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公开(公告)号：US20150198659A1
公开(公告)日：2015-07-16
申请号：US14669783
申请日：2015-03-26
Applicant: CHROMA ATE INC.
Inventor： XIN-YI WU , JUI-CHE CHOU , MENG-KUNG LU , CHIN-YI OU YANG
CPC classification number: G01R31/2877 , G01R31/2874 , H05K7/20136 , H05K7/20254
Abstract: A radiator module system for automatic test equipment, including a test arm and a closed-loop circulating cooling device disposed on the test arm. The test arm includes a test head, and an internal channel is formed within and passing through the test head. The closed-loop circulating cooling device includes an inlet and an outlet, respectively connected to the internal channel; a conduit connecting the inlet and the outlet, such that the conduit and the internal channel form a closed-loop circulating channel in which a working fluid flows; a cooling device in contact with the conduit, configured to perform heat dissipation to the working fluid flowing within the conduit; and a driving source configured to drive the working fluid to flow within the closed-loop circulating channel. The working fluid is driven by the driving source to flow within the closed-loop circulating channel to perform heat dissipation.
Abstract translation: 一种用于自动测试设备的散热器模块系统，包括设置在测试臂上的测试臂和闭环循环冷却装置。 测试臂包括测试头，内部通道形成在测试头内并通过测试头。 闭环循环冷却装置包括分别连接到内部通道的入口和出口; 连接入口和出口的管道，使得管道和内部通道形成工作流体流动的闭环循环通道; 与导管接触的冷却装置，被配置为对在管道内流动的工作流体进行散热; 以及构造成驱动工作流体在闭环循环通道内流动的驱动源。 工作流体由驱动源驱动，在闭环循环通道内流动以进行散热。
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公开(公告)号：US20150007973A1
公开(公告)日：2015-01-08
申请号：US14302442
申请日：2014-06-12
Applicant: Chroma Ate Inc.
Inventor： Ben-Mou YU , Ming-Chieh LIN , Ching-Wen CHANG , Xin-Yi WU
CPC classification number: F25B49/00 , F25B21/02 , G05D23/1919
Abstract: A wide range of temperature control equipment for controlling a tested object to a predetermined temperature is provided. The wide range of temperature control equipment includes a thermal conducting plate, a temperature regulating module, a carrier plate, and a thermoelectric cooling module. The temperature regulating module is thermally connected to the thermal conducting plate for regulating the thermal conducting plate to a reference temperature. The carrier plate is used to accommodate the tested object. The thermoelectric cooling module is thermally connected between the thermal conducting plate and the carrier plate for controlling the tested object to the predetermined temperature via the carrier plate based on the reference temperature.
Abstract translation: 提供了用于将测试对象控制到预定温度的各种温度控制设备。 各种温度控制设备包括导热板，温度调节模块，承载板和热电冷却模块。 温度调节模块热连接到用于将导热板调节到参考温度的导热板。 承载板用于容纳被测物体。 热电冷却模块热连接在导热板和承载板之间，用于基于参考温度经由载板将测试对象控制到预定温度。
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公开(公告)号：US20140176170A1
公开(公告)日：2014-06-26
申请号：US14108167
申请日：2013-12-16
Applicant: CHROMA ATE INC.
Inventor： Xin-Yi WU , Hsuan-Jen SHEN , Hung-Ta KAO
IPC: G01R31/26
CPC classification number: G01R31/2635
Abstract: A test table including a chuck base, a flow guide mechanism and a dry air generator is provided. The chuck base includes a test area. The flow guide mechanism is disposed around the chuck base. The dry air generator connects to the flow guide mechanism for generating a dry air. The flow guide mechanism guides the dry air to flow toward the test area to cover the test area and the object to be tested and to create a dry environment to prevent dew condensation.
Abstract translation: 提供一种包括卡盘底座，导流机构和干燥空气发生器的测试台。 卡盘底座包括测试区域。 流动引导机构围绕卡盘基座设置。 干燥空气发生器连接到流动引导机构以产生干燥空气。 流动引导机构引导干燥空气流向测试区域，以覆盖测试区域和被测物体，并产生干燥的环境以防止结露。
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74.发明授权公开(公告)号：US12255532B2
公开(公告)日：2025-03-18
申请号：US18050060
申请日：2022-10-27
Applicant: CHROMA ATE INC.
Inventor： Chen Yuan Wu , Chih Hsien Wang , Kuo Cheng Wang , Cheng Chung Lee
Abstract: A modular AC/DC power conversion module for power sources and loads and a method of driving the same is provided. When an AC/DC converter is electrically coupled to an external power source, a microprocessor is electrically energized by a buck auxiliary circuit, under control of the microprocessor, a DC/DC converter is activated for a certain time period, and then, the AC/DC converter is activated. Thereafter, an output voltage of the AC/DC converter is boosted, and an output voltage of the DC/DC converter is boosted accordingly. Power elements in the downstream side DC/DC converter are activated first, and then power elements in the upstream side AC/DC converter are activated, thereby an inrush current is suppressed. Once the external power source is connected, the buck auxiliary circuit will automatically reduce a voltage of the power input to activate the module. It realizes that the module will autonomously operate after being electrically energized.
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公开(公告)号：US20250012830A1
公开(公告)日：2025-01-09
申请号：US18638163
申请日：2024-04-17
Applicant: CHROMA ATE INC.
