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公开(公告)号：US09696260B2
公开(公告)日：2017-07-04
申请号：US14428444
申请日：2013-09-25
Inventor： Vincent Motto-Ros , Jin Yu
CPC classification number: G01N21/718 , G01J3/0218 , G01J3/443 , G01N2201/0853
Abstract: An installation for spectroscopic measurement includes a focusing system (2) for focusing a laser beam (3) on a sample (4) for analysis and a system (17) for collecting and spectroscopically analyzing light rays emitted by the plasma (15), this system (17) including, in particular, an optical fiber (18) for collecting light. The installation also includes a motor-driven system (23) for moving the optical fiber (18), an optical imaging system (25) for imaging the plasma in the form of an image, and a processor and control unit (24). The unit (24) is capable of analyzing the image formed by the optical imaging system in order to select a zone of interest and controlling the motor-driven system (23) in order to place the optical fiber in a position enabling it to collect light coming from the selected zone of interest in the plasma.
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22.发明申请SUBSTRATE DAMAGE INSPECTION APPARATUS, PRODUCTION SYSTEM AND INSPECTION METHOD 有权基板损坏检查装置，生产系统和检查方法公开(公告)号：US20170038306A1
公开(公告)日：2017-02-09
申请号：US14912577
申请日：2015-08-11
Inventor： Zhiqiang Wang , Bin Wu , Guangzhi Li , Xing Yue , Xuequan Yu , Jiajia Liu
CPC classification number: G01N21/88 , G01N21/55 , G01N21/95 , G01N2021/9513 , G01N2201/0853 , G01N2201/088 , H01L21/67288
Abstract: The present invention relates to the technical field of display, and particularly relates to a substrate damage inspection apparatus, a production system and an inspection method. The substrate damage inspection apparatus comprises a drive unit, support rods, sensors and a controller, wherein the drive unit is connected with the support rods so as to drive the support rods to ascend or descend below a substrate to be detected; and the sensors are disposed on the support rods and communicatively connect with the controller, so as to emit light beams to the substrate to be detected, receive the light beams reflected by the substrate to be detected, and feed them back to the controller. By means of the drive unit and the support rods with the sensors, the substrate damage inspection apparatus realizes damage inspection for the substrate to be detected in a vertical direction. That is, a technical solution provided by the present invention allows for damage inspection for the substrate to be detected when it vertically moves. In addition, the substrate damage inspection apparatus is simple in structure and convenient to operate, thereby having strong utility value and significance of generalization.
Abstract translation: 本发明涉及显示技术领域，特别涉及基板损伤检查装置，生产系统和检查方法。 基板损伤检查装置包括驱动单元，支撑杆，传感器和控制器，其中驱动单元与支撑杆连接，以驱动支撑杆上升或下降到待检测基板下方; 并且传感器设置在支撑杆上并且与控制器通信地连接，以将光束发射到待检测的基板，接收由待检测的基板反射的光束，并将其馈送到控制器。 通过驱动单元和具有传感器的支撑杆，基板损伤检查装置对垂直方向上要检测的基板实现损伤检查。 也就是说，本发明提供的技术方案允许当垂直移动时要检测的基板的损伤检查。 另外，基板损伤检查装置结构简单，操作方便，具有很强的实用价值和泛化意义。
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公开(公告)号：US20170023477A1
公开(公告)日：2017-01-26
申请号：US15284396
申请日：2016-10-03
Applicant: Reuven DUER , Yun-Pei CHANG , Ashutosh SHASTRY
Inventor： Reuven DUER , Yun-Pei CHANG , Ashutosh SHASTRY
IPC: G01N21/64 , C12Q1/68 , C12Q1/70 , G01N33/543
CPC classification number: C12Q1/703 , B01L3/502715 , B01L7/52 , B01L2300/0636 , B01L2300/0654 , B01L2300/0816 , B01L2300/0819 , C12Q1/6825 , G01N21/6428 , G01N21/6452 , G01N33/54373 , G01N2021/6463 , G01N2201/0853 , G01N2201/10 , G02B6/4226
Abstract: The invention provides methods and devices for generating optical pulses in one or more waveguides using a spatially scanning light source. A detection system, methods of use thereof and kits for detecting a biologically active analyte molecule are also provided. The system includes a scanning light source, a substrate comprising a plurality of waveguides and a plurality of optical sensing sites in optical communication with one or more waveguide of the substrate, a detector that is coupled to and in optical communication with the substrate, and means for spatially translating a light beam emitted from said scanning light source such that the light beam is coupled to and in optical communication with the waveguides of the substrate at some point along its scanning path. The use of a scanning light source allows the coupling of light into the waveguides of the substrate in a simple and cost-effective manner.
Abstract translation: 本发明提供了使用空间扫描光源在一个或多个波导中产生光脉冲的方法和装置。 还提供了检测系统，其使用方法和用于检测生物活性分析物分子的试剂盒。 该系统包括扫描光源，包括多个波导的基板和与基板的一个或多个波导光学通信的多个光学感测位置，耦合到基板并与光学连接的检测器，以及装置 用于空间地平移从所述扫描光源发射的光束，使得所述光束在沿其扫描路径的某点处耦合到所述衬底的波导并与所述衬底的波导光通信。 使用扫描光源允许以简单且成本有效的方式将光耦合到衬底的波导中。
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公开(公告)号：US08390814B2
公开(公告)日：2013-03-05
申请号：US13199835
申请日：2011-09-09
Applicant: Mark Salerno , I-Tsung Shih , Craig Harrison
Inventor： Mark Salerno , I-Tsung Shih , Craig Harrison
IPC: G01N21/00
CPC classification number: G01N21/31 , G01N21/00 , G01N21/0303 , G01N21/05 , G01N21/255 , G01N21/59 , G01N2021/0346 , G01N2201/0612 , G01N2201/0853 , G01N2201/121
Abstract: This disclosure relates generally to a sampling device, and more particularly, a sampling device that facilitates spectroscopic measurements with a variable path length and the necessary software controlled algorithms and methods for such a device.
