System and method for automated testing of optical characteristics of a light-emitting element
    181.
    发明申请
    System and method for automated testing of optical characteristics of a light-emitting element 审中-公开
    用于自动测试发光元件的光学特性的系统和方法

    公开(公告)号:US20060022124A1

    公开(公告)日:2006-02-02

    申请号:US11192274

    申请日:2005-07-29

    Applicant: Charles Chuang

    Inventor: Charles Chuang

    CPC classification number: G01M11/00

    Abstract: In a system and method for automated testing of optical characteristics of a light-emitting element, an optical characteristic capturing device continuously rotate about the light-emitting element to be tested at a fixed radius while constantly facing the light-emitting element. The path of rotation is divided into a measuring section and a non-measuring section. The non-measuring section is utilized to enable rotation of the element to be tested or replacement of the element to be tested, thereby simplifying operational states of a support device of the capturing device. Not only can this work with an automated process to perform continuous testing of elements, the overall structure of the testing system can be simplified, and the operation there of can be sped up. Besides, measurement of wide angles can be conducted with accuracy. Thus, the marketplace's requirement for an instrument for high-speed testing of light-emitting elements can be fully met.

    Abstract translation: 在用于自动测试发光元件的光学特性的系统和方法中,光学特征捕获装置在恒定地面对发光元件的同时以固定半径连续地旋转待测试的发光元件。 旋转路径分为测量部和非测量部。 非测量部分用于使要测试的元件或被测元件的更换旋转,从而简化了捕获装置的支撑装置的操作状态。 不仅可以通过自动化过程来实现元素的连续测试,还可以简化测试系统的整体结构,可以加快测试系统的运行。 此外,可以准确地进行广角测量。 因此,可以充分满足市场对发光元件的高速测试仪器的要求。

    Digital jitter synthesizer
    182.
    发明申请
    Digital jitter synthesizer 审中-公开
    数字抖动合成器

    公开(公告)号:US20060009938A1

    公开(公告)日:2006-01-12

    申请号:US11158673

    申请日:2005-06-21

    CPC classification number: G01R31/31709 G01R29/26 G06F1/0328

    Abstract: A digital jitter synthesizer includes a signal generation unit, a tuning frequency optional unit, and a random option unit. The tuning frequency optional unit is able to output a frequency control value, and leads the signal generation unit tune the frequency of an output signal based on the frequency control value; then the signal with the frequency can be fed back to the random optional unit to lead the tuning frequency optional unit generate the other frequency control value randomly to control the signal generation unit for tuning the output signal to the other frequency then to generate an output signal with jitter effect.

    Abstract translation: 数字抖动合成器包括信号产生单元,调谐频率可选单元和随机选项单元。 调谐频率可选单元能够输出频率控制值,并使信号发生单元根据频率控制值调整输出信号的频率; 那么具有频率的信号可以反馈到随机可选单元以引导调谐频率可选单元随机生成另一个频率控制值,以控制信号生成单元,以将输出信号调谐到另一个频率,然后生成输出信号 具有抖动效应。

    Aging test system and aging test method for thermal interface material and electronic device testing apparatus having the system

    公开(公告)号:US12196806B2

    公开(公告)日:2025-01-14

    申请号:US18054197

    申请日:2022-11-10

    Abstract: The present invention relates to an aging test system and an aging test method for a thermal interface material and an electronic device testing apparatus having the system, wherein a controller controls a movable carrier to move to a high temperature generating device so that the thermal interface material on the movable carrier is brought into contact with the high temperature generating device; the controller further controls a temperature sensor to detect the temperature of the thermal interface material; the controller compares an output temperature datum of the high temperature generating device with a temperature measurement datum detected by the temperature sensor. Accordingly, the thermal conductivity of the thermal interface material can be obtained for immediately determining the quality and the performance degradation of the thermal interface material, which can be used as a reference for selection or replacement of the thermal interface material.

    AUTOMATED OPTICAL MEASUREMENT SYSTEM AND METHOD FOR NEAR EYE DISPLAY

    公开(公告)号:US20240426656A1

    公开(公告)日:2024-12-26

    申请号:US18659429

    申请日:2024-05-09

    Abstract: An automated optical measurement system and method for a near eye display are provided. A controller first controls the near eye display to display a specific pattern, then controls a displacement generation module to drive an image sensing module toward or away from an imaging module, and controls the image sensing module to capture the specific pattern to obtain focus images; and the controller performs focusing according to the focus images. Finally, the controller measures an optical characteristic of the near eye display. Accordingly, the focusing method used is to capture the specific pattern displayed by the near eye display while moving the image sensing module, and perform automatic focusing by comparing the capture results.

