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公开(公告)号：US20220178968A1
公开(公告)日：2022-06-09
申请号：US17598301
申请日：2020-03-12
Applicant: NIDEC READ CORPORATION
Inventor： Yusuke YOKOTA , Norihiro OTA
Abstract: A contact terminal includes a tubular body extending in an axial direction of the contact terminal and having conductivity; a bar-shaped first conductor having conductivity and capable of coming into contact with an inspection target; and a bar-shaped second conductor having conductivity. The first conductor includes: a first protrusion that protrudes from the tubular body toward one side in the axial direction; and a first insertion portion provided at the other end of the first conductor in the axial direction and disposed in the tubular body. The second conductor includes a second insertion portion disposed in the tubular body. The tubular body includes: a spring portion configured in a spiral shape along a peripheral surface of the tubular body; and a first body portion connected to one side in the axial direction of the spring portion. The first insertion portion is fixed to the first body portion.
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公开(公告)号：US20220034938A1
公开(公告)日：2022-02-03
申请号：US17386567
申请日：2021-07-28
Applicant: NIDEC READ CORPORATION
Inventor： Kohei TSUMURA , Takanori FURUKAWA , Jyun YAMANOUCHI
Abstract: Provided are an inspection jig and an inspection apparatus in which a configuration for bending a plurality of contacts in the same direction can be simplified. The inspection jig includes a plurality of contacts each of which has a rod shape, a first support portion that supports the first end portion side of the plurality of contacts, and a second support portion that supports the second end portion side of the plurality of contacts. The first support portion includes a facing support plate that is disposed to face the second support portion in a manner separated from the second support portion and has a plurality of through holes through which the plurality of contacts are inserted, and a cross section of each of the through holes has an elliptical shape whose major axis extends in a predetermined specific direction along a plane direction of the facing support plate.
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公开(公告)号：US11009523B2
公开(公告)日：2021-05-18
申请号：US16504323
申请日：2019-07-07
Applicant: Nidec-Read Corporation , Nidec SV Probe Pte. Ltd.
Inventor： Minoru Kato , Tadakazu Miyatake , Akio Hayashi , Masaki Naganuma , Matthias Joseph Chin Chieh Chia , Cheng Ghee Ong , Raminderjit Singh
Abstract: A probe is a probe having a substantially bar-like shape and includes a distal end portion with a substantially columnar shape adapted to be in contact with an inspection point provided on a device under test, a base end portion with a substantially columnar shape on an opposite side of the distal end portion, and a main body portion formed in a flat ribbon shape and extended to connect the distal end portion to the base end portion. The distal end portion is provided with a distal end surface inclined relative to and intersecting with an axial center of the probe.
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公开(公告)号：US10962569B2
公开(公告)日：2021-03-30
申请号：US16413609
申请日：2019-05-16
Inventor： Michio Kaida , Huei Che Yu
Abstract: Provided are a probe that enables control of a bending direction and can be simply manufactured, an inspection jig using the probe, an inspection device, and a method of manufacturing the probe. A probe has a substantially bar-like shape extending linearly and includes: a tip end portion, a body portion continuous with the tip end portion Pa; and a base end portion continuous with the body portion. The body portion includes a first connection region having a thickness in a thickness direction perpendicular to an axial direction of the bar-like shape that gradually decreases away from the tip end portion, and a second connection region having a thickness that gradually decreases away from the base end portion. A dimension of the body portion in a width direction perpendicular to the thickness direction is larger than dimensions of the tip end portion and the base end portion.
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公开(公告)号：US10914758B2
公开(公告)日：2021-02-09
申请号：US16319827
申请日：2017-07-20
Applicant: Nidec-Read Corporation
Inventor： Hidekazu Yamazaki , Norihiro Ota
Abstract: This inspection jig is provided with: an inspection-side support member having a counter plate (51) provided with a facing surface (F) disposed to face the substrate; and an electrode-side support member (6) having supporting plates (61-63) disposed to face an electrode plate (9) located on the side opposite to the facing surface (F) of the counter plate (51) A probe supporting hole (23), into and by which the rear end portion of the probe (Pr) is inserted and supported, is provided in the supporting plates (61-63), and the probe supporting hole (23) is provided with a restricting surface which is formed along a supporting line (V) inclined at a certain angle (θ) with respect to a reference line (Z), and which restricts the rear end portion of the probe (Pr) from moving in the direction perpendicular to the inclined direction of the supporting line (V).
