldering bumpers, and then melting the soldering bumpers to fixing the probes to the substrate. Forming the soldering bumpers includes a step of forming the soldering bumpers in the same pattern and size by means of a photolithography process.

摘要翻译： 提供了一种探针卡及其制造方法。 该方法包括形成电连接到衬底上的导电图案的焊接保险杠，形成连接到导电图案并由焊接保险杠支撑的探针，然后熔化焊接保险杠以将探针固定到衬底。 形成焊接保险杠包括通过光刻工艺以相同的图案和尺寸形成焊接保险杠的步骤。

公开(公告)号：US20090184727A1

公开(公告)日：2009-07-23

申请号：US12223967

申请日：2007-02-13

申请人： Ki-Joon Kim ,  Yong-Hwi Jo ,  Dong Yeul Choi

发明人： Ki-Joon Kim ,  Yong-Hwi Jo ,  Dong Yeul Choi

IPC分类号： G01R31/02 ,  H05K3/10

CPC分类号： G01R1/07378 ,  G01R31/2889 ,  Y10T29/49155

摘要： Provided is a probe card of a semiconductor testing apparatus, including a printed circuit board to which an electrical signal is applied from external, a space transformer having a plurality of probes directly contacting with a test object, and interconnectors connecting the printed circuit board to the probes of the space transformer. The space transformer includes substrate pieces which the probes are installed on one sides of, and a combination member joining and unifying the substrate pieces together so as to form a large-area substrate with the substrate pieces on the same plane. This probe card is advantageous to improving flatness even with a large area, as well as testing semiconductor chips formed on a wafer in a lump.

摘要翻译： 提供一种半导体测试装置的探针卡，包括从外部施加电信号的印刷电路板，具有与测试对象直接接触的多个探针的空间变压器以及将印刷电路板连接到测试对象的互连器 空间变压器探头。 空间变压器包括探针安装在其一侧的基片和将基片拼接在一起的组合件，以便形成具有基片的同一平面上的大面积基片。 该探针卡有利于即使在大面积上提高平坦度，也有利于测试在一个晶片上形成的半导体芯片。

公开(公告)号：US07511524B1

公开(公告)日：2009-03-31

申请号：US12103934

申请日：2008-04-16

申请人： Oug-Ki Lee

发明人： Oug-Ki Lee

IPC分类号： G01R31/02

CPC分类号： G01R1/06727 ,  G01R1/06738 ,  G01R1/07342

摘要： The present invention relates to a contact tip structure of a connecting element designed for electric testing of electronic components. The connecting element comprises a fixing post coupled to a first electronic component; a beam extending away from said fixing post; a base coupled at one end of the said beam; and a contact tip extending vertically from the bottom surface of the said base. The beam includes an elastic region and an inelastic region extending at a shorter distance than the elastic region. The base vertically extends from the inelastic region in a certain distance and the horizontally extended length (L) of the elastic region of the beam and the vertically extended length (D) of the base are determined such that the contact tip is horizontally extended at a pre-determined distance according to the following formula: Dsin θ+L(cos θ−1)(θ means an angle of elastic deformation of the beam).

摘要翻译： 本发明涉及一种设计用于电子部件的电气测试的连接元件的接触尖端结构。 连接元件包括耦合到第一电子元件的固定柱; 远离所述固定柱的梁; 在所述梁的一端连接的基座; 以及从所述基座的底表面垂直延伸的接触尖端。 梁包括弹性区域和在比弹性区域更短的距离处延伸的非弹性区域。 基座从非弹性区域垂直延伸一定距离，并且确定梁的弹性区域和基部的垂直延伸长度（D）的水平延伸长度（L），使得接触尖端在 根据以下公式确定的距离：<？in-line-formula description =“在线公式”end =“lead”？>Dsinθ+ L（cosθ-1）（θ表示弹性变形的角度 的光束）。<？in-line-formula description =“In-line Formulas”end =“tail”？>

公开(公告)号：US07466833B2

公开(公告)日：2008-12-16

申请号：US10529656

申请日：2003-07-24

申请人： Oug-Ki Lee ,  Joo-Bae Kim

发明人： Oug-Ki Lee ,  Joo-Bae Kim

IPC分类号： H04R25/00

CPC分类号： H04M1/03 ,  H04R9/06 ,  H04R2400/03 ,  H04R2460/13

摘要： In a bone conduction speaker, a body has a shape of a cylinder, and a vibrating plate is inserted to a mastoid to close an upper opening portion of the body. An auxiliary vibrating plate is inserted to the mastoid under the vibrating plate. A vibrating coil is attached on a lower side of the auxiliary vibrating plate. A speaker plate is fixed at an inner central portion of the body, and a ring type magnet is fixed on the speaker plate. An edge portion of a yoke is fixed on the ring type magnet and a central portion of the yoke has a protrusion which protrudes in the inside direction of a central hole of the speaker plate. An acoustic vibrating plate is fixed at a lower portion of the body, and an acoustic coil is fixed on the acoustic vibrating plate.

