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公开(公告)号：US20200211199A1
公开(公告)日：2020-07-02
申请号：US16693360
申请日：2019-11-24
Applicant: CHROMA ATE INC.
Inventor： Ting-Wei CHEN , Yu-Hsin LIU , Ming-Kai HSUEH
Abstract: An image inspection method includes capturing a target object image, which the target object image comprises a plurality of graphical features; choosing a block image comprising a specific graphical feature of the plurality of graphical features from the target object image; capturing all the graphical features of the block image to obtain a region of interest (ROI); executing a filtering process or a recovering process on the ROI to obtain a pre-processed region; and inspecting, according to the pre-processed region, the target object image to determine whether the target object image has defects.
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公开(公告)号：US20200081060A1
公开(公告)日：2020-03-12
申请号：US16559701
申请日：2019-09-04
Applicant: Chroma Ate Inc.
Inventor： Chin-Yi Ouyang , Chien-Ming Chen , Meng-Kung Lu
Abstract: The invention relates to a sliding test device for electronic components, which mainly comprises a base, a sliding frame and a pressing member, wherein an electronic component to be tested is placed in a chip receiving module of the base, and the sliding frame is slidably moved with respect to the base under sliding engagement between a first sliding guide and a second sliding guide so that a pressing block of the pressing member is aligned with the electronic component presses the electronic component. According to the present invention, the pressing member presses the electronic component and exerts a sufficient contact force on the electronic component, and a reaction force caused by the contact force and the elastic restoring force of probes is internally balanced in the device.
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公开(公告)号：US20200033399A1
公开(公告)日：2020-01-30
申请号：US16509671
申请日：2019-07-12
Applicant: Chroma Ate Inc.
Inventor： Xin-Yi WU
IPC: G01R31/28
Abstract: The present invention relates to an apparatus and a method for a high temperature test and a low temperature test. The apparatus mainly comprises a depressing head and a test base, wherein the depressing head comprises a cooling module, a heating module, and a heat dissipation module therein, the heat dissipation module comprises a finned heat sink and a heat conduction member, and the heat conduction member is thermally coupled to the heating module and the finned heat sink. When the low temperature test is performed, an electronic component is cooled by filling liquid nitrogen into the cooling module of the depressing head. When the high temperature test is performed, the electronic component is heated by the heating module. If the temperature of the electronic device is higher than a predetermined high temperature, the electronic device is cooled by the heat dissipation module.
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公开(公告)号：US10527671B2
公开(公告)日：2020-01-07
申请号：US15846031
申请日：2017-12-18
Applicant: CHROMA ATE INC.
Inventor： Po-Kai Cheng
Abstract: An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.
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公开(公告)号：US10508969B2
公开(公告)日：2019-12-17
申请号：US15846026
申请日：2017-12-18
Applicant: CHROMA ATE INC.
Inventor： Po-Kai Cheng , Chang-Chi Yang , Chi-Shu Wang
Abstract: A method for testing air tightness includes connecting a testing chamber and a storage chamber, supplying negative pressure to the storage chamber, measuring the pressure in the storage or testing chamber to obtain a first pressure value, determining air tightness of the testing chamber according to the negative pressure and the first pressure value, stopping the negative pressure to the storage chamber, measuring the pressure in the storage chamber to obtain a second pressure value, measuring the pressure in the storage chamber after stopping the negative pressure to the storage chamber to obtain a third pressure value, and determining air tightness of the testing chamber according to the second and third pressure values. The device includes testing and storage chambers, a negative pressure generator, and a pressure gauge connected to the storage chamber, which is connected to the testing chamber. The negative pressure generator is connected to the storage chamber.
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Patent Agency Ranking
公开(公告)号：US10436636B2
公开(公告)日：2019-10-08
申请号：US16158319
申请日：2018-10-12
Applicant: CHROMA ATE INC.
