公开(公告)号：US11054307B2

公开(公告)日：2021-07-06

申请号：US16733733

申请日：2020-01-03

Applicant: Spectro Analytical Instruments GmbH

Inventor： Heinz-Gerd Joosten ,  Wolfram Bohle ,  Rolf Friedrich Frueke

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/18

Abstract: A spectrometer may include a radiation source having a spark generator, an entrance slit, a dispersive element and a plurality of detectors, and a rotatable sector shutter having an axis of rotation and a trigger unit optically coupled to the sector diaphragm. The axis of rotation of the sector shutter is non-parallel to a connecting line between the source and the entrance slit.

公开(公告)号：US20210172799A1

公开(公告)日：2021-06-10

申请号：US16613717

申请日：2018-05-24

Applicant: The Penn State Research Foundation

Inventor： Adam Rimshaw ,  Christopher Grieco ,  Eric Kennehan ,  John B. Asbury

IPC: G01J3/42 ,  G01J3/02 ,  G01J3/18 ,  G01N21/31 ,  G01R13/02

Abstract: A high-sensitivity nanosecond to millisecond transient absorption spectrometer for measurements of miniscule signals under low excitation intensities includes an excitation source generating a frequency greater than 100 Hz, pulsewidth less than 5 ns excitation pulse for exciting a light absorbing sample, a probe light source for generating a photon flux probe light beam producing an average irradiance greater than 1 μW m−2 nm−1 for measuring the transient absorption spectrum of the sample before and after excitation by the excitation source, a DC-coupled detector capable of measuring light for enabling synchronous measurement of both the transmission of the probe light beam and the change in transmission of the probe light beam between a signal with the excitation pulse present and a signal in the absence of the excitation pulse, and a digital oscilloscope with a trigger rearm time capable of collecting every trigger event at high frequencies including 1 MHz, for enabling sequential noise subtraction protocols.

公开(公告)号：US11029206B2

公开(公告)日：2021-06-08

申请号：US16670976

申请日：2019-10-31

Applicant: Applied Materials, Inc.

Inventor： Jinxin Fu ,  Rutger Meyer Timmerman Thijssen ,  Ludovic Godet

IPC: G01J3/28 ,  G06F3/03 ,  G02B6/12 ,  G01J3/18 ,  H01P1/16 ,  G06T19/00

Abstract: Embodiments described herein relate to apparatus for measuring and characterizing performance of augmented and virtual reality waveguide structures utilizing glass substrates. The waveguide performance measuring systems generally include a light source configured to direct light towards an incoupling grating area on waveguide and one or more light detectors configured to collect light from an outcoupling grating area on a second side of the waveguide. The light source and one or more light detectors are disposed on one or more adjustable stages positioned about the waveguide. In certain embodiments, the one or more adjustable stages are configured to move in a linear fashion or revolve and/or rotate around the waveguide in an orbital motion.

公开(公告)号：US11022493B2

公开(公告)日：2021-06-01

申请号：US16600936

申请日：2019-10-14

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takafumi Yokino ,  Katsumi Shibayama

IPC: G01J3/18 ,  G01J3/02 ,  G01J3/36 ,  G01J3/28

Abstract: A spectrometer includes a light detection element having a substrate made of a semiconductor material, a light passing part provided in the substrate, and a light detection part put in the substrate, a support having a base wall part opposing the light detection element, and side wall parts integrally formed with the base wall part, the light detection element being fixed to the side wall parts, the support being provided with a wiring electrically connected to the light detection part, and a dispersive part provided on a surface of the base wall part on a side of a space. An end part of the wiring is connected to a terminal of the light detection element. An end part of the wiring is positioned on a surface in the base wall part on an opposite side from the side of the space.

公开(公告)号：US11002603B2

公开(公告)日：2021-05-11

申请号：US16774318

申请日：2020-01-28

Applicant: Thorlabs, Inc.

Inventor： Ryan Joseph Priore

IPC: G01J3/18

Abstract: An interlaced diffraction grating system and process are disclosed. The interlaced grating system includes an optical dispersive grating with alternating bands of unique grating densities wherein the number of unique grating densities is greater than or equal to two. The optical dispersive grating may be reflective or transmissive, and it may be fabricated by mechanical ruling, holography, or reactive ion etching of a binary mask. An interlaced grating allows additional utility for both point spectroscopic detection as well as hyperspectral imaging.

公开(公告)号：US10996109B1

公开(公告)日：2021-05-04

申请号：US16655983

申请日：2019-10-17

Applicant: LightMachinery Inc.

