Germanium tetraflouride and hydrogen mixtures for an ion implantation system

    公开(公告)号:US11299802B2

    公开(公告)日:2022-04-12

    申请号:US17055885

    申请日:2019-03-15

    Applicant: ENTEGRIS, INC.

    Abstract: The current disclosure is directed to methods and assemblies configured to deliver a mixture of germanium tetrafluoride (GeF4) and hydrogen (H2) gases to an ion implantation apparatus, so H2 is present in an amount in the range of 25%-67% (volume) of the gas mixture, or the GeF4 and H2 are present in a volume ratio (GeF4:H2) in the range of 3:1 to 33:67. The use of the H2 gas in an amount in mixture or relative to the GeF4 gas prevents the volatilization of cathode material, thereby improving performance and lifetime of the ion implantation apparatus. Gas mixtures according to the disclosure also result in a significant Ge+ current gain and W+ peak reduction during an ion implantation procedure.

    Ion implantation system with mixture of arc chamber materials

    公开(公告)号:US11139145B2

    公开(公告)日:2021-10-05

    申请号:US16904286

    申请日:2020-06-17

    Applicant: ENTEGRIS, INC.

    Abstract: A system and method for ion implantation is described, which includes a gas or gas mixture including at least one ionizable gas used to generate ionic species and an arc chamber that includes two or more different arc chamber materials. Using the system ionic species are generated in the arc chamber with liner combination, and one or more desired ionic species display a higher beam current among the ionic species generated, which is facilitated by use of the different materials. In turn improved implantation of the desired ionic species into a substrate can be achieved. Further, the system can minimize formation of metal deposits during system operation, thereby extending source life and promoting improved system performance.

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