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公开(公告)号：US11686763B2
公开(公告)日：2023-06-27
申请号：US17652857
申请日：2022-02-28
Inventor： Edward John Coyne , Alan J. O'Donnell , Shaun Bradley , David Aherne , David Boland , Thomas G. O'Dwyer , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Michael A. Looby
CPC classification number: G01R31/2879 , G01N27/041 , G01R31/2874
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
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公开(公告)号：US11372030B2
公开(公告)日：2022-06-28
申请号：US16893874
申请日：2020-06-05
Inventor： David J. Clarke , Stephen Denis Heffernan , Alan J. O'Donnell , Patrick M. McGuinness
IPC: G01R19/165 , H01L23/60 , G01R31/00 , H01L27/02 , G01R31/28 , G01N25/04 , H01L23/525 , H01L23/62 , H01L25/065
Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, a device configured to monitor electrical overstress (EOS) events includes a pair of spaced conductive structures configured to electrically arc in response to an EOS event, wherein the spaced conductive structures are formed of a material and have a shape such that arcing causes a detectable change in shape of the spaced conductive structures, and wherein the device is configured such that the change in shape of the spaced conductive structures is detectable to serve as an EOS monitor.
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公开(公告)号：US20220082605A1
公开(公告)日：2022-03-17
申请号：US17456307
申请日：2021-11-23
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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