公开(公告)号：US10786948B2

公开(公告)日：2020-09-29

申请号：US14945247

申请日：2015-11-18

Applicant: Sigma Labs, Inc.

Inventor： Vivek R. Dave ,  David D. Clark ,  Matias Roybal ,  Mark J. Cola ,  Martin S. Piltch ,  R. Bruce Madigan ,  Alberto Castro

IPC: B29C64/386 ,  B22F3/105 ,  B29C64/153 ,  B33Y50/02 ,  G05B19/418 ,  B29C64/393

Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

公开(公告)号：US20210060647A1

公开(公告)日：2021-03-04

申请号：US16987969

申请日：2020-08-07

Applicant: Sigma Labs, Inc.

Inventor： Vivek R. Dave ,  David D. Clark ,  Matias Roybal ,  Mark J. Cola ,  Martin S. Piltch ,  R. Bruce Madigan ,  Alberto Castro

IPC: B22F3/105 ,  B29C64/153 ,  B29C64/386 ,  B33Y50/02 ,  G05B19/418

Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

公开(公告)号：US11478854B2

公开(公告)日：2022-10-25

申请号：US16987969

申请日：2020-08-07

Applicant: Sigma Labs, Inc.

Inventor： Vivek R. Dave ,  David D. Clark ,  Matias Roybal ,  Mark J. Cola ,  Martin S. Piltch ,  R. Bruce Madigan ,  Alberto Castro

IPC: B22F10/20 ,  B29C64/153 ,  B29C64/386 ,  B22F10/00 ,  B33Y50/02 ,  G05B19/418 ,  B29C64/393 ,  B22F10/30 ,  B22F10/10

Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

公开(公告)号：US20160185048A1

公开(公告)日：2016-06-30

申请号：US14945247

申请日：2015-11-18

Applicant: Sigma Labs, Inc.

Inventor： Vivek R. Dave ,  David D. Clark ,  Matias Roybal ,  Mark J. Cola ,  Martin S. Piltch ,  R. Bruce Madigan ,  Alberto Castro

IPC: B29C67/00 ,  G05B19/418

Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

Abstract translation: 本发明教导了用于添加剂制造的多传感器质量推理系统。 本发明还进一步教导了能够辨别和解决三个质量问题的质量体系：i）处理与过程输入不相关的异常或极不可预测的事件; ii）工艺变化或所需工艺参数与实际操作条件之间的差异; 以及iii）材料结构和性能，或由添加剂制造过程产生的所得材料的质量。 本发明进一步教导了仅在拉格朗日参照系中进行的添加剂制造过程的实验观察。 本发明甚至进一步教导了使用所收集的传感器数据来实时评估和控制添加剂制造操作。

公开(公告)号：US20230081180A1

公开(公告)日：2023-03-16

申请号：US17943651

申请日：2022-09-13

Applicant: Sigma Labs, Inc.

Inventor： Vivek R. Dave ,  David D. Clark ,  Matias Roybal ,  Mark J. Cola ,  Martin S. Piltch ,  R. Bruce Madigan ,  Alberto Castro

IPC: B22F10/20 ,  B29C64/153 ,  B29C64/386 ,  B22F10/00 ,  B33Y50/02 ,  G05B19/418

Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

公开(公告)号：US20170090462A1

公开(公告)日：2017-03-30

申请号：US15282822

申请日：2016-09-30

Applicant: SIGMA LABS, INC.

Inventor： Vivek R. Dave ,  Mark J. Cola ,  R. Bruce Madigan ,  Matias Roybal ,  Alberto Castro ,  Glenn Wikle ,  Lars Jacquemetton ,  Peter Campbell

IPC: G05B19/4099 ,  G06F17/14 ,  G06N7/00 ,  G06F17/11 ,  B33Y50/00 ,  B33Y30/00

CPC classification number: B33Y30/00 ,  B33Y50/00 ,  G01N21/71 ,  G01N2021/8411 ,  G06N99/005

Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.