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公开(公告)号：US4553095A
公开(公告)日：1985-11-12
申请号：US387051
申请日：1982-06-10
摘要： An eddy current thickness probe for measuring the thickness of a weakly ferromagnetic material layer on a ferromagnetic base is provided with an essentially constant magnetic field bias. The magnetic field bias is of sufficient strength to substantially saturate ferromagnetic constituents in the weakly ferromagnetic layer. This eliminates any effects of changes in permeability of the weakly ferromagnetic layer which would otherwise impair the operation of an eddy current thickness gauge.
摘要翻译： 用于测量铁磁性基底上的弱铁磁材料层的厚度的涡流电流厚度探针具有基本上恒定的磁场偏压。 磁场偏压具有足够的强度，以使弱铁磁性层中的铁磁性成分基本饱和。 这消除了弱铁磁层的磁导率变化的任何影响，否则会损害涡流电流厚度计的运行。
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62.发明授权
公开(公告)号：US4507609A
公开(公告)日：1985-03-26
申请号：US322304
申请日：1981-11-16
申请人： George R. Madewell
发明人： George R. Madewell
CPC分类号： G01B7/105
摘要： A system (10) for determining the thickness of a magnetic flux conductive clad material over a magnetic flux conductive base material of different permeability applies on alternating voltage (96) to the primary winding (52) of an incomplete core-type transformer (54). The secondary winding (40) voltage to primary winding (52) voltage ratio is determined with the material being clad-thickness measured (56) completing the incomplete core (54). The voltage ratio is a nondestructive measurement of the thickness (64) of the clad material. The preferred embodiment applies a constant voltage alternating voltage power source (18) to the primary winding (52). This obviates the need to determine the ratio of voltages. The secondary winding (40) voltage is a direct nondestructive measurement of the thickness (64) of the clad material. By reference to a particular clad material-base material chart, the clad thickness is read from the scale adjacent the intersection of the voltage induced in secondary winding (40) and the curve (78,80,82,84,86,88,90,92,94) representing the composition of the clad material.
摘要翻译： PCT No.PCT / US81 / 01388 Sec。 371日期1981年11月16日 102（e）日期1981年11月16日PCT提交1981年10月14日PCT公布。 公开号WO83 / 01505 日本1983年4月28日。用于确定不同磁导率的磁通导电基材上的磁通导电包层材料的厚度的系统（10）适用于不完全的一次绕组（52）的交流电压（96） 核心型变压器（54）。 次级绕组（40）电压到初级绕组（52）的电压比由测量的材料（56）完成不完整的芯（54）确定。 电压比是包层材料的厚度（64）的非破坏性测量。 优选实施例将恒压交流电压源（18）应用于初级绕组（52）。 这消除了确定电压比的需要。 次级绕组（40）电压是包层材料的厚度（64）的直接非破坏性测量。 通过参考特定的覆盖材料基材图，从邻近次级绕组（40）感应电压与曲线（78,80,82,84,86,88,90 ，92,94），代表复合材料的组成。
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63.发明授权
公开(公告)号：US4197651A
公开(公告)日：1980-04-15
申请号：US884004
申请日：1978-03-06
申请人： Wilhelm Dussel
发明人： Wilhelm Dussel
IPC分类号： A01B13/06 , B05C11/10 , B29C47/02 , G01B5/10 , G01B7/06 , H01B20060101 , H01B13/06 , H01B13/16
CPC分类号： G01B7/105
摘要： A process for continuously testing the thickness of the enamel coating of electric wires, in which the wire, after enamelling, passes between a fixed and a movable measuring roller. The wire is wrapped around the fixed measuring roller such that its wrap-around angle has a value between 0 and 15 degrees and the fixed and movable measuring rollers are positioned relative to each other such that their respective planes of symmetry are vertically displaced by a value between 0.5 and 2 mm. Using the process according to the invention, the thickness of enamel applied to the wire can be kept constant to about 0.5 .mu.m.
摘要翻译： 一种用于连续测试电线搪瓷涂层厚度的方法，其中电线在搪瓷之后通过固定和可动测量辊之间。 线缠绕在固定的测量辊上，使得它的包绕角度具有在0和15度之间的值，并且固定的和可移动的测量辊相对于彼此定位，使得它们各自的对称平面垂直位移一个值 在0.5和2mm之间。 使用根据本发明的方法，施加到线材上的搪瓷的厚度可以保持恒定在约0.5μm。
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64.发明授权Apparatus for measuring, and indicating, the thickness of a non-metallic coating on an arcuate metal surface 失效用于测量和指示弧形金属表面上的非金属涂层的厚度的装置
公开(公告)号：US4053827A
公开(公告)日：1977-10-11
申请号：US698008
申请日：1976-06-21
摘要： Apparatus for measuring, and indicating, the thickness of non-metallic coatings over a metallic surface, such as in sheathing of an electrical cable or similar structure, has a number of measuring heads, for example four, of electrical inductance type, spaced around the structure. A probe in each head has a profiled surface for presentation to the surface of the coating, the profile such as to offset any variation in inductance effects on the probe resulting from variation in diameter of the cable, without affecting the inductance effects of any variation in coating thickness. The measuring head is flexibly mounted and the signals from circuits associated with the probes are arranged to give visual indication of variation in coating thickness, and also any eccentricity. Particularly the indication can be a visual one representative of the cross section of the cable or the like.