摘要翻译： 在骨传导扬声器中，身体具有圆柱体的形状，并且将振动板插入乳突以闭合身体的上部开口部分。 辅助振动板插入到振动板下方的乳突下。 振动线圈安装在辅助振动板的下侧。 扬声器板固定在主体的内部中心部分，并且环形磁体固定在扬声器板上。 磁轭的边缘部分固定在环形磁体上，磁轭的中心部分具有在扬声器板的中心孔的内部方向上突出的突起。 声学振动板固定在本体的下部，声学线圈固定在声学振动板上。

公开(公告)号：US08117740B2

公开(公告)日：2012-02-21

申请号：US11996413

申请日：2006-07-24

申请人： Ki-Joon Kim ,  Yong-Hwi Jo ,  Sung-Young Oh ,  Jun-Tae Hwang

发明人： Ki-Joon Kim ,  Yong-Hwi Jo ,  Sung-Young Oh ,  Jun-Tae Hwang

IPC分类号： G01R3/00 ,  B23P19/00

CPC分类号： G01R3/00 ,  G01R1/07342 ,  Y10T29/49133 ,  Y10T29/49137 ,  Y10T29/49147 ,  Y10T29/49222 ,  Y10T29/53004 ,  Y10T29/53039 ,  Y10T29/53061 ,  Y10T29/53174 ,  Y10T29/53191 ,  Y10T29/53265

摘要： In a method of manufacturing a probe card, a plurality of probe modules, including a sacrificial substrate and probes on the sacrificial substrate, is prepared. The probe modules are mutually aligned to form a probe module assembly having the aligned probe modules and a desired size. The probe module assembly is then attached to a probe substrate. Thus, the probe card having a large size may be manufactured.

摘要翻译： 在制造探针卡的方法中，准备了包括牺牲衬底和牺牲衬底上的探针的多个探针模块。 探针模块相互对准以形成具有对准的探针模块和所需尺寸的探针模块组件。 然后将探针模块组件附接到探针衬底。 因此，可以制造具有大尺寸的探针卡。

公开(公告)号：US08012331B2

公开(公告)日：2011-09-06

申请号：US11876180

申请日：2007-10-22

申请人： Oug-Ki Lee ,  Jung-Hoon Lee

发明人： Oug-Ki Lee ,  Jung-Hoon Lee

IPC分类号： C25D5/02

CPC分类号： G01R1/06744 ,  G01R1/06711 ,  G01R1/07307 ,  G01R1/07342 ,  G01R3/00

摘要： Disclosed herein are a probe and a method of making the same, and more particularly to a probe having a minute pitch, with which a probe card corresponding to arrangement of pads formed with a massed shape or other various shapes on a wafer is made, and a method of making the same. The probe having a prescribed thickness and formed in the shape of a flat plate. The probe comprises a body part bent at the middle thereof so that the body part is elastically tensioned or compressed when a tension force or a compression force is applied to the body part at the upper and lower ends thereof, a connection part integrally formed with the lower end of the body part, the connection part being fixed to a substrate, and a tip part integrally formed with the upper end of the body part, the tip part contacting a pad of an element.

摘要翻译： 本文公开了一种探针及其制造方法，更具体地说，涉及一种具有微小间距的探针，其中形成了与晶片上形成有组合形状或其它各种形状的焊盘布置对应的探针卡，以及 制作相同的方法。 探针具有规定的厚度并形成为平板状。 探头包括在其中间弯曲的主体部分，使得当在其上端和下端处对主体部分施加张力或压缩力时，主体部分被弹性张紧或压缩;与主体部分的上端和下端一体形成的连接部， 主体部分的下端，连接部分固定到基底，以及与主体部分的上端一体形成的尖端部分，尖端部分接触元件的垫。

公开(公告)号：US07859280B2

公开(公告)日：2010-12-28

申请号：US11921336

申请日：2006-06-01

申请人： Han-Moo Lee

发明人： Han-Moo Lee

IPC分类号： G01R31/02

CPC分类号： G01R1/07342

摘要： A probe card is disclosed that is easily assembled and maintained and configured to prevent the controlled level of a space transformer from changing due to various causes such as a thermal deformation during a test process. The probe card includes an installation member where probe tips are provided and a printed circuit board (PCB) disposed on the installation member. A reinforcement member is fixed to a top surface of the PCB, and a contact member is disposed between the PCB and the reinforcement member. The contact member and the installation member are fixed by a connect member inserted into an insert hole formed at the PCB, and a control bolt provided for controlling the level of the installation member is inserted into control holes formed at the installation member, the PCB, and the reinforcement member sequentially in a bottom-to-top direction. Due to a convex-up top surface of the contact member, the contact member continues to contact the reinforcement member even though the installation member and the contact member are inclined while controlling the level of the installation member.

摘要翻译： 公开了一种易于组装和维护和构造的探针卡，以防止由于各种原因（例如在测试过程中的热变形）空间变压器的受控水平而变化。 探针卡包括设置探针尖端的安装构件和设置在安装构件上的印刷电路板（PCB）。 加强构件固定到PCB的顶表面，并且接触构件设置在PCB和加强构件之间。 接触构件和安装构件通过插入到形成在PCB上的插入孔中的连接构件固定，并且用于控制安装构件的高度的控制螺栓插入到安装构件，PCB上形成的控制孔中， 和加强构件顺序地从底部到顶部的方向。 由于接触构件的凸起的上表面，即使安装构件和接触构件在控制安装构件的水平的同时倾斜，接触构件继续接触加强构件。