Multi-wavelength laser inspection
    102.
    发明授权

    公开(公告)号:US11860093B2

    公开(公告)日:2024-01-02

    申请号:US17681650

    申请日:2022-02-25

    Abstract: An example system for inspecting a surface includes a laser, an optical system, a gated camera, and a control system. The laser is configured to emit pulses of light, with respective wavelengths of the pulses of light varying over time. The optical system includes at least one optical element, and is configured to direct light emitted by the laser to points along a scan line one point at a time. The gated camera is configured to record a fluorescent response of the surface from light having each wavelength of a plurality of wavelengths at each point along the scan line. The control system is configured to control the gated camera such that an aperture of the gated camera is open during fluorescence of the surface but closed during exposure of the surface to light emitted by the laser.

    SYSTEM AND METHOD FOR NON-INVASIVE MEASUREMENT OF ANALYTES IN VIVO

    公开(公告)号:US20230314220A1

    公开(公告)日:2023-10-05

    申请号:US18312730

    申请日:2023-05-05

    Abstract: A system for non-invasively interrogating an in vivo sample for measurement of analytes comprises a pulse sensor coupled to the in vivo sample for detect a blood pulse of the sample and for generating a corresponding pulse signal, a laser generator for generating a laser radiation having a wavelength, power and diameter, the laser radiation being directed toward the sample to elicit Raman signals, a laser controller adapted to activate the laser generator, a spectrometer situated to receive the Raman signals and to generate analyte spectral data; and a computing device coupled to the pulse sensor, laser controller and spectrometer which is adapted to correlate the spectral data with the pulse signal based on timing data received from the laser controller in order to isolate spectral components from analytes within the blood of the sample from spectral components from analytes arising from non-blood components of the sample.

    Optical technique for material characterization

    公开(公告)号:US11543294B2

    公开(公告)日:2023-01-03

    申请号:US17263147

    申请日:2019-07-25

    Applicant: NOVA LTD.

    Abstract: A polarized Raman Spectrometric system for defining parameters of a polycrystaline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multiple locations on a sample or from an elongated line-shaped points on the sample, and the processor analyzes the signal(s) to define the parameters of said polycrystalline material.

    SYSTEM AND METHOD FOR FACILITATING OPTICAL RASTER SCANNING

    公开(公告)号:US20220291501A1

    公开(公告)日:2022-09-15

    申请号:US17681537

    申请日:2022-02-25

    Abstract: One embodiment provides an apparatus for facilitating raster scanning of an optical spectrometer. The apparatus can include an enclosure, a lens holder situated within the enclosure, and an actuation mechanism coupled to the lens holder. The lens holder is configured to hold a lens that focuses excitation light onto a sample surface, and the actuation mechanism is configured to cause the lens holder to perform a motion according to a predetermined pattern, thereby causing the focused excitation light to raster scan the sample surface.

    Optical microscope and spectroscopic measurement method

    公开(公告)号:US11442259B2

    公开(公告)日:2022-09-13

    申请号:US16640012

    申请日:2018-08-17

    Abstract: An optical microscope according to one aspect of the present disclosure includes: a light source; a first scanner to scan a spot position of a light beam on a sample; an objective lens to focus the light beam deflected by the first scanner and cause the light beam to be made incident on the sample; a spectroscope including a slit on an incident side which an outgoing light emitted from an area on the sample onto which the light beam has been illuminated enters; a detector configured to detect an outgoing light from the spectroscope; and a first relay optical system including a first off-axis parabolic mirror that is arranged in an optical path from the first scanner to the objective lens and reflects the light beam deflected by the first scanner and a second off-axis parabolic mirror that reflects the light beam reflected in the first off-axis parabolic mirror.

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