摘要翻译： 用于测量和指示金属表面（例如电缆或类似结构的护套）中的非金属涂层的厚度的装置具有多个测量头，例如四个电感型，围绕 结构体。 每个头部中的探头具有用于呈现到涂层表面的成型表面，该轮廓可以抵消由于电缆直径的变化导致的探头上的电感效应的任何变化，而不影响任何变化的电感效应 涂层厚度。 测量头被灵活地安装，并且来自与探头相关联的电路的信号被布置成给出涂层厚度变化以及任何偏心的视觉指示。 特别地，该指示可以是电缆等的横截面的视觉代表。
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公开(公告)号：US3884076A
公开(公告)日：1975-05-20
申请号：US31204772
申请日：1972-12-04
发明人： STUDER URS PETER
CPC分类号： G01B7/105 , G01B7/107 , G01B13/06 , G01B2210/62
摘要： A measuring device incorporating a measuring nozzle through which a pressure medium is conveyed against the surface of an object to be measured, and a piston displaceable in a cylinder connected to the nozzle is controlled by the difference between the pressure acting at the nozzle and a reference pressure. Means are provided for varying the admittance of pressure fluid to inlets of said cylinder for displacing said piston towards the one end of said cylinder and for removing said measuring nozzle from the said object.
摘要翻译： 一种测量装置，其包括测量喷嘴，压力介质通过该测量喷嘴被传送抵靠被测量物体的表面，并且可连接到喷嘴的气缸中可移动的活塞由喷嘴上作用的压力与参考点之间的差异来控制 压力。 提供了用于改变压力流体对所述气缸入口的入口的装置，用于使所述活塞朝向所述气缸的一端移动，并从所述物体移除所述测量喷嘴。
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66.发明授权Method and device for measuring minima or maxima of the thickness of a dielectric layer on an electric conductor 失效用于测量电导体上介电层厚度的最小值或最大值的方法和装置
公开(公告)号：US3760264A
公开(公告)日：1973-09-18
申请号：US13671971
申请日：1971-04-22
申请人： ZUMBACH BRUNO
发明人： ZUMBACH BRUNO
CPC分类号： G01B7/105
摘要： This invention relates to a method and a device for measuring minima or maxima of the thickness of a dielectric layer on electric conductor means having prominent portions, wherein a measuring head scans the surface of the layer and minima or maxima of the thickness of the dielectric layer are detected, stored and indicated. Several minima or maxima may simultaneously be indicated and compared with each other whereby it is possible to determine the general position of the conductor means in a dielectric and absolute extremum values of the thickness.
摘要翻译： 本发明涉及一种在具有突出部分的电导体装置上测量电介质层的最小值或最大值的方法和装置，其中测量头扫描该层的表面，并且介电层厚度的最小值或最大值 被检测，存储和指示。 可以同时指示和比较几个最小值或最大值，从而可以确定导体装置在介电厚度和绝对极值值中的总体位置。
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67.发明授权E thickness of layers method and apparatus for balancing an apparatus used for measuring th 失效厚度厚度方法和装置用于平衡用于测量TH的装置
公开(公告)号：US3757208A
公开(公告)日：1973-09-04
申请号：US3757208D
申请日：1972-06-19
发明人： BRUNNER M
摘要： A method and device for measuring the thickness of layers, particularly of insulating layers on metallic parts. A measuring signal is produced corresponding to the thickness to be measured and this signal is compared with a comparing signal, balancing means being provided for adjusting both signals independently of the variations of the measuring signal by the measuring object, and means being provided for shifting one of said signals by a constant amount equal to the shift of said measuring signal upon removal of the measuring probe from the influencing range of a measuring object, reference balancing being thus possible with said measuring probe removed from the measuring object and said one signal shifted by said constant amount.
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68.发明授权Instrument for measuring the thickness of a non-conducting film on a metal base and for measuring the resistivity of a metal sample 失效用于测量金属基底上非导电膜的厚度和用于测量金属样品电阻率的仪器
公开(公告)号：US3454874A
公开(公告)日：1969-07-08
申请号：US3454874D
申请日：1965-03-08
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公开(公告)号：US3440527A
公开(公告)日：1969-04-22
申请号：US3440527D
申请日：1966-07-08
申请人： STEINGROEVER ERICH
发明人： STEINGROEVER ERICH
CPC分类号： G01B7/105
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公开(公告)号：US2933677A
公开(公告)日：1960-04-19
申请号：US53079755
申请日：1955-08-26
发明人： LIEBER SIDNEY U
IPC分类号： G01B7/06
CPC分类号： G01B7/105
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