公开(公告)号：US20200018779A1

公开(公告)日：2020-01-16

申请号：US16504323

申请日：2019-07-07

Applicant: Nidec-Read Corporation ,  Nidec SV Probe Pte. Ltd.

Inventor： Minoru KATO ,  Tadakazu MIYATAKE ,  Akio HAYASHI ,  Masaki NAGANUMA ,  Matthias Joseph Chin Chieh Chia ,  Cheng Ghee Ong ,  Raminderjit Singh

IPC: G01R1/067 ,  G01R31/04 ,  G01R1/073

Abstract: A probe is a probe having a substantially bar-like shape and includes a distal end portion with a substantially columnar shape adapted to be in contact with an inspection point provided on a device under test, a base end portion with a substantially columnar shape on an opposite side of the distal end portion, and a main body portion formed in a flat ribbon shape and extended to connect the distal end portion to the base end portion. The distal end portion is provided with a distal end surface inclined relative to and intersecting with an axial center of the probe.