Inventor： Wei-Yao Chang
Abstract: An optical measuring device is configured to measure a light beam emitted from a light source. The optical measuring device includes a light collecting element, at least four light-sensing elements, a light splitting device, and at least one lens. The light collecting element is configured to collect the light beam. The light-sensing elements are configured to respectively sense the light fields of different light paths of the light beam. The respective distances of the light paths between the respective light-sensing elements and the light source are different from each other. The light splitting device is configured to split the light beam passing through the light collecting element and respectively guide the split light beams to the light sensing elements. The lens is disposed between at least one of the light-sensing elements and the light collecting element, and is configured to form images on the at least four light-sensing elements.
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127.发明申请公开(公告)号：US20190162795A1
公开(公告)日：2019-05-30
申请号：US16180158
申请日：2018-11-05
Applicant: CHROMA ATE INC.
Inventor： Chuan-Tse LIN , Ming-Tsung LIU , Kuan-Chen CHEN , Chien-Po LIN
Abstract: A testing fixture for a cell temperature probe includes a microcomputer, a temperature probe, a measurement case, a temperature instrument and heaters. The microcomputer configured to receive a control command for executing a testing process. The measurement case has an outer surface and an inner surface. The outer surface includes a probe-contacting area used for being contacted by the cell temperature probe within a formation device in the testing process. The temperature instrument is electrically connected to the microcomputer and has a sensing terminal disposed on the inner surface of the measurement case. The location of the sensing terminal is aligned with the probe-contacting area in a direction of a thickness of the measurement case. The heaters are electrically connected to the microcomputer and thermally to the measurement case.
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公开(公告)号：US20190145762A1
公开(公告)日：2019-05-16
申请号：US16190112
申请日：2018-11-13
Applicant: CHROMA ATE INC.
Inventor： Yi-Chang CHIU , Cheng-Ting TSAI , Shih-Yao PAN , Lan-Sheng YANG , Hsiu-Wei KUO , Shao-En CHUNG
CPC classification number: G01B11/303 , G01N21/51 , G01N21/958 , G01N2021/4735
Abstract: A surface measurement system is configured to measure a sample with a low reflectivity surface. The surface measurement system includes a condensation device and a measurement device. The condensation device is configured to form a liquid layer on the surface of the sample. The condensation device includes a chamber, a temperature controlling gas source, and a humidification gas source. The chamber is configured to accommodate the sample. The temperature controlling gas source is connected to the chamber to provide temperature controlling gases to the chamber, so as to control the temperature of the sample. The humidification gas source is connected to the chamber to provide water vapor to the chamber, so as to form the liquid layer on the surface of the sample. The measurement device includes a plate, a light source, and an image capturing device.
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公开(公告)号：US20190113384A1
公开(公告)日：2019-04-18
申请号：US16158319
申请日：2018-10-12
Applicant: CHROMA ATE INC.
Inventor： Wei-Yao CHANG
CPC classification number: G01J1/4257 , G01J1/0411 , G01J1/0414 , G01J1/0422 , G01J1/4228
Abstract: An optical measuring device is configured to measure a light beam emitted from a light source. The optical measuring device includes a light collecting element, at least four light-sensing elements, a light splitting device, and at least one lens. The light collecting element is configured to collect the light beam. The light-sensing elements are configured to respectively sense the light fields of different light paths of the light beam. The respective distances of the light paths between the respective light-sensing elements and the light source are different from each other. The light splitting device is configured to split the light beam passing through the light collecting element and respectively guide the split light beams to the light sensing elements. The lens is disposed between at least one of the light-sensing elements and the light collecting element, and is configured to form images on the at least four light-sensing elements.
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公开(公告)号：US10215812B2
公开(公告)日：2019-02-26
申请号：US15604602
申请日：2017-05-24
Applicant: CHROMA ATE INC.
Inventor： Peng-Fei Chen , Mao-Sheng Liu
Abstract: A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.
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