Abstract:
To provide an image display system, projector, image processing method, program and information storage medium enabling to shorten the time required for calibration when the color and brightness of an image is corrected in consideration of the influence of the ambient light, there is provided a liquid crystal projector having: a calibration signal generation section for generating four types of calibration image signals; a color light sensor for colorimetry of calibration images; a color correction section for correcting image information based on the color information from the color light sensor to correct the color of the image; and a brightness correction section for correcting the image information based on the color information from the color light sensor to correct the brightness of the image. The liquid crystal projector displays the image after the image information is corrected such that the color and brightness of the image are corrected according to the viewing environment.
Abstract:
A projector includes a projection angle deriving section which generates projection angle information indicating an angle formed by a projection target area and projection light projected onto the projection target area; a projection distance deriving section which generates projection distance information indicating a distance from an aim area in the projection target area to a projection section which projects the projection light; a control information generation section which generates direction control information for aligning a projection direction of the projection light with a normal direction of the projection target area based on the projection angle information, and generates projection section control information for controlling the projection section so that the projection light is projected onto the aim area based on the projection distance information; a pedestal driver section which drives a pedestal which adjusts the projection direction of the projection light based on the direction control information; a control section which controls the projection section based on the projection section control information; and the projection section.
Abstract:
An image processing system that shorten calibration time includes a storage section which stores darkroom-condition-measurement data obtained by measuring a display region on which a plurality of calibration images having different colors are displayed under a darkroom condition through a sensor; a measurement data generating section which generates supposed measurement data based on a viewing-environment-measurement data obtained by measuring one of the plurality of calibration images through the sensor under a viewing environment and the darkroom-condition-measurement data; a color gamut computing section which computes an area ratio between a color gamut based on the darkroom-condition-measurement data and a color gamut based on the supposed measurement data; and a correcting section which corrects an image correcting data to correct a hue and gray scale of an image using a logistic function with a parameter based on the area ratio and also corrects image information for displaying an image.
Abstract:
To provide an image processing system and others which can project an image more accurately and at higher speed while using a screen or the like as effectively as possible, there is provided a projector including a calibration image information generating section, an image projection section having a view angle adjusting section and a lens shift section for adjusting an optical axis of a projection lens to project the calibration image onto the screen or the like, a sensing section which senses a region including the projected calibration image and the screen or the like through a sensing surface to generate sensing information, a projection area information generating section which generates projection area information based on the sensing information, a target area information generating section which generates target area information based on the sensing information, and a projection control section which controls the view angle adjusting section and lens shift section based on the projection area information and the target area information.
Abstract:
A semiconductor integrated circuit comprises an internal potential generation circuit for a memory, a current flow pass interruption circuit connected to the internal potential generation circuit, and an input terminal, connected to the current flow pass interruption circuit, for providing a stand-by setting signal controlling the current flow pass interruption circuit, wherein a potential is supplied to the internal potential generation circuit during the operation of the memory, and it is interrupted during the stand-by of the memory to supply the potential to the internal potential generation circuit.
Abstract:
On a semiconductor substrate, there are formed a first macro cell having wiring layers of three layers each formed of a metal wiring layer (for example, an aluminum wiring) and a second macro cell having wiring layers of three layers each formed of a metal wiring layer similar to the first macro cell. The first macro cell is formed to have a wiring structure of three wiring layers though the originally necessary number of metal wiring layers is two. The metal wiring layer of each layer on the first macro cell is formed of the same material as the metal wiring layer of the corresponding each layer on the second macro cell. Moreover, the metal wiring layer of each layer is formed to have the same film thickness. In order to connect the first and second macro cells to each other, a macro interconnection wiring is formed to be included in the third wiring layer (uppermost wiring layer).
Abstract:
There is provided a memory-embedded semiconductor integrated circuit device capable of being tested in a shorter test time. The memory-embedded semiconductor integrated circuit device includes: a logic part provided on a semiconductor substrate; a memory macro provided on the semiconductor substrate to be consolidated with the logic part; a test input terminal for inputting a test input signal; a test circuit including a test signal generator for generating an output switching signal and a test signal, which serves to carry out a test operation of the memory macro, on the basis of the test input signal, and a switching circuit for selectively outputting one of an output of the memory macro, which has been test-operated by the test signal, and the test input signal in accordance with the output switching signal; and a test output terminal for receiving an output of the switching circuit to output the output of the switching circuit to the outside.
Abstract:
There is provided a multifocal contact lens having a lens curve formed by altermately arranging a plurality of curved surfaces for far vision and a plurality of curved surfaces for near vision in the form of concentric zones, and a die for forming the contact lens, and a method for producing the contact lens. Each of the curved surfaces (F1, F2, . . . ) for far vision of the lens curve (2) has a center (O.sub.F1, O.sub.F2, . . . ) of curvature on an optical axis and a radius (R.sub.F1, R.sub.F2, . . . ) of curvature, which is set so that a ray being incident on the corresponding curved surface and being parallel to the optical axis forms an image at a location near a single focal point (F.sub.F) for far vision on the optical axis, and each of the curved surfaces (N1, N2, . . . ) for near vision of the lens curve (2) has a center (O.sub.N1, O.sub.N2, . . . ) of curvature on the optical axis and a radius (R.sub.N1, R.sub.N2, . . . ) of curvature, which is set so that a ray being incident on the corresponding curved surface and being parallel to the optical axis forms an image at a location near a single focal point (F.sub.N) for near vision on the optical axis.
Abstract:
A semiconductor device including a substrate having a low substrate surface formed in the substrate with a first gentle slope from the substrate surface; a single crystalline layer formed on the low substrate surface nearly level with the substrate surface and having a gentle slope facing the first gentle slope; an optical semiconductor element is constructed using the single crystalline layer. An electronic semiconductor element is constructed using the substrate surface. A wiring layer connects electrodes of the optical semiconductor element and the electronic semiconductor element through the first and the second gentle slopes.
Abstract:
A woven or knitted polyester multifilament fabric having a silk-like appearance and touch, comprised of polyester multifilament yarns containing one or more types of porous polyester filaments each having an irregular cross-sectional profile, for example, C-, L- or V-shaped profile, and numerous fine linear concave parts formed on the peripheral surface thereof and extending along the longitudinal axis of each individual filaments, the fabric being characterized by a group of said concave parts corresponding to a half of the entire number of the concave parts, each having a length of 5 microns or more and a ratio of the length to the width of each concave part of 5 or more.