Inventor： Hubert Jean-Ruel ,  Jesse Dean ,  John H. Hunter ,  Ian J. Miller ,  Edward S. Williams

IPC: G01J3/26 ,  G01J3/02 ,  G01J3/18 ,  G02B5/20 ,  G01J3/14

Abstract: Conventional etalon based spectrometers have either a limited range of evaluation wavelengths or require continuous scanning of the etalon. Conventional etalon based spectrometers also have limited contrast between the peak transmission of a frequency on resonance and the minimum transmission of a frequency off resonance. An improved optical spectrometer includes a cylindrical lens configured to converge the input beam of light in only one direction, whereby the input beam of light is focused along a focal line. Accordingly, a first etalon receives the input beam of light, and transmits a series of sub-beams, each sub-beam transmitted at a different angle from the normal, and each sub-beam including multiple frequencies based on the FSR, whereby a secondary dispersive element receives each sub-beam, and disperses each sub-beam into individual frequencies. Ideally, a second etalon receives and transmits the sub-beams with increased contrast, and a second thickness of the second etalon is substantially identical to the first thickness of the first etalon.

公开(公告)号：US20210072159A1

公开(公告)日：2021-03-11

申请号：US17053093

申请日：2019-05-09

Applicant: NATIONAL RESEARCH COUNCIL OF CANADA

Inventor： Paul BOUCHARD ,  Mohamad SABSABI ,  Alain BLOUIN ,  Christian PADIOLEAU

IPC: G01N21/71 ,  G01J3/02 ,  G01J3/443 ,  G01J3/18 ,  G01J3/28 ,  G01J3/36

Abstract: A LIBS system to detect constituent elements of interest within a sample from plasma light resulting from irradiation of this sample is presented. The LIBS system has a hybrid configuration which provides both a low-resolution spectrum of the plasma light covering a broad spectral range, and a high-resolution spectrum of the same plasma light over a narrow spectral range centered on a spectral line or feature of a constituent element of interest of the sample. In some implementations, the LIBS system has a portable design and can perform onsite sample analyses.

公开(公告)号：US20210055224A1

公开(公告)日：2021-02-25

申请号：US16949572

申请日：2020-11-04

Applicant: Illumina, Inc.

Inventor： John Gerhardt Earney ,  Joseph Francis Pinto ,  M. Shane Bowen ,  Michael S. Graige ,  Arthur Pitera ,  Bala Murali K. Venkatesan ,  Dajun Yuan

IPC: G01N21/64 ,  G01J3/02 ,  G01N21/27 ,  G01J3/18 ,  G01J3/44

Abstract: An inspection apparatus is provided that comprises an optical target including a solid host material and a fluorescing material embedded in the solid host material. The solid host material has a predetermined phonon energy HOSTPE. The fluorescing material exhibits a select ground energy level and a target excitation (TE) energy level separated from the ground energy level by a first energy gap corresponding to a fluorescence emission wavelength of interest. The fluorescing material has a next lower lying (NLL) energy level relative to the TE energy level. The NLL energy level is spaced a second energy gap FMEG2 below the TE energy level, wherein a ratio of the FMEG2/HOSTPE is three or more.

公开(公告)号：US10928248B2

公开(公告)日：2021-02-23

申请号：US16288752

申请日：2019-02-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jineun Kim ,  Younggeun Roh ,  Yeonsang Park ,  Hyochul Kim ,  Moonil Jung

IPC: G01J3/18 ,  G01J3/45 ,  G02B5/28 ,  G01J3/26 ,  G02B5/20 ,  G01J3/28 ,  G01J3/02 ,  H01L27/146 ,  H01L31/0216 ,  G02F1/21 ,  G01J3/12

Abstract: A light filter and a spectrometer including the light filter are disclosed. The light filter includes a plurality of filter units having different resonance wavelengths, wherein each of the plurality of filter units includes a cavity layer configured to output light of constructive interference, a Bragg reflection layer provided on a first surface of the cavity layer, and a pattern reflection layer provided on a second surface of the cavity layer opposite to the first surface and configured to cause guided mode resonance of light incident on the pattern reflection layer, the pattern reflection layer including a plurality of reflection structures that are periodically arranged.

公开(公告)号：US20210033466A1

公开(公告)日：2021-02-04

申请号：US16778164

申请日：2020-01-31

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyochul KIM ,  Younggeun Roh ,  Yeongsang Park

IPC: G01J3/51 ,  G01J3/18 ,  G02B5/18 ,  G02B5/20

Abstract: Provided is an optical filter including a plurality of bandpass filters having center wavelengths of light that are different from one another, wherein each of the plurality of bandpass filters includes a cavity layer, a first Bragg reflective layer provided on an upper surface of the cavity layer, and a second Bragg reflective layer provided on a lower surface of the cavity layer opposite to the upper surface, wherein the cavity layer has a thickness greater than A/n, where A is a center wavelength of light of each of the bandpass filters and n is an effective refractive index of the cavity layer, and wherein each of the first Bragg reflective layer and the second Bragg reflective layer includes three or more material layers having different refractive indices from one another.