Abstract:
A thin film transistor substrate includes a thin film transistor including a gate electrode, a semiconductor layer, a source electrode and a drain electrode. Each of the source electrode and the drain electrode includes a wire layer and a protective layer. The protective layer includes zinc oxide in an amount greater than about 70% by weight and less than about 85% by weight and indium oxide in an amount greater than about 15% by weight and less than about 30% by weight.
Abstract:
A thin film transistor array panel includes: a gate line on a substrate and including a gate electrode; a first gate insulating layer on the substrate and the gate line, the first gate insulting layer including a first portion adjacent to the gate line and a second portion overlapping the gate line and having a smaller thickness than that of the first portion; a second gate insulating layer on the first gate insulating layer; a semiconductor layer on the second gate insulating layer; a source electrode and a drain electrode spaced apart from each other on the semiconductor layer; a passivation layer on the second gate insulating layer, the source electrode and the drain electrode; and a pixel electrode on the passivation layer and connected with the drain electrode. The first gate insulating layer and the second gate insulating layer have stress in opposite directions from each other.
Abstract:
A thin film transistor substrate includes a gate electrode disposed on a substrate; a semiconductor layer partially overlapping the gate electrode, the semiconductor layer including an oxide semiconductor material; a source electrode and a drain electrode disposed on the semiconductor layer, the source electrode and the drain electrode including a barrier layer, a main wiring layer disposed on the barrier layer, and a first capping layer disposed on the main wiring layer and being spaced apart from each other; and second capping layers covering lateral surfaces of the main wiring layers of the source and drain electrodes.