Abstract:
A method of forming a contact between a conductor and a substrate region in a MOSFET SRAM starts with forming a dielectric layer on the surface of a partially completed SRAM device with pass and latch transistors covering the transistors. Then, form a thin film gate electrode and an interconnect on the dielectric layer with a gate oxide layer covering the gate electrode and the interconnect; cover the gate oxide layer with a poly conductive layer. Then form a silicon oxide layer over the poly conductive layer and pattern the silicon oxide layer to form a silicon oxide channel mask over the poly conductive layer which is used to pattern the silicon oxide layer into a channel mask over the gate electrode. The channel mask is used for patterning the implanting of dopant into the poly conductive layer aside from the channel mask to form a source region, a drain region and an interconnect in the poly conductive layer. Then form a contact through the gate oxide layer between the interconnect and the poly conductive layer by forming a tungsten layer over the poly conductive layer aside from the channel mask which remains in place.
Abstract:
The present disclosure provides a resistive random access memory (RRAM) structure. The RRAM structure includes a bottom electrode on a substrate; a resistive material layer on the bottom electrode, the resistive material layer including a defect engineering film; and a top electrode on the resistive material layer.
Abstract:
The present disclosure describes a method of forming a memory device. The method includes receiving a wafer substrate, forming a poly stack pattern on the wafer substrate, performing an ion implantation process to form a source and a drain in the wafer substrate, forming a memory gate and a control gate in the defined poly stack pattern, and forming a control gate in the control poly stack pattern. Forming the memory gate further includes performing a memory gate recess to bury the memory gate in an oxide layer.
Abstract:
The present disclosure provides a resistive random access memory (RRAM) structure. The RRAM structure includes a bottom electrode on a substrate; a resistive material layer on the bottom electrode, the resistive material layer including a defect engineering film; and a top electrode on the resistive material layer.
Abstract:
Semiconductor devices and methods for fabricating the same are provided. An exemplary embodiment of a semiconductor device comprises a substrate with a plurality of isolation structures formed therein, defining first and second areas over the substrate. A transistor is formed on a portion of the substrate in the first and second areas, respectively, wherein the transistor in the second area is formed with merely a pocket doping region in the substrate adjacent to a drain region thereof. A first dielectric layer is formed over the substrate, covering the transistor formed in the first and second areas. A plurality of first contact plugs is formed through the first dielectric layer, electrically connecting a source region and a drain region of the transistor in the second area, respectively. A second dielectric layer is formed over the first dielectric layer with a capacitor formed therein, wherein the capacitor electrically connects one of the first contact plugs.
Abstract:
A data storage device carrier system includes a carrier configured to support one or more data storage devices, a backplane, including one or more coupling connector devices configured to electrically couple with a motherboard, and an interposer board operable to couple a plurality of the data storage devices supported by the carrier with the backplane. In an embodiment, the one or more coupling connector devices are operable to transfer communication signals and electrical power. The interposer board is operable to provide the electrical power from a single port on the backplane to each of the plurality of the data storage devices. The interposer board is also operable to pass communication signals between a primary port on the backplane to a first one of the plurality of the data storage devices, and to pass communication signals between a secondary port on the backplane to a second one of the plurality of the data storage devices.
Abstract:
A bus structure includes multiple soft buses and a soft separation layer. These multiple soft buses are stacked side by side each other. The soft separation layer is sandwiched between two adjacent soft buses.
Abstract:
A securing device includes a sustaining member, a plurality of threaded holes, and a plurality of screws. The sustaining member includes a clamped portion and a securing portion extending from the clamped portion. The clamped portion is interfaced between the photoelectric conversion device and the carriage module housing. The thickness of the clamped portion is even enough to keep the distance between the photoelectric conversion device and the carriage module housing constant, thereby assuring that the photoelectric conversion device is orthogonal to the central line of a lens in the carriage module housing. The securing portion is flexible so as to facilitate the assembling operation of the circuit board, the photoelectric conversion device and the carriage module housing by way of the threaded holes and screws.
Abstract:
A new method and structure for the combined creation of CMOS devices and LED devices. The process starts with a substrate over the surface of which are designated a first surface region for the creation of CMOS devices there-over and a second surface region for the creation of LED devices there-over. A relatively thick layer of gate oxide is created over the surface of the substrate. The first surface region is blocked by a mask of photoresist after which the second surface region is exposed to a plasma etch, thereby providing roughness to the surface of the relatively thick layer of gate oxide and reducing the thickness thereof. The blocking mask is removed, additional oxidation of the exposed surface creates a relatively thick layer of gate oxide over the first surface area and a relatively thin layer of gate oxide over the second surface area.