Abstract:
An autoranging analog to digital conversion system is provided. The system may include a digitally programmable preamplifier for amplifying a difference between an analog input and an estimate of the analog input. The preamplifier may be coupled to an analog to digital converter for converting the preamplifier output to a digital signal. The system may also include digital domain predictor or estimation logic for determining an optimum gain and analog input estimate for a given analog input. Multiple signal input channels may be coupled to the analog to digital conversion system. The autoranging estimations may be performed on a sample by sample basis or a channel by channel basis.
Abstract:
A programmable gain preamplifier is provided which has a low temperature drift and good dynamic range characteristics. The programmable gain preamplifier provides a programmable gain of the difference between two input signals (Ain and Ain′ for example). One of the input signals (Ain′) may be an estimation of the other input signal (Ain). The estimation input signal (or a signal related to the estimated input) may be generated by the use of a reference voltage and a first resistor string. More particularly, the reference voltage and the first resistor string may operate as a digital to analog converter (DAC) that converts a digital estimation signal to an analog estimation voltage. The analog estimation voltage operates as an analog voltage that is a function of (or the same as) the analog Ain′ estimation signal. The first resistor string may provide the estimation voltage without loading the resistor string. Thus, the first resistor string may be simultaneously utilized by other circuitry, such as for example, a downstream ADC. The programmable preamplifier gain may be set by the use of a second resistor string and digitally programmable switches. Contacts to the resistors strings may be placed outside of the current path of each resistor string to provide highly stable resistor strings having a very low temperature drift. In one preamplifier embodiment, some or all of the opamps may chopper stabilized opamps, at least one opamp may be a current feedback opamp, the resistor strings may be at least 64 resistors long and programmable gains from 1 to 32 may be provided.
Abstract:
An autoranging analog to digital conversion system is provided. The system may include a digitally programmable preamplifier for amplifying a difference between an analog input and an estimate of the analog input. The preamplifier may be coupled to an analog to digital converter for converting the preamplifier output to a digital signal. The system may also include digital domain predictor or estimation logic for determining an optimum gain and analog input estimate for a given analog input. Multiple signal input channels may be coupled to the analog to digital conversion system. The autoranging estimations may be performed on a sample by sample basis or a channel by channel basis.
Abstract:
A method and apparatus for calibration of errors in the analog reference voltage input of an analog-to-digital converter. A monolithic reference voltage generator is provided to generate the analog reference which includes a bandgap voltage reference (50) that outputs an untrimmed voltage and a temperature voltage. The untrimmed voltage and temperature voltage are input to a delta-sigma A/D converter (52) which has the output thereof processed through a digital filter (54) to output data on a data bus (58) for storage in an EEPROM (60). The EEPROM (60) is operable in one mode to store temperature history data and, in another mode, to store temperature compensation data. In one mode, temperature compensation parameters are retrieved from the EEPROM (60) and utilized by a multiplier/accumulator circuit (74) to generate compensation factors which are output as a digital word to a DAC (76) for controlling a trim circuit (14). The trim circuit (14) provides a temperature compensation for the output of the bandgap voltage reference (50). The system is operable in a calibration mode to measure temperatures during a burn-in procedure and calculate necessary information to determine compensation factors and store these in the EEPROM (60). This temperature data is extracted from the EEPROM (60) and output to a serial I/O port (64), compensation factors determined and then stored back in the EEPROM (60). The delta-sigma A/D converter (52) in the run mode then makes temperature measurements for use by the multiplier/accumulator circuit (74) in determining the appropriate compensation data to extract from the EEPROM (60) to trim the output of the bandgap voltage reference circuit (50).
