Abstract:
The invention employs a group of LED devices as a light source for emitting light with different wavelengths towards the solar cell under test. A set of test signal data composed of mutually orthogonal test signals are used to power the LED devices to emit light. The solar cell, upon receiving light from the LED devices powered by the test signal data, generates detected values which are in turn converted into electric signals. A processor device is then used to separate component signals contributed by the respective LED devices from the signals and compare the component signals to the output power level corresponding to the test signal data and/or to the optical energy levels radiated from the respective LED devices, thereby obtaining the spectral response of the solar cell to the different wavelengths of light.
Abstract:
The present invention relates to a distance adjustment system and a solar wafer inspection machine provided with the system. The inspection machine has a conveyer for carrying a solar wafer, an optical inspection system for inspecting the surface and color appearance of the wafer and an illumination inspection system. A holder is provided in the inspection position where the wafer is clamped along its width direction to prevent the wafer from offset. During the opto-electrical inspection, probes are brought into contact with conductive buses of the wafer and light is applied to the wafer to allow the probing of electric energy thus generated. An adjusting device is employed to adjust the clamping gap of the holder and the distance of the probes in accordance with the size of the solar wafer. The data are collected and transmitted to a sorting system for sorting the wafer.
Abstract:
The present invention relates to a monochromatic measurement system. The system mainly includes a monochromator, a light-detecting device and a filter device. The monochromator functions to split light under test into respective light beams with different wavelengths. The filter device modulates the transmission efficiency of the respective light beams, so that the wavelengths of the light beams to which the light-detecting device displays a better response have a lower transmission efficiency while the wavelengths of the light beams to which the light-detecting device displays a lower response have a higher transmission efficiency. The response values measured by the light-detecting device with respect to different wavelength intervals are normalized accordingly. The measurement errors attributed to the measurement precision of the instrument and the environmental noise are independent from the variation of wavelength. The reliability of the measurement instrument is elevated.
Abstract:
A battery charging/discharging system is provided. This system includes a recycling cable and plural charging/discharging controllers. Each of the charging/discharging controllers is corresponding to a battery. When the battery is in a discharging mode, a discharging current outputted from the battery flows to the recycling cable via the charging/discharging controller. When the battery charging/discharging system is operated, the recycling cable has a recycling voltage equal to a DC voltage.
Abstract:
The invention provides a battery charging and discharging apparatus and method. The battery charging and discharging apparatus comprises a power source and a plurality of charging and discharging module. The charging and discharging module comprises a current-limiting transistor, a current-limiting resistor, a charging controlling unit, and a discharging controlling unit, wherein both the charging controlling unit and the discharging controlling unit are of battery voltage tracking types. When the charging and discharging module charges a battery, the voltage across two ends of the current-limiting transistor and the current-limiting resistor connected in series is limited to a fixed value by the charging controlling unit. When the battery discharges, the voltage across two ends of the current-limiting transistor and the current-limiting resistor connected in series is limited to a fixed value by the discharging controlling unit. Besides, the discharging controlling unit feedbacks the discharging energy from the battery to the power source.
Abstract:
A method for testing light-emitting devices in a batch-wise, associated with a system for the same purpose, comprises the steps of: preparing the light-emitting devices on a moving carrier unit in a manner of aligning a predetermined longitudinal direction of the light-emitting devices with a predetermined transportation direction of the moving carrier unit, each of the light-emitting devices further having plural light-emitting elements; transporting orderly the light-emitting devices to pass a test area on a base of the system, in which the base energizes only the light-emitting elements within the test area; and, a solar cell module detecting continuously the energized light-emitting elements within the test area and further forming signals with respect to photo energy received in the test area.
Abstract:
A high-speed optical sensing device is provided in the present invention. The high-speed optical sensing device has an optical detector, a lens set, and a beam splitter. The optical detector is utilized for detecting luminous intensity. The lens set is utilized for concentrating light beams toward a color analyzer. The beam splitter is aligned to the illuminating device to be detected and is utilized to separate the light beam generated by the illuminating device to the optical detector and the lens set simultaneously.
Abstract:
Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The apparatus comprises a JEDEC standard tray receiving apparatus comprising a plurality of tray aligners to align the tray into a predetermined position to account for dimensional tolerances of the tray. The apparatus further comprises a test assembly proximate the tray receiving apparatus. The assembly comprises; a plurality of test circuits corresponding in number to the number of cells in the tray, a plurality of groups of test contacts, each of group of the test contacts being coupled to one of the test circuits and being oriented to engage a plurality of electrical contacts of a SIP device disposed in a corresponding one of the cell, the plurality of test circuits being operable to simultaneously, electrically test a predetermined number of SIP devices in a JEDEC standard tray engaged by the receiving apparatus without removing the SIP devices from the tray.
Abstract:
A phase-change temperature regulating system and an electronic device testing apparatus and method are described. In an embodiment, the system uses a temperature regulating fluid chamber containing a temperature regulating fluid to allow the temperature regulating fluid to cover at least a part of at least one surface of an electronic component. When a temperature of the electronic component reaches a boiling point of the temperature regulating fluid, the temperature regulating fluid becomes steam through a phase change to transfer heat energy outward from the electronic component, and condenses on an inner surface of the fluid chamber to further transfer heat energy of the steam to a temperature-regulating apparatus. The condensed temperature regulating fluid flows back to the temperature regulating fluid, thereby continuously circulating.