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Patent Agency Ranking
公开(公告)号：US10782317B2
公开(公告)日：2020-09-22
申请号：US15989271
申请日：2018-05-25
Applicant: NIDEC READ CORPORATION
Inventor： Masami Yamamoto , Norihiro Ota , Shigeki Sakai
IPC: G01R1/067 , C25D5/48 , C25D3/12 , C25D5/14 , C25D5/12 , C25D1/04 , G01R35/00 , C23C18/16 , C23C18/42 , C25D1/20 , C25D3/56
Abstract: Provided is a contact probe which may achieve improved heat resistance even when a spring portion thereof is compressed and released in a high temperature environment. The contact probe includes an Ni—P layer, and the Ni—P layer has different concentrations of P at different positions in a thickness direction of the Ni—P layer.
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公开(公告)号：US20200257388A1
公开(公告)日：2020-08-13
申请号：US16860096
申请日：2020-04-28
Applicant: NIDEC-READ CORPORATION
Inventor： Koji SAKAMOTO , Toshihide MATSUKAWA , Koji IWAMI , Shigeki FUJITA , Osamu HIKITA
IPC: G06F3/044 , G06F3/041 , G06F3/0354 , G06F11/22
Abstract: An inspection apparatus is provided with a holder configured to set an inspection target thereon, the inspection target configured to detect a contact position on the inspection target touched by a human finger; pseudo finger(s) configured to be detected as the human finger upon contact with the inspection target; a positioner configured to move the pseudo finger(s) relative to the inspection target and to change the contact position of the pseudo finger(s) relative to the inspection target; a memory configured to store, respectively, a value of a pressing force in a range of pressing forces said range including a zero pressing force for each of the pseudo finger(s) on the inspection target; a controller configured to regulate the pressing force for pseudo finger(s) of the pseudo finger(s) based on the respective value; and a sensor configured to acquire an electric signal output from the inspection target.
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公开(公告)号：US10649004B2
公开(公告)日：2020-05-12
申请号：US16026088
申请日：2018-07-03
Applicant: NIDEC READ CORPORATION
Inventor： Norihiro Ota
Abstract: A contact terminal may include a tubular body made of an electrically conductive material; and stick-shaped first and second central conductors made of an electrically conductive material. The first and second central conductors may include first and second stick-shaped bodies, first and second clasped portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies, and first and second swell portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies. The first and second central conductors are arranged to have a distal end portion of the first and second swell portions inserted into a joining portion of the tubular body, and to have a distal end surface of the first swell portion and a distal end surface of the second swell portion opposite each other with a gap therebetween.
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公开(公告)号：US20200041543A1
公开(公告)日：2020-02-06
申请号：US16495842
申请日：2018-03-14
Applicant: Nidec-Read Corporation
Inventor： Michihisa MAEDA , Kiyoshi NUMATA , Hidekazu YAMAZAKI , Makoto FUJINO
IPC: G01R1/067 , B82Y40/00 , C01B32/166 , C01B32/162
Abstract: A probe structure is provided with: a holding plate which has a first surface and a second surface in which at least the first surface is insulated; a plurality of electrodes which are formed on the first surface of the holding plate in such a state that the plurality of electrodes is separated from each other; and carbon nanotube structures which are erected on the electrodes 3. The holding plate is provided with through holes which correspond to the electrodes, respectively.
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公开(公告)号：US20200018779A1
公开(公告)日：2020-01-16
申请号：US16504323
申请日：2019-07-07
Applicant: Nidec-Read Corporation , Nidec SV Probe Pte. Ltd.
Inventor： Minoru KATO , Tadakazu MIYATAKE , Akio HAYASHI , Masaki NAGANUMA , Matthias Joseph Chin Chieh Chia , Cheng Ghee Ong , Raminderjit Singh
Abstract: A probe is a probe having a substantially bar-like shape and includes a distal end portion with a substantially columnar shape adapted to be in contact with an inspection point provided on a device under test, a base end portion with a substantially columnar shape on an opposite side of the distal end portion, and a main body portion formed in a flat ribbon shape and extended to connect the distal end portion to the base end portion. The distal end portion is provided with a distal end surface inclined relative to and intersecting with an axial center of the probe.
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