公开(公告)号：US08587132B2

公开(公告)日：2013-11-19

申请号：US13665634

申请日：2012-10-31

Applicant: Broadcom Corporation

Inventor： Sam Ziqun Zhao ,  Rezaur Rahman Khan

IPC: H01L23/48 ,  H01L23/52 ,  H01L29/40

CPC classification number: H01L23/481 ,  H01L21/4857 ,  H01L23/14 ,  H01L23/145 ,  H01L23/147 ,  H01L23/49506 ,  H01L23/49575 ,  H01L23/49816 ,  H01L23/49822 ,  H01L23/49827 ,  H01L23/49833 ,  H01L23/5226 ,  H01L23/5384 ,  H01L23/5385 ,  H01L23/5389 ,  H01L24/16 ,  H01L24/17 ,  H01L24/32 ,  H01L24/97 ,  H01L25/00 ,  H01L25/0655 ,  H01L25/0657 ,  H01L25/105 ,  H01L2224/1403 ,  H01L2224/14181 ,  H01L2224/14183 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/16235 ,  H01L2224/17181 ,  H01L2224/30183 ,  H01L2224/32225 ,  H01L2224/73204 ,  H01L2224/73253 ,  H01L2225/06541 ,  H01L2225/06572 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2924/1515 ,  H01L2924/15153 ,  H01L2924/15192 ,  H01L2924/15311 ,  H01L2924/15321 ,  H01L2924/15331 ,  H01L2924/181 ,  H01L2924/00012 ,  H01L2924/00

Abstract: The present application discloses various implementations of a semiconductor package including an organic substrate and one or more interposers having through-semiconductor vias (TSVs). Such a semiconductor package may include a contiguous organic substrate having a lower substrate segment including first and second pluralities of lower interconnect pads, the second plurality of lower interconnect pads being disposed in an opening of the lower substrate segment. The contiguous organic substrate may also include an upper substrate segment having an upper width and including first and second pluralities of upper interconnect pads. In addition, the semiconductor package may include at least one interposer having TSVs for electrically connecting the first and second pluralities of lower interconnect pads to the first and second pluralities of upper interconnect pads. The interposer has an interposer width less than the upper width of the upper substrate segment.

Abstract translation: 本申请公开了包括有机衬底和具有贯通半导体通孔（TSV）的一个或多个中介层的半导体封装的各种实施方式。 这种半导体封装可以包括具有包括第一和第二多个下部互连焊盘的下部衬底区段的连续有机衬底，第二多个下部互连焊盘设置在下部衬底段的开口中。 连续的有机衬底还可以包括具有上部宽度并包括第一和第二多个上部互连焊盘的上部衬底区段。 此外，半导体封装可以包括具有TSV的至少一个插入器，用于将第一和第二多个下部互连焊盘电连接到第一和第二多个上部互连焊盘。 插入器具有小于上基板段的上宽度的插入器宽度。