Abstract:
A rapid scan spectrum identifier fur use in identifying infrared spectrum of the output of a gas chromatograph to identify its absorption characteristics and includes an infrared source and beam splitter, a double beam chopper for alternately sending the infrared beam through a sample or reference gas cell mounted in a suitable furnace, the output of which is recombined and analyzed by a monochromator having a narrow output passband of energy detected by a rapid response detector, the output of which is processed by suitable electronic circuitry to provide a readout. The monochromator is of the scanning type in which a grating is synchronously scanned with a circular variable filter so that the first order output of the grating is selectively passed and higher orders rejected by the filter. The sample and reference gas cell furnace assembly utilizes specially constructed sample and reference gas cells symmetrically mounted in a furnace arrangement for maintaining input gas streams at equal temperatures within each cell and above the temperature of condensation of the sample under investigation. The beam chopper contains associated photoelectronics for physically determining the location of a chopping blade to thereby provide gating signals for indicating the presence at the detector of a sample, reference, or a background signals. These grating signals are used in sample and hold circuits to convert an essentially digitally sampled output into a relatively smooth continuous curve indicative of the absorption of the sample so that the readout represents the sample absorption characteristics corrected for reference for the carrier gas and background effects. The instrument is designed to operate with scan rates of approximately 6 and 30 seconds.
Abstract:
An optical filter including filter regions arrayed two-dimensionally, in which the filter regions include a first region and a second region; a wavelength distribution of an optical transmittance of the first region has a first local maximum in a first wavelength band and a second local maximum in a second wavelength band that differs from the first wavelength band, and a wavelength distribution of an optical transmittance of the second region has a third local maximum in a third wavelength band that differs from each of the first wavelength band and the second wavelength band and a fourth local maximum in a fourth wavelength band that differs from the third wavelength band.
Abstract:
An example system for inspecting a surface includes a laser, an optical system, a gated camera, and a control system. The laser is configured to emit pulses of light, with respective wavelengths of the pulses of light varying over time. The optical system includes at least one optical element, and is configured to direct light emitted by the laser to points along a scan line one point at a time. The gated camera is configured to record a fluorescent response of the surface from light having each wavelength of a plurality of wavelengths at each point along the scan line. The control system is configured to control the gated camera such that an aperture of the gated camera is open during fluorescence of the surface but closed during exposure of the surface to light emitted by the laser.
Abstract:
An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
Abstract:
An emission can be obtained from a sample in response to excitation using a specified range of excitation frequencies. Such excitation can include generating a specified chirped waveform and a specified downconversion local oscillator (LO) frequency using a digital-to-analog converter (DAC), upconverting the chirped waveform via mixing the chirped waveform with a specified upconversion LO frequency, frequency multiplying the upconverted chirped waveform to provide a chirped excitation signal for exciting the sample, receiving an emission from sample, the emission elicited at least in part by the chirped excitation signal, and downconverting the received emission via mixing the received emission with a signal based on the specified downconversion LO signal to provide a downconverted emission signal within the bandwidth of an analog-to-digital converter (ADC). The specified chirped waveform can include a first chirped waveform during a first duration, and a second chirped waveform during a second duration.
Abstract:
The present invention is directed to an Interferometer (100) comprising a source (110) of a primary energy beam (111), a first reflector (120) being provided static such that a first path length from the source (110) to the first reflector (120) is constant, a reflector (1) with an energy beam reflecting surface (20) being provided by an outer surface of a sonotrode (10), wherein the reflector (1) is provided to oscillate such that a second path length from the source (110) to the reflecting surface (20) is variable, a target (140), a means for splitting an energy beam (160) arranged such that it divides the primary beam (111) into a first energy beam (112) incident onto the first reflector (120), and a second energy beam (113) incident onto the reflector (1) adapted to oscillate, and a means for combining energy beams (170) arranged such that it combines a third energy beam (114) reflected from the first reflector (120) and a fourth energy beam (115) reflected from the reflector (1) adapted to oscillate incident onto the target (140). Further provided is an infrared Fourier transform spectrometer (200).
Abstract:
An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
Abstract:
An impulsive synchronization spectrometer based on adjustable time window, includes a synchronous controller, a pulse light source, a high speed collection card, a computer system, a first photoelectric detector, a second photoelectric detector and a testing optical path system; wherein the synchronous controller has four output terminals. The first output terminal is connected with the pulse light source; and the second output terminal is connected with a computer; the third output terminal and the fourth output terminal are respectively connected with two channels of the high speed collection card and respectively output two-channel signals of a third synchronous signal and a fourth synchronous signal respectively serving as external triggering signals of the two channels to control signals in the two channels of the high speed collection card, the first photoelectric detector and the second photoelectric detector are respectively connected with the two channels of the high speed collection card.