SEMICONDUCTOR WAFER DICING BLADE
    22.
    发明申请

    公开(公告)号:US20150183131A1

    公开(公告)日:2015-07-02

    申请号:US14141471

    申请日:2013-12-27

    IPC分类号: B28D5/02 B24D3/06 B24D5/14

    CPC分类号: B28D5/022 B24D3/06 B24D5/14

    摘要: A dicing blade suitable for cutting a semiconductor wafer has an edge of fine grit for polishing a top surface of the wafer and a protruding part of coarse grit for making an initial cut into the wafer. The blade reduces chipping of the top surface of the wafer and increases throughput by facilitating cutting and polishing in one operation. The blade can dice and polish comparatively thick wafers having narrow scribe lines in a single operation.

    摘要翻译: 适用于切割半导体晶片的切割刀片具有用于抛光晶片顶表面的细砂粒边缘和用于初始切割到晶片中的粗砂粒的突出部分。 刀片减少了晶片顶表面的碎裂,并且通过在一次操作中促进切割和抛光来增加产量。 刀片可以在单次操作中骰子和抛光具有窄划线的比较厚的晶片。

    Lead frame for semiconductor package
    23.
    发明授权
    Lead frame for semiconductor package 有权
    半导体封装引线框架

    公开(公告)号:US08415779B2

    公开(公告)日:2013-04-09

    申请号:US13047803

    申请日:2011-03-15

    IPC分类号: H01L23/495

    摘要: A lead frame for providing electrical interconnection to an Integrated Circuit (IC) die. The lead frame includes a die support area for receiving and supporting the IC die and a plurality of leads surrounding the die support area. A plurality of interconnect receiving portions is formed in the die support area. The interconnect receiving portions are for providing electrical interconnection to first bumps on a bottom surface of the IC die. The leads are for providing electrical interconnection to second bumps on a surface of the IC die, the second bumps surrounding the first bumps.

    摘要翻译: 用于提供与集成电路(IC)裸片的电互连的引线框架。 引线框架包括用于接收和支撑IC芯片的模具支撑区域和围绕模具支撑区域的多个引线。 在模具支撑区域中形成多个互连接收部分。 互连接收部分用于提供与IC芯片的底表面上的第一凸块的电互连。 引线用于提供与IC芯片的表面上的第二凸块的电互连,第二凸块围绕第一凸块。