Abstract:
An MOS current mirror arrangement is disclosed wherein selected ones of the input and output transistors are designed to have a threshold voltage, V.sub.T1, greater in magnitude that associated with standard MOS devices. The larger threshold voltage thus eases the requirement that the turn-on voltage, V.sub.ON, remain less than the threshold voltage V.sub.T, for the devices to remain in the active region of operation. Since a minimum value of V.sub.T is useful for some applications (fast processing and operation at high temperatures) the use of mixed thresholds allows both requirements to be met by adjusting the thresholds of selected devices associated with these different requirements. The difference in threshold voltages can be attained simply by adjusting the threshold adjust implant mask to protect selected devices from the ion implantation conventionally used to decrease the magnitude of the threshold voltage.
Abstract:
An enhancement mode (104, 204, 404) and a depletion mode (102, 202, 402) pair of N-channel MOS transistors have their drain-source conduction paths connected in series and provided with a bias current means (120, 220, 306, 410). The gates (106, 206, 308, 310) are coupled together as an input node. In one embodiment (100) their bulk regions are source-connected and the output (118) is from the source of the enhancement mode device (104) to obtain a source follower configuration amplifier. In a second embodiment (200), the output (218) is taken from the drain (208) of the depletion mode device (202) to obtain a common source configuration amplifier. Two source follower pairs (302, 304) are disclosed connected in parallel to form a differential input voltage amplifier stage (300). A common source pair (402, 404) is disclosed in combination with an additional enhancement mode transistor (406) to form a current mirror (400).
Abstract:
A successive approximation ADC is provided. Contacts to a resistor string may be placed outside of the current path of the resistor string to provide a highly stable resistor string having a very low temperature drift. The resistor string may be utilized to calibrate a successive approximation ADC. The resistor string may also be a portion of a resistor array of a resistor and capacitor array ADC. The resistor string may be calibrated with a calibration ADC having a resolution greater than the resistor string. The calibration ADC may be a delta sigma ADC.
Abstract:
The thermal noise generated through the feedback capacitor of a delta-sigma modulator is attenuated by transferring a reference voltage through the capacitor in two separate steps during each sampling period. This permits a reduction in the size of the feedback capacitor, thereby reducing thermal noise, without increasing the voltage on the switching capacitors on the summing node side of the feedback capacitors which would induce degradation due to hot electron effects.
Abstract:
A calibration method and apparatus to calibrate for non-linearities in a multi-level delta-sigma modulator (12) includes a calibration multiplexer (10) on the input for selecting in a calibration mode a zero voltage for input to the delta-sigma modulator (12). The delta-sigma modulator (12) has three levels, +1, 0, -1, the +1 level input to a processor (32) and the -1 level input to a processor (34). The processor (34) has the output thereof input to an compensation circuit (14) that offsets the value generated by the -1 processor (34) by a coefficient .delta.. The output of the compensation circuit (14) is then input to the minus input of a summation junction (36), which also receives the output of the processor (32), the output of summation junction (36) providing the digital output. The processors (32) and (34) are realized with a separate accumulator that switches between an associated filter coefficient and ground, the filter coefficient stored in a ROM (35). The .delta. coefficient is stored in a block (16) and is generated during a calibration cycle by a .delta. processor (39). The .delta. processor (39) receives the output of the compensation circuit (14) and the digital output from the summing junction (36) when the calibration multiplexer (10) sets the input to zero. A control circuit (40) controls the overall operation, with the calibration operation initiated in response to either an external signal on a line (30) or an internally generated signal. After calibration, the value of the .delta. coefficient is frozen and the calibration multiplexer (10) selects the analog input.
Abstract:
An analog-to-digital converter includes a delta-sigma modulator (10), having the output thereof filtered by a digital filter section. The digital filter section includes a first fixed decimation filter (12) followed by a variable decimation filter section (14) and an output low-pass filter section (16), having a fixed decimation ratio. The fixed variable decimation filter section (14) includes a single FIR filter (24) that has data processed therethrough with different sampling rates. A recursive controller (26) receives an external configuration input to determine the number of passes through the filter (24) that are required to provide the desired decimation ratio.