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公开(公告)号：US11478854B2
公开(公告)日：2022-10-25
申请号：US16987969
申请日：2020-08-07
Applicant: Sigma Labs, Inc.
Inventor： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC: B22F10/20 , B29C64/153 , B29C64/386 , B22F10/00 , B33Y50/02 , G05B19/418 , B29C64/393 , B22F10/30 , B22F10/10
Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
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公开(公告)号：US10317294B2
公开(公告)日：2019-06-11
申请号：US15276452
申请日：2016-09-26
Applicant: SIGMA LABS, INC.
Inventor： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Martin S. Piltch , Alberto Castro
IPC: G01K13/00 , B23K9/04 , B33Y10/00 , B33Y30/00 , B33Y50/00 , B23K26/342 , B23K26/70 , B22F3/105 , B23K15/00 , B23K10/02 , B23K9/095 , G01J3/28 , G01J3/443 , G01N21/71
Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
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3.发明申请MULTI-SENSOR QUALITY INFERENCE AND CONTROL FOR ADDITIVE MANUFACTURING PROCESSES 审中-公开多传感器质量控制和辅助制造过程控制公开(公告)号：US20160185048A1
公开(公告)日：2016-06-30
申请号：US14945247
申请日：2015-11-18
Applicant: Sigma Labs, Inc.
Inventor： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC: B29C67/00 , G05B19/418
Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
Abstract translation: 本发明教导了用于添加剂制造的多传感器质量推理系统。 本发明还进一步教导了能够辨别和解决三个质量问题的质量体系：i）处理与过程输入不相关的异常或极不可预测的事件; ii）工艺变化或所需工艺参数与实际操作条件之间的差异; 以及iii）材料结构和性能，或由添加剂制造过程产生的所得材料的质量。 本发明进一步教导了仅在拉格朗日参照系中进行的添加剂制造过程的实验观察。 本发明甚至进一步教导了使用所收集的传感器数据来实时评估和控制添加剂制造操作。
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公开(公告)号：US10786948B2
公开(公告)日：2020-09-29
申请号：US14945247
申请日：2015-11-18
Applicant: Sigma Labs, Inc.
Inventor： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC: B29C64/386 , B22F3/105 , B29C64/153 , B33Y50/02 , G05B19/418 , B29C64/393
Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
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公开(公告)号：US10520372B2
公开(公告)日：2019-12-31
申请号：US16434577
申请日：2019-06-07
Applicant: SIGMA LABS, INC.
Inventor： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Martin S. Piltch , Alberto Castro
IPC: G01J3/30 , G01K13/00 , G01N21/71 , G01J3/28 , G01J3/443 , B33Y10/00 , B33Y30/00 , B33Y50/00 , B23K26/342 , B23K26/70 , B22F3/105 , B23K9/04 , B23K9/095 , B23K10/02 , B23K15/00
Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
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Patent Agency Ranking
公开(公告)号：US20230081180A1
公开(公告)日：2023-03-16
申请号：US17943651
申请日：2022-09-13
Applicant: Sigma Labs, Inc.
Inventor： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC: B22F10/20 , B29C64/153 , B29C64/386 , B22F10/00 , B33Y50/02 , G05B19/418
Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
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公开(公告)号：US20190323903A1
公开(公告)日：2019-10-24
申请号：US16434577
申请日：2019-06-07
Applicant: SIGMA LABS, INC.
Inventor： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Martin S. Piltch , Alberto Castro
IPC: G01K13/00 , B23K15/00 , G01J3/28 , B33Y10/00 , B33Y30/00 , B33Y50/00 , B23K26/342 , B23K26/70 , B22F3/105 , B23K9/04 , B23K9/095 , B23K10/02 , G01N21/71 , G01J3/443
Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
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公开(公告)号：US20190210353A1
公开(公告)日：2019-07-11
申请号：US16234333
申请日：2018-12-27
Applicant: Sigma Labs, Inc.
Inventor： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Alberto Castro , Glenn Wikle , Lars Jacquemetton , Peter Campbell
CPC classification number: B33Y30/00 , B33Y50/00 , G01N21/00 , G01N21/71 , G01N2021/8411 , G06N20/00 , H01L22/12
Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
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公开(公告)号：US20170090462A1
公开(公告)日：2017-03-30
申请号：US15282822
申请日：2016-09-30
Applicant: SIGMA LABS, INC.
Inventor： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Matias Roybal , Alberto Castro , Glenn Wikle , Lars Jacquemetton , Peter Campbell
CPC classification number: B33Y30/00 , B33Y50/00 , G01N21/71 , G01N2021/8411 , G06N99/005
Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
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公开(公告)号：US20210404886A1
公开(公告)日：2021-12-30
申请号：US17372321
申请日：2021-07-09
Applicant: SIGMA LABS, INC.
Inventor： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Martin S. Piltch , Alberto Castro
IPC: G01K13/00 , G01N21/71 , G01J3/28 , G01J3/443 , B22F10/20 , B33Y10/00 , B33Y30/00 , B33Y50/00 , B23K26/342 , B23K26/70 , B23K9/04 , B23K9/095 , B23K10/02 , B23K15/00
Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
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