    Chip-fixing device for a socket
    185.
    发明授权

    公开(公告)号:US12142868B2

    公开(公告)日:2024-11-12

    申请号:US17548655

    申请日:2021-12-13

    Abstract: The present invention relates to a chip-fixing device for a socket, which comprises a fixing base body and a movable stop. The socket is assembled in a socket-accommodating recess of the fixing base body. The movable stop is assembled in the fixing base body and controlled in such a manner that a stopper is moved between a first position and a second position, wherein the first position refers to a position where the stopper is located right above the socket, and the second position refers to a position where the stopper is not located right above the socket. Accordingly, the socket-accommodating recess can be used to install sockets of different sizes, and the movable stop can drive the stopper to restrict a chip from falling off the socket or drive the stopper to release the chip, depending on presence or absence of an external force.

    ANTI-OVERTURNING CABINET STRUCTURE
    186.
    发明公开

    公开(公告)号:US20240237824A1

    公开(公告)日:2024-07-18

    申请号:US18414549

    申请日:2024-01-17

    CPC classification number: A47B97/00 B60B33/0002 A47B2097/008

    Abstract: An anti-overturning device for cabinet and its cabinet structure is disclosed in the present invention. The anti-overturning device comprises a first fixing member, a second fixing component and a connecting part. The first fixing component is used for arranging detachably on the outside of the cabinet bottom. The second fixing component includes at least a second opening, and the second opening is used for fixing on the auxiliary wheel or on the ground. The anti-overturning devices are provided evenly on the periphery of the cabinet bottom. The anti-overturning devices change the horizontal position of the original overturning pivot of the cabinet and enlarge the overturning angle to prevent from overturning the cabinet.

    WAFER INSPECTION SYSTEM
    187.
    发明公开

    公开(公告)号:US20240219447A1

    公开(公告)日:2024-07-04

    申请号:US18129907

    申请日:2023-04-03

    CPC classification number: G01R31/2601 G01R1/06716 G01R1/06761

    Abstract: A wafer inspection system includes a carrier device, a probe card, a first metal kit and a surround separating unit. The probe card includes a detection portion and a conductive layer surrounding the detection portion and configured at a bottom surface of the probe card. The first metal kit is configured at a bottom portion of the probe card and coupled to the conductive layer and includes a first window and a first ring piece extending from a periphery of the first window. The first window is for the detection portion to extend out. The surround separating unit is configured as an electrically conductive wraparound unit surrounding and laterally enclosing the detection portion and a wafer to be inspected when the probe card performs a probe procedure on the wafer to be inspected. Thus, a probe procedure of the detection portion and the wafer to be inspected can be performed in an environment shielded from external noise or interference sources, thereby improving inspection accuracy.

    MULTIPHASE THERMAL INTERFACE COMPONENT, METHOD OF FORMING THE SAME AND ELECTRONIC DEVICE TESTING APPARATUS PROVIDED WITH THE SAME

    公开(公告)号:US20240192268A1

    公开(公告)日:2024-06-13

    申请号:US18511638

    申请日:2023-11-16

    CPC classification number: G01R31/2874 G01R31/2863 G05D23/20 H01L22/12

    Abstract: A multiphase thermal interface component, a method of forming the same, and an electronic device testing apparatus provided with the same are provided. The multiphase thermal interface component includes a thermal interface solid element and a thermal interface fluid material. The thermal conductive surface of the thermal interface solid element has an accommodation space, and the thermal interface fluid material is accommodated in the accommodation space. Therefore, the multiphase thermal interface component combines solid-phase and fluid-phase thermal interface materials. Since fluids have the properties of changing shape, flowing, and splitting arbitrarily, the thermal interface fluid material can completely fill up the air gaps between the thermal interface solid element and the thermal control device/the temperature-controlled component, so that the full surface temperature control of the contact interface can be achieved, thereby effectively improving the thermal conduction performance.

    MOTION SYNCHRONIZED MULTI-TIER PALLET RACK AND BATTERY FORMATION APPARATUS HAVING THE SAME

    公开(公告)号:US20240170709A1

    公开(公告)日:2024-05-23

    申请号:US18373726

    申请日:2023-09-27

    CPC classification number: H01M10/0404 B65G1/026 H01M10/0481 B65G2201/0267

    Abstract: A motion synchronized multi-tier pallet rack and a battery formation apparatus are provided. The pallet rack includes a fixation rack, two movable frames, and two actuators. The movable frames are coupled to two corresponding sides of the fixation rack and each includes telescopic arms, a motor, and a drive rod. The actuators are disposed on other the two corresponding sides of the fixation rack to drive the movable frames to move toward or away from each other. The telescopic arms are kinematically connected to the motor through the drive rod to extend from or retract into the movable frame. The battery formation apparatus includes a motion synchronized multi-tier pallet rack, a conveyor module, a formation cabinet, and a controller. The conveyor module carries a battery module. The controller controls the pallet rack to obtain the battery module from the conveyor module and place the battery module in the formation cabinet.

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