Lithographic apparatus and device manufacturing method

    公开(公告)号:US09977341B2

    公开(公告)日:2018-05-22

    申请号:US14766112

    申请日:2014-02-06

    CPC classification number: G03F7/70633 G03F7/70725 G05B19/402

    Abstract: A position control system includes a position measurement system including a first position measurement configuration arranged to determine a position of an object in a first operating area and a second position measurement configuration to determine a position of the object in a second operating area; and a control unit configured to control a position of the object, the control unit including a first and a second controller, the first and second controllers being arranged to convert an input signal representing a position of the object to a respectively first and second control signal, the control unit being arranged to determine a combined control signal for controlling the position of the object in an overlapping area of the first and second operating area, wherein the combined control signal is obtained by applying a continuous weight function to the first and second control signal.

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