DEVICE FOR ELECTRONIC COMPONENTS INSPECTION USING IMAGE ANALYSIS

    公开(公告)号:US20250104211A1

    公开(公告)日:2025-03-27

    申请号:US18774283

    申请日:2024-07-16

    Inventor: Jin JEON

    Abstract: An embodiment proposes an electronic component inspection device using image analysis to ensure safety and quality by inspecting the condition of electronic parts included in a car seat. The electronic component inspection device using the image analysis may include a booth which forms a closed space and in which at least one car seat to be inspected is placed, a conveyor moving the at least one car seat into the booth or moving the inspected car seat to the outside of the booth, an inspection part acquiring data generated from electronic equipment included in the at least one car seat, when the at least one car seat is placed at a preset position inside the booth through the conveyor, and a controller controlling the booth, the conveyor, and the inspection part.

    TIME ALIGNMENT OF SENSOR DATA
    63.
    发明申请

    公开(公告)号:US20250102546A1

    公开(公告)日:2025-03-27

    申请号:US17827187

    申请日:2022-05-27

    Abstract: Methods and corresponding systems and apparatuses for time-aligning a first set of measurement samples captured by a first sensor to a second set of measurement samples captured by a second sensor. Each sensor captures samples at regular intervals corresponding to a respective sampling period. The sensors directly or indirectly measure at least one reference signal. Each reference signal includes a reference marker followed by a sequence of alignment pulses. In the case of multiple reference signals, the sequence of alignment pulses can differ, but the reference marker can be identical. In some implementations, time-alignment involves assigning a timestamp to a first alignment pulse in the first set of measurement samples, relative to the reference marker in the first set of measurement samples and assigning a second timestamp to a second alignment pulse in the second set of measurement samples, relative to the reference marker in the second set of measurement samples.

    IMAGE SENSOR AND ELECTRONIC DEVICE
    64.
    发明申请

    公开(公告)号:US20250102355A1

    公开(公告)日:2025-03-27

    申请号:US18730796

    申请日:2023-01-03

    Abstract: An image sensor and an electronic device are disclosed. The image sensor includes a cover, a first metasurface layer, and a detection layer, and the first metasurface layer is located between the cover and the detection layer. The first metasurface layer is configured to receive incident light, the incident light includes incident rays at a plurality of incident angles, the first metasurface layer includes a plurality of light splitting units, different light splitting units correspondingly receive incident rays from different incident angles, the plurality of light splitting units include light splitting units with different patterns, the splitting units separately split corresponding incident rays into light of a plurality of colors by using the different patterns. The detection layer is configured to: receive light of a plurality of colors split by the plurality of light splitting units, and convert the plurality of types of received light into electrical signals.

    LIGHT BEAM CHARACTERIZATION SYSTEM
    65.
    发明申请

    公开(公告)号:US20250102354A1

    公开(公告)日:2025-03-27

    申请号:US18826216

    申请日:2024-09-06

    Inventor: Nicolas CAMUS

    Abstract: A system for characterizing a light beam includes a detector that includes at least one detector unit, and a micro-opto-electromechanical system that includes an array of mirrors. Each mirror is switchable between a first sand a second witching states. In the first switching state, the mirror reflects light emitted by a light source onto the detector. In the second switching state, the mirror reflects the light away from the detector. The system further includes a controller configured to cause a beam profile measurement to be performed on the light detected by the detector unit while selectively switching the mirrors between the first and the second switching states, and an optical unit configured to direct the light in a form of two different input light beams onto the micro-opto-electromechanical system. The controller is configured to cause the beam profile measurement to be performed on each of the two input light beams.

    Superconducting logic components
    68.
    发明授权

    公开(公告)号:US12261604B2

    公开(公告)日:2025-03-25

    申请号:US18439641

    申请日:2024-02-12

    Abstract: An example circuit includes a superconducting component having a plurality of narrow portions and a plurality of wide portions. The example circuit further includes a plurality of photon detector components, each photon detector component coupled to a corresponding narrow portion of the plurality of narrow portions and configured to provide an output that causes the corresponding narrow portion to transition from a superconducting state to a non-superconducting state. The example circuit also includes an output component coupled to the superconducting component, the output component configured to determine a number of the plurality of narrow portions of the superconducting component that are in the non-superconducting state.

    Control device, optical filter system, and control method

    公开(公告)号:US12259275B2

    公开(公告)日:2025-03-25

    申请号:US17294051

    申请日:2019-09-09

    Abstract: Provided is a control device for controlling a Fabry-Perot interference filter having a pair of mirror parts and a pair of driving electrodes. The control device includes: a first driving source that is controlled by using a current as a control parameter, and changes the distance between the pair of mirror parts; a second driving source that is controlled by using a voltage as a control parameter, and changes the distance; and a control unit that controls the first driving source and the second driving source in such a way that the distance is changed by a first driving source in a first region and the distance is changed by the second driving source in at least one part of an region other than the first region when an region including a maximum of the voltage is defined as the first region.

    METHODS AND APPARATUS FOR MOTION DETECTION

    公开(公告)号:US20250095166A1

    公开(公告)日:2025-03-20

    申请号:US18941434

    申请日:2024-11-08

    Abstract: In one example, a method of motion detection includes producing a first image based on a plurality of previous images, the first image including pixels having intensity values that approximate a difference in intensity values between a pair of pixels within the previous images, and the pair of pixels being one pixel from each of first and second previous images and present at the same locations within their respective images, generating a second image by applying a threshold to the first image, the second image including one or more pixels with intensity values above the threshold, the threshold being derived from intensity values of pixels within the first image and a number of pixels in the first image with a respective intensity value, and determining a region of the second image indicating motion based on a location of the one or more pixels in the second image.

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