Inventor： Ching-Li LIN , Kao-Shan YANG
Abstract: An adapter bracket includes a holder and a fixing element. The holder includes a first strip-shaped body and a second strip-shaped body. The first strip-shaped body is formed with a plurality of first notches linearly arranged on a first coupling surface of the first strip-shaped body. The second strip-shaped body is formed with a plurality of second notches linearly arranged on a second coupling surface of the second strip-shaped body. The fixing element detachably couples the first strip-shaped body and the second strip-shaped body together, so that the first coupling surface and the second coupling surface are in contact with each other, and the first notches and the second notches are jointly combined into a plurality of fastening holes arranged linearly, and each of the fastening holes can hold an object therein.
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Patent Agency Ranking
公开(公告)号：US12050127B2
公开(公告)日：2024-07-30
申请号：US17476595
申请日：2021-09-16
Applicant: CHROMA ATE INC.
Inventor： Hsuan-An Chen , Chi-Ming Wen
CPC classification number: G01J3/0235 , G01J3/0202 , G01J3/4406 , G01J2003/106
Abstract: A fluorescence detection system is provided and adapted to provide a selectable excitation beam to an optical transmission path for irradiation of a device under test, including a driving module, a lighting module, a first optical module and a second optical module. The driving module includes a first shaft and a second shaft parallel thereto. The lighting module is fixed to the first shaft. The first optical module and the second optical module are fixed to the second shaft. A driving operation enables the driving module to rotate the lighting module, the first optical module and the second optical module simultaneously, determining quickly a combination of one light source, one filter and one spectroscopic module on the optical transmission path, with the combination corresponding in position to the device under test, so as to reduce the volume and cost the fluorescence detection system.
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77.发明授权公开(公告)号：US11901213B2
公开(公告)日：2024-02-13
申请号：US17521952
申请日：2021-11-09
Applicant: Chroma Ate Inc.
Inventor： Chien-Ming Chen , Chin-Yi Ouyang
IPC: H01L21/683 , H01L21/677 , H01L21/67 , H01L21/673
CPC classification number: H01L21/6838 , H01L21/673 , H01L21/67144 , H01L21/67259 , H01L21/67775
Abstract: The present invention relates to a chip transfer device capable of floatingly positioning a chip and a method for floatingly positioning a chip. When a chip is placed in a chip socket, a control unit controls an air pressure switching valve to allow at least one vent hole to be communicated with a positive air pressure source. An air flow from the positive air pressure source blows a lower surface of the chip through the vent hole, so that the at least one chip is air-floated. Accordingly, when the chip socket is communicated with the positive air pressure source, the air flow blows the lower surface of the chip in the chip socket through the vent hole, so that the chip is air-floated in the chip socket to reduce the error displacement of the chip offset.
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78.发明申请公开(公告)号：US20230098042A1
公开(公告)日：2023-03-30
申请号：US17931148
申请日：2022-09-12
Applicant: CHROMA ATE INC.
Inventor： Chin-Yi OUYANG , Chin-Yuan KUO , Chang-Jyun HE , Yung-Fan CHU
IPC: G01R31/28
Abstract: The present invention relates to a temperature control system, a temperature control method and an image sensor-testing apparatus having the system. The temperature control method mainly comprises the steps of regulating the temperatures of a plurality of devices under test (DUTs) to a specific temperature in a temperature control zone; transferring the plurality of devices under test to a test plate and placing them into a plurality of test slots respectively; and measuring the temperatures of the device under test by the temperature-sensing elements in the test slots, wherein when at least one temperature-sensing element of the temperature-sensing elements detects that the device under test in the test slot corresponding to said at least one temperature-sensing element fails to meet the specific temperature, a temperature control element corresponding to the test slot regulates the temperature of the device under test.
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79.发明申请公开(公告)号：US20230086325A1
公开(公告)日：2023-03-23
申请号：US17849771
申请日：2022-06-27
Applicant: CHROMA ATE INC.
Inventor： Chien-Ming CHEN , Ming-Yuan HUANG
Abstract: The present invention relates to a quick release assembly for a pressing head and an electronic device testing apparatus having the same. The quick release assembly comprises an upper base, an actuator and a lower base. When the lower base is to be mounted on the upper base, the actuator drives a movable head to a first position; the movable head passes through an open slot of the lower base; then, the actuator drives the movable head to a second position so that the lower base is retained by the movable head. The open slot of the lower base is firstly fitted on the movable head of the actuator located on the upper base. At this time, the actuator is controlled to drive the movable head to the second position from the first position.
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公开(公告)号：US20230086266A1
公开(公告)日：2023-03-23
申请号：US17822816
申请日：2022-08-29
Applicant: CHROMA ATE INC.
Inventor： Chin-Yi OUYANG , Chien-Ming CHEN
IPC: G01R31/28
Abstract: The present invention relates to an electronic device testing apparatus and a testing method thereof. When the test is completed, a pressing head picks up a tested electronic device from a test socket and places the tested electronic device on an output carrier, the output carrier moves out of a test zone, and an input carrier follows immediately after the output carrier and successively moves into the test zone at the same speed; after the pressing head picks up an electronic device to be tested from the input carrier, the input carrier moves out of the test zone, and the pressing head places the electronic device to be tested in the test socket. Accordingly, in the present invention, the operation of the pressing head is simplified, and the overall test efficiency is improved.
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