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公开(公告)号：US07301166B2
公开(公告)日：2007-11-27
申请号：US10538403
申请日：2003-12-16
Applicant: Owe Salven , Stig Tormod
Inventor： Owe Salven , Stig Tormod
IPC: G01N15/06
CPC classification number: G01N30/74 , G01N21/33 , G01N30/80 , G01N2030/628 , G01N2030/746 , G01N2201/0853
Abstract: Multiplexer for electromagnetic radiation, e.g. UV-light, in which a single electromagnetic radiation source (203) and a single electromagnetic radiation detector (223) are connectable in turn to a plurality of sample-containing units (207(a)-207(n)). The multiplexer comprises a sled (253) movable in relation to a fixed base (255) by an actuator (281).
Abstract translation: 用于电磁辐射的多路复用器，例如 UV光，其中单个电磁辐射源（203）和单个电磁辐射检测器（223）依次连接到多个采样单元（207（a）-207（n））。 复用器包括通过致动器（281）相对于固定基座（255）可移动的滑架（253）。
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Patent Agency Ranking
公开(公告)号：US4830503A
公开(公告)日：1989-05-16
申请号：US39124
申请日：1987-04-16
Applicant: Yoshihiko Hoda , Nobuhiko Ogura
Inventor： Yoshihiko Hoda , Nobuhiko Ogura
CPC classification number: G01N21/474 , G01N2021/4742 , G01N2021/478 , G01N21/8483 , G01N2201/0853
Abstract: A reflection density measuring system comprises an incubator in which a plurality of chemical assay slides can be accommodated and arranged in one plane, a light source disposed outside the incubator, and a measuring head connected to the light source by way of a fiber optic member. The measuring head is movable to be opposed to each of the chemical assay slides in the incubator under deformation of the fiber optic member, and the fiber optic member is formed of an optical fiber bundle at least at the portion at which the fiber optic member is deformed in response to movement of the measuring head.
Abstract translation: 反射浓度测量系统包括其中可以容纳和布置多个化学测定载玻片并布置在一个平面中的培养箱，设置在培养箱外部的光源和通过光纤构件连接到光源的测量头。 测量头在光纤构件的变形下可移动以与培养箱中的每个化学测定载玻片相对，并且光纤构件至少在光纤构件的部分处由光纤束形成， 响应于测量头的移动而变形。
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公开(公告)号：US20240044788A1
公开(公告)日：2024-02-08
申请号：US18229087
申请日：2023-08-01
Applicant: Ludwig-Maximilians-Universitaet Munich
Inventor： Thomas Huemmer
CPC classification number: G01N21/39 , G01N21/6458 , G01N2021/391 , G01N2201/0853 , G01N2201/103 , G01N2021/392
Abstract: According to a method for cavity enhanced microscopy, a sample is arranged on a sample carrier of an optical cavity, which is formed by a pair of opposing mirrors. A description defining a lateral motion of the sample during a predefined time interval and a variation of the cavity length during the time interval in a temporally synchronized manner is stored and an actuator system is triggered to move the sample carrier and/or at least one mirror of the pair of mirrors to effect the lateral motion of the sample with respect to the cavity and the variation of the cavity length according to the description. Light is introduced into the cavity and transmitted portions and/or reflected portions and/or scattered portions and/or emitted portions are detected to generate a sensor dataset.
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公开(公告)号：US09939373B2
公开(公告)日：2018-04-10
申请号：US14545606
申请日：2015-05-28
Applicant: C Technologies, Inc.
Inventor： Mark Salemo , I-Tsung Shih , Craig Harrison
CPC classification number: G01N21/31 , G01N21/00 , G01N21/0303 , G01N21/05 , G01N21/255 , G01N21/59 , G01N2021/0346 , G01N2201/0612 , G01N2201/0853 , G01N2201/121
Abstract: This disclosure relates generally to a sampling device, and more particularly, a sampling device that facilitates spectroscopic measurements with a variable path length and the necessary software controlled algorithms and methods for such a device.
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公开(公告)号：US20160139037A1
公开(公告)日：2016-05-19
申请号：US14545606
申请日：2015-05-28
Applicant: Mark Salemo , I-Tsung Shih , Craig Harrison
Inventor： Mark Salemo , I-Tsung Shih , Craig Harrison
IPC: G01N21/31
CPC classification number: G01N21/31 , G01N21/00 , G01N21/0303 , G01N21/05 , G01N21/255 , G01N21/59 , G01N2021/0346 , G01N2201/0612 , G01N2201/0853 , G01N2201/121
Abstract: This disclosure relates generally to a sampling device, and more particularly, a sampling device that facilitates spectroscopic measurements with a variable path length and the necessary software controlled algorithms and methods for such a device.
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公开(公告)号：US20130293894A1
公开(公告)日：2013-11-07
申请号：US13694899
申请日：2013-01-16
Applicant: Mark Salerno , I-Tsung Shih , Craig Harrison
Inventor： Mark Salerno , I-Tsung Shih , Craig Harrison
IPC: G01N21/59
CPC classification number: G01N21/31 , G01N21/00 , G01N21/0303 , G01N21/05 , G01N21/255 , G01N21/59 , G01N2021/0346 , G01N2201/0612 , G01N2201/0853 , G01N2201/121
Abstract: This disclosure relates generally to a sampling device, and more particularly, a sampling device that facilitates spectroscopic measurements with a variable path length and the necessary software controlled algorithms and methods for such a device.
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